Forward and inverse modeling using meshless method for NDE application

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Liu, Xin

Date Published: 2009

Subjects: Nondestructive testing
Nondestructive testing--Study and teaching
Nondestructive testing--Standards
Nondestructive testing--Research
Nondestructive testing--Reliability
Nondestructive testing--Mathematical models
Nondestructive testing--Industrial applications
Nondestructive testing--Evaluation
Nondestructive testing--Data processing
Nondestructive testing--Computer programs

Program of Study: Electrical Engineering

Degree Level: Doctoral

Language: English

Pages: xi, 134 pages

Permalink: https://doi.org/doi:10.25335/pv55-9h35

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