Measurement of residual stress in thin diamond films by Raman spectroscopy and the beam deflection equation

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Turki, Naoufel

Date: 1996

Subjects: Diamond thin films
Residual stresses
Strains and stresses--Measurement

Program of Study: Materials Science and Mechanics

Degree Level: Masters

Language: English

Pages: xiii, 198 pages

Permalink: https://doi.org/doi:10.25335/7y3b-4c82