Electronic speckle pattern interferometry and applications in engineering mechanics

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Chen, Xiaolu (Optical engineer)

Date: 1992

Subjects: Speckle metrology

Program of Study: Material Science nad Mechanics

Degree Level: Masters

Language: English

Pages: x, 120 pages

Permalink: https://doi.org/doi:10.25335/5cdg-s278