SURFACE EVAEUATION OF MELAMINE OVERLAID PARTICLEBOARD Thesis for flu Degree OI M. S. MICHIGAN STATE UNIVERSITY Chun Young Lo I975 IHESIS LIBRAR y ' Michigan Static University ABSTRACT __.: , L..— SURFACE EVALUATION OF MELAMINE OVERLAID PARTICLEBOARD By Chun Young L0 The objective of this study was to determine whether the results of physical surface measurement can be correlated with the average visual judgements by a number of observers of surface deterioration of overlaid particleboard. melamine impregnated papers were bonded to both faces of particleboard with heat and pressure in a hydraulic press. Three layers of impregnated paper sheets composed the overlays, which were overlay sheet, pattern sheet and bonding sheet. Bonding sheet impregnated with phenol formaldhyde resin was optional. Seven types of commercial particleboard were used as substrates. The suitability of a substrate for these overlays was not always apparent and must be expressed in term of the surface quality of the overlaid products after exposure to high humidity. All the specimens were first conditioned at 40% relative humidity and 70° F, and then at 90% relative humidity and 70° F until equilibrium was reached. Deteriorated surface profiles of overlaid board without bonding sheet were evaluated by various mathematical methods and then ranked. Visual judgements made by eight individuals resulted in a rank of all specimens. The rank correlation between the various Chun Young Lo mathematical evaluations and the visual judgements was determined by using Spearman’s formula. The test results show that the E system was rank correlated with the visual judgements, as was the L0 method. The Average method and the Standard Deviation method were not correlated with the visual judgements. The results of the evaluation based on the E system and the Lo method revealed that surface characteristics of overlaid board were greatly affected by the substrate. Those laminates with bonding sheet have bettersurface quality than those without bonding sheet only under severe moisture condition. Substrates with good surface quality need no bonding sheet. Under this interpretation, substrate 10, 8 and l were considered as having good surface quality. SURFACE EVALUATION OF MELAMINE OVERLAID PARTICLEBOARD BY Chun Young Lo A THESIS Submitted to Michigan State University in partial fulfillment of the requirements for the degree of MASTER OF SCIENCE Department of Forestry 1975 ACKNOWLEDGMENTS The author wishes to express his deepest appreciation to Dr. Otto Suchsland, of the Department of Forestry, for his guidance in the construction of this thesis, and for his great deal of thought which was given throughout the course of this study. Thanks and appreciation also go to the author‘s parents, Yu Chun Lo and Chung Chen Yao, for their continuous encouragement from thousands of miles away. ii TABLE OF CONTENTS ACKNOWLEDGMENTS. . . . . . LIST OF TABLES . LIST OF FIGURES. . . . . . . . . methods exposure to iii CHAPTER 1. INTRODUCTION . . . . . . . . . . 2. THE MEASUREMENT OF SURFACES. . . 2.1) General. . . . . . . . . . . 2.2) Methods and instruments. . . 2.2.1) Visual and tactile 2.2.2) Light methods. . . 2.2.3) Mechanical systems . 2.3) Evaluation . . . . . . . . . . 2.3.1) M (mean line) system . 2.3.2) E (envelope) system. 3. EXPERIMENTAL DESIGN AND PROCEDURE. 3.1) Material . . . . . . . 3.1.1) Substrate. . . 3.1.2) Overlays . . 3.2) Laminating procedure . . . 3.3) Exposure cycle . . . . . . 3.4) Design of experiment . . . 3.5) Visual observation after 3.6) Measuring surface profiles . 3.6.1) Instrument . . . . . 3.6.2) The use of the instrument. 3.6.3) 4. MATHEMATICAL EVALUATION OF SURFACE PROFILES. 4.1) E system . . . . . . . 4.2) Average method . . . . . . . 4.3) Standard Deviation method. . 4.4) L0 method. . . . . . . . . . 5. STATISTICAL ANALYSIS AND DISCUSSION OF RESULTS The reproducibility of measurements. high humidity . H Page ii vi w NOWNO‘UTUIUJ .16 16 16 20 23 23 23 25 25 29 4O 40 43 48 48 55 CHAPTER 6. CONCLUSION. REFERENCES . . . . TABLE OF CONTENTS (Cont'd.) iv LIST OF TABLES TABLE ‘ Page 1. General Properties of Seven Types of Commercial Particleboard. . 19 2. Design of Experiment . . . . . . . . . . . . . . . . . . . . . . 24 ' 3. Results of Analysis by Several Methods of Surface Profiles of Group C Specimen Measured at Exposure Condition 2. . . . . . . 56 4. Qualitative Ranking of Surface Profiles of Group C Specimen Measured at Condition 2 Analysed by Several Methods. . . . . . 57 5. Score of Individual Specimens by Visual Judgement. . . . . . . . 58 6. Limit Values for Spearmen Rank Correlation Coefficient . . . . . 60 7. Surface Roughness and waviness of Group C and Group D Specimen Measured at Condition 1 and Condition 2 Analysed by the E Me thOd O O O O O O O O O O O O O O O '. C O O O O O O O I O O 62 8. Surface Roughness and waviness of Group C and Group D Specimen Measured at Condition 1 and Condition 2 Analysed by the L0 Method. . . . . . . . . . . . . . . . . . . . . . . . . . . 71 9. Thickness, Thickness Swelling, and Water Absorption of Four Groups of Specimen Exposed to Condition 2. . . . . . . . . . . 