Testability design of the DKS chip

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Singh, Tej Pal

Date Published: 1988

Subjects: Integrated circuits--Testing
Integrated circuits--Very large scale integration

Program of Study: Electrical Engineering

Degree Level: Masters

Language: English

Pages: iv, 108 pages

Permalink: https://doi.org/doi:10.25335/zh76-0936

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