A noise study of bipolar junction transistor reliability

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Sun, Chih-Chieh Jack

Date Published: 1993

Subjects: Bipolar transistors
Transistors

Program of Study: Electrical Engineering

Degree Level: Doctoral

Language: English

Pages: xv, 157 pages

Permalink: https://doi.org/doi:10.25335/8e02-vc46

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