77 LIST OF FIGURES FIGURE ' Page 1. Basic surface measures according to the M (mean line) system. O O O O O O O O O O O O O O O O O O O O O O O O O O 11 2. Basic surface measures according to the E (envelope) system. . . . . . . . . . . . . . . . . . . . . . . . . . . l4 3. Photograph of seven types of substrate. . . . . . . . . . . . 18 4. The construction of overlays. . . . . . . . . . . . . . . . . 22 5. The Bendix Microcorder stylus instrument. . . . . . . . . . . 27 6. The original profiles of overlaid substrate without Bonding Sheet (group C) measured at condition 1 . . . .-. . 31 7. The original profiles of overlaid substrate without Bonding Sheet (group C) measured at condition 2 . . . . . . 33 8. The original profiles of overlaid substrate with Bonding Sheet (group D) measured at condition 1 . . . . . . 35 9. The original profiles of overlaid substrate with Bonding Sheet (group D) measured at condition 2 . . . . . . 37 10. The reproducibility of the profiles produced from two traces over the same surface. I-A and I-B are plain substrate. lO—A and lO—B are overlaid substrate. . . . . . . . . . . . 39 11. The technique of evaluating E system. The radius of the large disc is 250 mm. The radius of the small disc is 25 mm. The length of the plastic profile is 23 inches. . . 42 12. Comparison of the original profile with the reproduced profile. I-A is the original profile. I-B is the profile reproduced from the plastic profile . . . . . . . . 45 13. Surface measures according to the Average method. . . . . . . 47 14. Surface measures according to the L0 method . . . . . . . . . 50 15. A segment of a circle relationship between the mean line of compensation and the average angle between roughness intervals . . . . . . . . . . . . . . . . . . . . . . . . . 53 vi LIST OF FIGURES CONTINUED FIGURE Page 16. Surface roughness of overlaid substrate without Bonding Sheet (group C) evaluated at condition 1 and 2 by the E system. . . . . . . . . . . . . . . . . . . . . . . . . . 64 17. Surface roughness of overlaid substrate with Bonding Sheet (group D) evaluated at condition 1 and 2 by the E system. . . . . . . . . . . . . . . . . . . . . . . . . . 66 18. Surface waviness of overlaid substrate without Bonding Sheet (group C) evaluated at condition 1 and 2 by the E system. 0 O O O I O O O O O O O O O O O O O O O O I O O O 68 19. Surface waviness of overlaid substrate with Bonding Sheet (group D) evaluated at condition 1 and 2 by the E system. 0 O O O O O O I O O O O O O O O O O O O O O O O O 70 20. Surface roughness of overlaid substrate without Bonding Sheet (group C) evaluated at condition 1 and 2 by the Lo system 0 O O O O O I O O O O O O O O O O O O O O O O O O 73 21. Surface roughness of overlaid substrate with Bonding Sheet (group D) evaluated at condition 1 and 2 by the L0 system . . . . . . . . . . . . . . . . . . . . . . . . . 75 vii CHAPTER 1 INTRODUCTION Melamine overlaid particleboard consists of thin layers of melamine impregnated papers bonded to both faces of particleboard to provide protective and/or decorative surfaces. Overlays are very essential to the wood industry. Most overlays are derived from paper products, some are polymer film. They are applied to wood products such as plywood, lumber, and composition board. Advantages of overlaid boards are high scratch resistance, high resistance to acids, water etc. and higher mechanical strength. In addition, overlaid boards can be mass produced with a wide choice of patterns and colors and require no finishing. Among the disadvantages of board products overlaid with paper or plastic film is the instability of the surface due to thickness swelling of the substrate. The surface quality of overlaid boards is greatly dependent upon the substrate used as compared with the stability of veneered boards. The suitability of a substrate for these overlays is not always apparent and must be expressed in terms of the surface quality of the overlaid product after exposure to high humidity. Overlays can be applied only to boards having special properties such as high compression strength and very fine surface layers. .Methods of application vary with the types of overlay used, which in turn depends on the use of the end products. There are three basic types of overlays: high density overlay, medium density overlay, and decorative overlay. All three are applied to the substrate by means of heat and pressure in hydraulic presses. Roll laminating is another method used for certain types of film that can not be satisfactorily applied to wood substrates in any other way. Roll laminating uses momentary pressure applied by a resilient roll to combine the overlay with the wood substrate panel, the adhesive having been spread on the overlay, the wood substrate or both (11). While the human eye is very sensitive to the slightest distortions' of high gloss surfaces and would therefore serve as a good indicator, classification of surfaces by visual observation could be very subjective and therefore unreliable. Physical measurement of surface profiles on the other hand requires special evaluation procedures. The objective