Adherence of diamond thin films on silicon wafers and FTIR spectroscopy of damaged ceramic materials

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Gamlen, Carol Ann

Date Published: 1990

Subjects: Ceramic materials--Testing
Diamond thin films--Testing
Fourier transform spectroscopy
Silicon--Testing

Program of Study: Materials Science

Degree Level: Masters

Language: English

Pages: ix, 145 pages

Permalink: https://doi.org/doi:10.25335/td0h-xf63

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