Examining local item dependence effects in a large scale science assessment by a Rasch partial credit model

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Yan, Jean Weiqin

Date Published: 1996

Subjects: Achievement tests--Evaluation
Competency-based educational tests
Educational tests and measurements--Evaluation
High School Proficiency Test
Item response theory
Science--Ability testing
Michigan

Program of Study: Counseling, Educational Psychology, and Special Education

Degree Level: Doctoral

Language: English

Pages: xi, 178 pages

Permalink: https://doi.org/doi:10.25335/spy4-0c12

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