of this study is to determine whether the results of physical surface measurement can be correlated with the average visual judgements by a number of observers of surface deterioration of overlaid particleboard. CHAPTER 2 THE MEASUREMENT OF SURFACES 2.1) General The measurement of surface characteristics has been discussed for over 40 years. First attempts of surface evaluation involved the use of "sight—touch" to arrange sample specimens in a qualitative manner. Later, standards have been set with some quantitative gradation based on surface geometry (7). To evaluate surface characteristics, a three dimensional measurement of the surface would be most desirable in order to represent the total natural characteristic of the surface. However, the difficulties involved in making such measurements are considerable so that in most cases physical surface measurement is limited to two dimensions. Subjective judgement by the sense of sight and touch on the other hand is of a three dimensional nature. Unfortunately, such evaluation cannot readily be standardized. Devices have, thus, been developed to replace "sight-touch" methods by other indirect and direct methods based on optical, accoustical, mechanical and pneumatic principles. All of these methods are comparative methods, and standards based on them are more or less arbitrary (2). Because of this fact, devices measuring the true geometry of the surface have been popularily used. The direct measurement of surfaces is based on the geometrical surface of the test specimen. The roughness factor is defined as the ratio of the area of the actual surface to that of the 3 geometric surface (20). Deviation from the geometric surface is categorized into three categories which are refered to as roughness, waviness and lay (19). According to the American Standard Association (19), roughness consists of the finer irregularities in the surface texture within the limits of the roughnessewidth cut off*. waviness is the usually widely- spaced component of surface texture. Deviations including error of form are macro-geometrical. Lay is the direction of the predominant surface pattern. In the measurement of surface texture only deviations of roughness and waviness are of interest. Stylus type instruments are widely used for measuring surface roughness depending on electrical amplification of the motion of a stylus perpendicular to the surface over which the stylus is traversed. The surface being traversed is cut by a plane which is perpendiCular to the geometrical surface of the test specimen. The line of intersection between the cutting plane and the real surface is the real surface profile 4(12). I The mathematical evaluation of surface profiles has caused much confusion and misunderstanding. There are many standards for assessing roughness. But none of them can provide enough information to represent functional qualities of the surface (15). In this study, it was not attempted to determine which is the best method to evaluate surface profiles based on mathematical consideration. Rather, it was * roughness!width cut off: The greatest spacing of repetitive irregularities to be included in the measurement of average roughness height. attempted to find out the most applicable method which can serve as an alternative to visual judgement, which in many practical circumstances is the only criterion for the consumer to determine surface quality. Such a method would be a valuable tool for the manufacturer in predict- ing consumer reaction. 2.2) Methods and instruments 2.2.1) Visual and tactile methods The reliability of touch and sight in evaluating surface texture has been studied (10, 1, 17). The human eye can detect very small variation of the angle of reflection on polished wood and nice smooth surfaces. A roughness of 0.5 u* or even 0.1 u with some training, can be sensed by touch. Optics of reflection deal with the relationship between the incident beam of light and the reflected beam of light. A change in angle of the incident light will cause an intensity variation of the reflected beam. The degree of change will be greater at large incident light angles than at smaller incident light angles. The human eye is capable of recognizing differences in light intensity of one percent. Two components of light can be distinguished when a beam of light strikes an irregular wood surface covered with a transparent film. The diffuse component is responsible for the color of the surface, the specular components for its gloss. * .— 111 = 10 3mm The relative intensity of both components depends on the geometry of the surface, refractive index and coefficient of absorption of the film. In the case, where light is incident on a wavy surface, the intensity of the reflected light will be considerably higher at the crests and troughs than at the slope of the waves. This is the principle of glossy surfaces which will show very small irregularities or unevenness. The observability depends not only on depth or height of the irregularities but also to a large extent on the ratio of wave, depth: wave length. When normal light is not adequate to discriminate surface roughness, the use of tactile cues is necessary. However, by using oblique light to illuminate a surface, the visual observation is as good as tactile judgements, and more rapid. Judgements made by skilled operators showed only a little more sensitivity in judgement than those made by unskilled operators under the familiar inspection condition. 