Verification of MOS circuits at the switch level
- In Collections
-
Electronic Theses & Dissertations
- Copyright Status
- In Copyright
- Material Type
-
Theses
- Authors
-
Liao, Jiann
- Date
- 1990
- Subjects
-
Digital integrated circuits
Integrated circuits--Very large scale integration
Metal oxide semiconductors
- Program of Study
-
Computer Science
- Degree Level
-
Doctoral
- Language
-
English
- Pages
- x, 106 pages
- Permalink
- https://doi.org/doi:10.25335/bjzq-xr73