2.2.2) Light methods Several other methods are described (4) using light to analyze surfaces. One is based on image reflection, the other is the so called "light sectioning" method. The image reflection method evaluates the surface quality of a high gloss highly reflective surface by observing the distortion suffered by the reflected image of either a straight line or a regular grid pattern. Quantitative evaluation of such observation is difficult, however. In the so called "light sectioning" method, a narrow beam of light formed by a slit is focused on the surface at an acute angle. The intersection of the light beam with the surface is then observed from a position directly above the surface. Pictures of the elongated waves can be analysed and the true wave height can be calculated. 2.2.3) Mechanical systems Devices measuring the true geometry of the surface were developed from simple mechanical systems to electrowmechanical systems by way of optical mechanical systems. Timms (17) described an instrument in which a simple mechanical linkage is used to connect the stylus to the recorder pen, the magnification being controlled by the lever ratio in the system; Schmalz (13) studied surface texture using a sharply pointed stylus to trace the profile and record its movements by an optical method. I In the Forster apparatus (4) manufactured by Ernst Leitz, the test Specimen moves under an oscillsting stylus, connected mechanically to a tilting mirror. As the stylus oscillates, a beam of light is reflected from the mirror. The exposed portion is the air above the-surface, the unexposed portion is the material, and the interface is the surface profile. Ernest Abbott (13) in 1936, devised the "Profilometer" which converts the movements of the stylus into a corresponding alternating current and assesses the current representing the deviation of the profile from its mean line. R. A. Mann (6) devised an apparatus consisting of three basic components: the pick up arm, the amplifier recorder and the feed mechanism. The pick up arm is fitted with strain gages which are mounted on the beam. They are so connected that vertical deflections are magnified. The probe on the pick up arm consisting of a steel ball touches the surface being studied. The size of the steel ball, 1/4 inch in diameter, is considered satisfactory for studies of finished panels, machined surfaces, and particleboard. The amplifier recorder magnifies the strain in the pick up arm and records it on a moving paper chart. The speed of the chart and the amplification can be adjusted to give varying degrees of vertical and horizontal magnification. Hann found that the results were reproducible, and that the apparatus could detect differences in surface contours of wood panels due to humidity change. The currently used stylus instruments transfer the motion of the stylus electrically to the recording system. There are two types of transducer. One is a direct displacement type using the same principle as that employed in a phonograph. Another type integrates the rate of stylus motion to give the displacement (13). When the stylus tracer moves over the specimen at a constant speed, two components resiSt the motion. Horizontal movement of the stylus is resisted by friction force, requiring a greater driving force. The vertical component results in the stylus moving upward. The magnitude of this vertical component depends on the cone angle of the stylus and the coefficient of friction between the stylus and the surface. Small cone angles of the stylus will result in no vertical lifting component no matter how much horizontal force is applied. In addition, dynamic inertial forces are generated in the vertical direction which may lead to surface damage and erroneous indication of the surface profile. Therefore, the weight and cone angle of the stylus should be appropriate for the surface to be traced (l3). 2.3) Evaluation The two types of references used in the stylus type measuring technique are the true-datum method and the surface-datum method. In the true-datum method, the reference line is a straight line. In the surface-datum method, the oscillation of the stylus on the surface occurs relative to a skid or shoe of certain dimension which as it moves over the surface, does not necessarily describe a straight line but follows a second order surface characteristic which depends in part on the dimensions of the shoe. The difference between the surface and the second order curve described by the shoe is indicated by the variation of the trace from a straight line. Two basic evaluation systems based on mathematics have been considered as national standards, namely the M (mean line) system and the E (envelope) system (12). 2.3.1) M system In this system the deviation of the profile from the mean line is measured. The mean line is defined by British Standard 1134 as a line conforming to the prescribed geometrical form of the profile and so placed that the sum of the squares of the ordinates between it and the profile is a minimum. A number of roughness values are defined, based on the M system, which are illustrated in Fig. 1. a) The peak to valley value, R, is the distance between the upper and lower reference line L¢ and LH' b) The center line average Value, Ra, is the arithemetic average value of the departure of the whole of the profile both above and below its mean line throughout the prescribed roughness- 10 FIGURE 1. Basic surface measures according to the M (mean line) system. ll .H mdbon 12 width cut off in a plane substantially normal to the surface. The mathematical expression is: l i Ra ‘3 Ifolyldx c) The root—mean—square value, RMS, is the geometric average value of the departure of the whole of the profile both above and below its mean line throughout the prescribed roughness-width cut off, in a plane substantially normal to the surface. The mathematical RMS -1’%J§y2dx n v expression is: The main defect of the M system is the difficulty in determining the actual position of the mean line. In addition, the M system does not offer a clear separation of roughness, waviness and error of form. None of the above single measurements can describe the surface characteristics completely. In some cases, the center line average fails to distinguish between two different surface characteristics. 2.3.2) E system The E system is described in Fig. 2.Two circles with different radii are rolled across the surface to be evaluated. The center of each circle produces a curve. The curve generated by the center of the large circle is called "curve of form". The curve generated by the center of ‘the small circle is called "contacting envelope". Both the "curve of form" and the "contacting envelope" are displaced in a direction perpendicular to the geometrical profile to a position where they are contacting some of the highest peaks in the effective profile which is 13 FIGURE 2. Basic surface measures according to the E (envelope) system. 14 .N mmauHm mmmszDom mmmzH><3 zmom mo mommm 15 the actual surface trace. The area between the geometric profile and the "curve of form" represents the "error of form", the area between the "curve of form" and the "contacting envelope" represents the waviness and the area between the "contacting envelope" and the effective profile represents the roughness. The main defect of the E system is that the radii of the discs chosen for the determination of roughness and waviness are arbitrary. The advantage of the E system is that it offers a clear and unambiguous separation of roughness, waviness and error of form. This ability of the E method to separate the three components of the surface profile makes it appear very suitable for the treatment of the problem at hand. It can readily be verified that surface distortions percieved by the eye as undesirable and detracting are those of relative short wavelength or period. Distortions of longer wavelength on which the former may be superimposed do not necessarily affect the value judgement of the observer. It would, therefore, be desirable to measure the objectionable deviation of the surface profile from a possibly percievable but not objectionable trend curve or curve of form. Such an evaluation could indeed simulate the judgement based on visual observation. For these reasons, the E system was employed in the present study. In addition, several other methods, namely the Average method, Standard Deviation method and the method which was developed by the author (Lo method) were also used and are described in the following chapter. CHAPTER 3 EXPERIMENTAL DESIGN AND PROCEDURE 3.1) Material 3.1.1) Substrate. Several commercial particleboards which have previously been described by Suchsland (18) were used as substrates (see Fig. 3 and Table 1). Of the ten types used in the previous study, three had to be eliminated because of the following reasons: No. 6 and No. 7 of the boards used before are flake boards which are not considered to be very suitable for the application of overlays. Board No. 9 developed steam blisters in the laminating process and was, therefore, eliminated. 3.1.2) Overlays Laminating papers were obtained from Resopreg Products, Division of Pioneer Plastics Corporation. a) Overlay Sheet: This paper is a long fibered alpha cellulose paper weighing 20 lbs per 3,000 square feet, saturated with a specially formulated melamine formaldehyde resin designed for this purpose. The resin content is 75% by weight. b) Pattern Sheet: This is a "saturating grade" alpha cellulose pigmented paper, 16 17 FIGURE 3. Photograph of seven types of substrate. 18 .m gun—m 19 H>wfim H. omnmnmw wnooonnwmm om mmwfim N. UmmHms om mxomnwsmon. mecca > w n e mwmnHNHo>HHoz mammawsem nozwwmmmme oHe meemaw>am oemww>He mcwmaw>am mesmew>am sHamoca SHAH wozqun memes wozqun mmmma wo>we Heme H. N. N. s. m. m. Ho H. N. N. H. m. m. Ho H. N. N. H. m. m. Ho H. N. N. H. m. m. Ho mHNm N: x a: N: x a: N: x a: N: x a: zczwmw om N mwmnHSNZN N N N oozeHaHoz H oozeHaHoz H aozeHaHoz H oozeHHHoz H m easemcw nears nozeHeHoz N nozeHaHoz N oozeHaHoz N oozeHaHoz N nozuHaHoz H HON umHunHuouaa mmocnwsom . a o +. o I Hlfl Hm>umuaH mmmaswsom .Iumdli mafia coaumwcoam lllll .wH MMDUHM 51 if the measured surface was flat. The mean line will take the form of a polygon in the case of a non-flat surface. The elements of the polygon are called Roughness Intervals. The length of the Roughness Interval is arbitrary. It should be selected to accent either the roughness or the gross deviation. The average amplitude and wave length of the profile are the factors to be considered when determining the Roughness Interval. In this study, intervals of .5" were marked out on the effective profile with a divider to fulfill this goal. The trend of the mean line of compensation goes along with the profile curve. As the Roughness Interval becomes shorter and shorter and approaches zero, the mean line of compensation will coincide with the curve. The characteristic of the curve is thus described by two things, namely, the length of the mean line of compensation and the angle between the Roughness Intervals (the angle is measured between the n th. Roughness Interval and the elongation of the n-I th. Roughness Interval. The angle measured to the right of the elongation line is taken as positive, to the left of which is taken as negative). It is apparent that the longer the mean line and the larger the angle, the rougher the surface would be. In order to assess roughness, all the measured angles either positive or negative have to be changed to those angles based on the base line which is chosen to be the first Roughness Interval. Positive or negative angles being changed are on either side of the base line. As shown in Fig. 15, the average of the positive angles is m. The average of the negative angles is n. A segment of a circle relationship is established to combine the length of the mean line of compensation and the average angle between Roughness Intervals. 52 FIGURE 15. A segment of a circle relationship between the mean line of compensation and the average angle between roughness intervals. 53 FIGURE 15 . average of positive roughness interval angles average of negative roughness interval angles the length of the mean line of compensation roughness factor 54 The length of the mean line of compensation which is R can simply be measured by adding up Roughness Intervals plus the last one which may equal to or less than one Roughness Interval. The roughness factor, K, can be calculated using the following formula: 6 K a 360° ‘ ZflR (in.), m + n = e, K = c + d If >> I then the profile would have a generally concave character. If >> I then the profile would have a generally convex character. ole. ado CHAPTER 5 STATISTICAL ANALYSIS AND DISCUSSION OF RESULTS Results of the mathematical evaluation of surface profiles of group C specimen at condition 2 (see Table 2) are listed in Table 3 which includes the four evaluation methods described in the previous section. A transformation of the results shown in Table 3 into qualitative rank is shown in Table 4. The ranking of the roughness and of the waviness according to the E system do not quite agree with each other. This may be due to the different sizes of the disc used to generate the so defined as roughness and waviness. The Average method and the Standard Deviation method have the same ranking. The E method (roughness) and the L0 method have the same ranking also. The results of eight people's ranking by visual observation are listed in Table 5. The agreement of these eight ranks was tested by calcul- ating Kendall's coefficient of agreement~(5). = 122(5 - §)2 KZN (NZ-I) W: coefficient of agreement K: number of observers N: number of ranks 5: sum of rank numbers for each specimen 5: N+I)K 2 55 56 H>whm u, wmmcwnm on >nmwwmwm cw mmom N . . . m .o o .oo o .oooo .Hooo H zmamoo ops oooo om m mo o a ma>zo>wo . omaHoz .omo .ooo .ooo. .ooH .ooo .ooo .ooo so Eamoo so zoamoo H.m~o H.ooo H.opo ~.Hpo N.o~o N.omp o.ooo a: m zmamoo Ho.» Np.o Ho.m Np.m ~o.~ -.o oo.w new Awocmrnmmmv m zwamoo -.o oo.o NH.» ~o.o oo.o oo.o oo.o oaN Azwl6, the rank correlation is not signifi- cant at the 95 percent level. The test results show that the E system is rank correlated with the visual observation, as is the L0 method. The Average method and the Standard Deviation method are not correlated with the visual observation. The conclusion is both the E system and the L0 method could be recommended for the evaluation of profiles of the type described in this article. The E method and the Lo method possess some similar- ities which were discussed separately in an earlier chapter. However, the L0 method would be preferable because of greater simplicity and would introduce less errors if the angles could be measured more precisely than using a simple device like a protractor. Table 7 and Table 8 list the surface characteristics of group C and group D specimens at condition 1 and condition 2 (see Table 2) as determined separately by the E system and the L0 method. Fig. 16 and 17 and Fig. 18 and 19 are graphical illustration of Table 7. Fig. 20 and 21 are graphical illustration of Table 8. Surface quality may be indicated by the difference in roughness or waviness before and after exposure to severe moisture conditions. It is interesting to see from the graphs that both methods agree that the surface quality of melamine overlaid particleboard deteriorates much more severely at extreme exposure conditions when no bonding sheet is used. In other words, the bonding sheet has the ability to mask the surface instability of the substrate to a considerable extent. When no severe exposure conditions are encountered, the use of the bonding 62 TABLE 7. Surface Roughness and waviness of Group C and D Specimen Measured at Condition 1 and 2 Analysed by the E Method. CONDITION 1 CONDITION 2 SEESEEEN GROUP Roughness waviness Roughness waviness (cmz) (cmz) (cmz) (cmz) c 9.6 11.3 ~ 16.4 22.8 10 D 7.3 9.6 15.7 29.2 c 11.0 11.6 16.4 21.4 8 D 8.0 11.1 15.8 26.6 c 13.1 17.6 ' 21.6 30.9 4 D 10.8 14.3 13.0 22.4 C 13.4 17.6 21.8 25.7 1 D 11.6 15.2 20.0 26.6 c 12.5 12.3 22.0 30.0 5 D 9.5 10.3‘ 13.0 18.5 c 12.7 14.8 27.1 39.0 2 D 10.2 14.7 14.0 26.3 c 14.4 15.5 54.1 67.6 3 C 12.1 16.2 23.3 30.7 FIGURE 16. 63 Surface roughness of overlaid substrate without Bonding Sheet (group C) evaluated at condition 1 and 2 by the E system. ,.-_..__ r 64 FIGURE 16 . _\V\\\\\\\\\\\\RW\\ .’ ~\V\V\\\w\\\\vwxx .2 . . _\\\\\\\\5 1 a\bh\\\\\\ W <\\N\\\\ 1. 9. m m 1 .1 .1 V\\\\\\ t t .1 .1 .d d n n H1. n. m m <\\\\\ 1 NNHU _ _ _ _ 0 0 0 0 0 5 l4 3 2 1 § Eov mmocnwsom Board Type (group C) FIGURE 17. 65 Surface roughness of overlaid substrate with Bonding Sheet (group D) evaluated at condition 1 and 2 by the E system. 66 FIGURE 17. 10 1 _\‘\~\\\\\\Q\‘\W\\ _ T~\V\\\\\\\\\\ fl flm\f\‘\\\\\\ 1 _\\\\\\\\\\\\\\ H t~\\\\\\\\\\\\ 12 mm o .11 E, tt :1 .1 dd mm _ c c v\\\\V\\ EU _ _ _ _ r O 0 O 0 0 5 I... 3 2 1 ANEUV mmmcnwsom Board Type (group D) 67 FIGURE 18. Surface waviness of overlaid substrate without Bonding Sheet (group C) evaluated at condition 1 and 2 by the E system. 68 FIGURE 18. E3 condition 1 [J condition 2 :V\\\\\\\ _\\\\~\.\w\wv\\\\\x\ _NH\A\\\\.\AV\\\NN rW\\kmt\n\M\\\\\\\\MV\\\N _ Nw\\\\.\fi\\\\\\\\\\\V\\ \ KH\\\\\\\\\\\\ Nw\3v\\\\\\\\\ 70 60 L 50l— .L no A. 0 3 ANBUV mmmdw>m3 20»— 10.. 10 Board Type (group C) 69 FIGURE 19. Surface waviness of overlaid substrate with Bonding Sheet (group D) evaluated at condition 1 and 2 by the E system. 70 FIGURE 19. s condition 1 70 condition 2 AJ\.\WM\\\\\\WRW\\V\\\ wt\_\fl\W\.\‘\~\V\\\V1 4 4~\V\\t\fi\‘\\\V1 HF\\\WMV\\\R\\\U\LV\\ AT.\\R\\\\\.\J\4\\\\ ”W N\\\N\N _ ‘T‘\N\\\Vx\t\ 50 4O 0 3 Amauv mmmcfi>mz 20 10 0 10 Board Type (group D) TABLE 8. Surface Roughness of Group C and D Specimens Measured 71 at Condition 1 and 2 Analyzed by the L0 Method. CONDITION 1 CONDITION 2 835$? GROUP Roughness (in.) Roughness (in.) C 1.087 1.524 10 D .588 1.444 A c 1. 016 1 .617 8 D .662 1.546 C .965 1.873 4 D .724 1.132 C 1.372 2.118 1 D 1.554 1.823 C .908 2.681 5 D .893 1.222 C 1.467 2.923 2 D .883 1.503 C 1.134 4.036 3 D 1.195 2.390 72 FIGURE 20. Surface roughness of overlaid substrate without Bonding Sheet (group C) evaluated at condition 1 and 2 by the L0 system. 73 FIGURE 20. E CONDITION 1 L— l] CONDITION 2 CNx\.\.\w\\\\\\ NL\.\‘\\\\t\fi\.\‘\\\\ — Kw\fl\\\\\\. h- HNW\\\\\\\\\\.\0\0V0 w.\TVw\\\\\\ .NW\\R\\\\\\\ F! fifl\\\\\\\\\\\\ — 5.0 4.0 0 3 A.:wv mmmcnmsom 2.0 10 1.0 0 Board Type (group C) 74 FIGURE 21. Surface roughness of overlaid substrate with Bonding Sheet (group D) evaluated at condition 1 and 2 by the L0 system. 75 FIGURE 21. NHMW\\\\\\\\LW1\. _.N \.\\\\\\ V \.\‘Nw\\I \ fil. AH\\\\\\\\\WR\R\\\\\\\t11 1. 9. a! .4 “a "N vV\\R\y\\V1 mm. TT F11 T1 T1 .8 mm , m.m no no F no .1 ED _ _ _ — _ .U .U nw nu nw .U .L .m 15 cm .1 A.aav mmmanwsom Board Type (group D) 76 Sheet is not justified. Under those conditions, substrates can be considered as having good surface quality. Comparing Fig. 16 with Fig. 17, Fig. 18 with Fig. 19 and Fig. 20 with Fig. 21, laminates 10, 8 and 1 do not gain much advantage by using bonding Sheet under severe exposure conditions. It can therefore be concluded that substrates 10, 8 and 1 must have good surface quality. Surface quality is determined by several factors, one of them is the dimen- sional stability of the substrates. Due to the fact that substrate 1 is the only one not having been compressed down in thickness, it showed less thickness swelling (see Table 9, group A and B) and a better quality of the overlaid surface. Substrate 10 and 8 possess some other properties besides the dimensional stability, which make them deteriorate even less than substrate 1. Substrate 10 is fiber- board with fine surfaces. Substrate 8 has very fine particles on its surfaces. Table 9 lists thickness, thickness swelling and water absorption of four groups of specimen exposed to condition 2. When comparing the thickness swelling of substrate having been compressed (group B) with those not having been compressed (group A), the former show a greater thickness swelling than the latter. This can be explained by internal failures occurring in the compressed particleboard. Substrate l and its laminates are the only exception. It had not been compressed significantly during the laminating operation and therefore the difference between group A and group B in thickness swelling is small. Table 9 also indicates that overlaid particleboards (group C and D) swell less than substrates (group B) and absorb less water. This could 77 TABLE 9. Thickness, Thickness Swelling, and Water Absorption of Four Groups of Specimen Exposed to Condition 2. THICKNESS THICKNESS MOISTURE SPECIMEN GROUPS (in) SWELLING (Z) ABSORPTION (%) A .744 9.0 10.49 10 B .640 17.0 10.56 C .610 13.6 8.00 D .673 11.0 9.26 A .748 11.6 9.46 8 B .656 17.4 10.39 C .689 12.8 8.46 D .673 13.7 9.56 A .755 15.9 10.73 4 B .591 25.0 11.25 C .600 20.2‘ 8.53 D .628 16.1 8.40 A .757 9.6 8.46 1 B .736 10.3 9.15 C .770 6.1 6.90 D .785 4.3 6.15 A .754 15.4 11.51 5 B .654 22.8 11.98 C .685 15.5 9.18 D .681 15.9 9.36 A .744 11.8 9.23 2 B .581 27.0 11.81 C .614 16.8 8.51 D .644 15.2 8.17 A .746 15.5 10.64 3 B .669 23.0 12.04 C .665 19.4 9.25 D .717 13.1 8.58 78 be explained by the reduced water permeability of the overlaid boards and by some swelling restraint caused by the overlays. General properties of the seven types of commercial particleboard are listed in Table l (18). CHAPTER 6 CONCLUSION The melamine impregnated paper can improve the surface quality of the substrate by restraining the thickness swelling, masking imperfections and providing a smooth surface. On the other hand the overlay accentuates small imperfections because of its high gloss. Both the E system and the L0 method are used in this test to evaluate effective profiles of melamine overlaid particleboard, because both have good correlation with visual observation which is considered a good indi- cator of surface quality. The E system provides a clear separation of roughness, waviness and error of form, while the Lo method eliminates the effect of gross deviation by constructing a non-linear compensating line. The determination of the radii of the discs in the E system and the length of the roughness interval in the L0 method should be studied further. The results of the evaluation based on the E system and the Lo method reveal that surface characteristics of overlaid board are greatly affected by the substrate. Those laminates with bonding sheet have better surface quality than those without bonding sheet only under severe moisture conditions. Substrates with good surface quality need no bonding sheet to add to the cost instead of improving surface quality. Under this interpretation, substrate 10, 8 and l are considered as having good surface quality. 79 80 The melamine overlay can only be applied to substrates having, densities higher than 45 pounds. Otherwise, the long press cycle will cause compression of the substrate resulting in internal failures, and excessive thickness swelling. REFERENC ES 10. ll. 12. 13. 14. REFERENCES Brown, I.D. 1960. Visual and Tactual Judgements of Surface Roughness. Ergonomics 3(1):31—61. Bryan, J.B. 1963. Measuring Surface Finish, Mech. Eng., Dec., 43-46. Ehlers, W. 1958. Uber die Bestimmung der Gute Von Holzoberflachen Holz als Rohund Werkstoff l6(2):49-60. Elmendorf, A. and T. W. Vaughan. 1958. Survey of Methods of Measuring Smoothness of Wood. For. Prod. J. l3(10):275-282. Graf, U. and H.J. Henning. 1952. Statistische Methoden Bei Textilen Untersuchungen. Springer-verlag, Berlin. Hann, R.A. 1957. A Method of Quantitative Topographic Analysis of Wood Surfaces. For. Prod. J. 7(12):448-452. Heebink, B.G. 1955. Some Potentialities of Overlaid Lumber. For. Prod. J. April 97-101. Heebink, B.G. 1960. Showethrough of Particleboard Cores. For. Prod. J. 10(8):379-388. ' Marchessault and Skaar. 1967. Surfaces and Coatings Related to Paper and Wood. First Edition, part 3, chapter 15. C.E. Roger, Polymer Films as Coatings. 463-489. Marian, J.E. and O. Suchsland. 1956. waviness of Lumber and Chipcore Board. Paperi ju Puu 38(6/7):291-302. Mottet, A.L. 1963. Roll Gluing of Exterior Overlay. For. Prod. J. 5:175. Olsen, K.V. 1961. On the Standardization of Surface Roughness Measurements. Bruel and Kjaer Tech. Rev. (B & K Instruments, Inc.) Copenhagan, Denmark No. 3, 3-32. Peter, C.C. and J.D. Cumming. 1970. Measuring Wood Surface Smoothness: a review. For. Prod. J. 20(12):40-43. Reason, R.E. 1960. Orderly Progress in Surface Measurement. Engineering 12, February 230-231. 81 15. 16. l7. 18. 19. 20. 82 Rubert, M.P. 1959. Confusion in Measuring Surface Roughness. Engineering, October 23, 393—395. Stensrud, R.K. and J.W. Nelson. 1965. The Important of Overlay to the Forest Products Industry. For. Prod. J. 5:203. Stumbo, D.A. 1963. Surface Texture Measurement Methods. For. Suchsland, Otto. 1973. Hygroscopic Thickness Swelling and Related Properties of Selected Commercial Particleboards. For. Prod. J. July 26—30. United States of America Standards Institute, Asa B46. 1-1962. Surface Roughness, Waviness and Lay. Pub. The American Society of Mechanical Engineers. Wenzel, R.N. 1949. Surface Roughness and Contact Angle J. of Physical and Colloid Chem. 53, 1466-1467. lHllllllfl 'II II