1HES‘5 OJ HOGAN STATE NERS llllllllll lllllll. umlllllllll 3 1293 01688 5356 This is to certify that the dissertation entitled Measuring the Transverse RMS Emittance and RMS Pulse Length of a Short Pulse, Photoinjcctor Produced Electron Beam with the Second Moment of its Image Charge presented by Steven J Russell has been accepted towards fulfillment of the requirements for Doctorate . Physics degree in M My. .M Major professor Date 4//"/ a7, ’777 MS U i: an Affirmatiw Action/Equal Opportunity Institution 0— 12771 LIBRARY Michigan State Unlverslty PLACE IN RETURN BOX to remove this checkout from your record. To AVOID FINES return on or before date due. MTE DUE DATE DUE DATE DUE use cJCIRC/DmDinpss-nu \{f c. :1“. {If} .57 MEASURING THE TRANSVERSE RMS EMITTANCE AND RMS PULSE LENGTH OF A SHORT PULSE, PHOTOINJECTOR PRODUCED ELECTRON BEAM WITH THE SECOND MOMENT OF ITS IMAGE CHARGE By Steven J. Russell A DISSERTATION - Submitted to Michigan State University in partial fulfillment of the requirements for the degree of DOCTOR OF PHILOSOPY Department of Physics and Astronomy 1998 “In 5 J ’1 y. ' 1‘ .3 f1 \xéu.’~ u Vii-“‘27 I i “n“ H l. ago“ N! E 71 4' Il;‘x ML .33“! mag“ ABSTRACT MEASURING THE TRANSVERSE RMS EMITTANCE AND RMS PULSE LENGTH OF A SHORT PULSE, PHOTOINJECTOR PRODUCED ELECTRON BEAM WITH THE SECOND MOMENT OF ITS IMAGE CHARGE By Steven J. Russell Radio frequency, photo-cathode injectors are a recent development in the electron accelerator community. They work by placing a small, photo-emissive surface inside a radio frequency accelerating cavity. Electrons are stripped from the photo-cathode with a pulsed laser and immediately accelerated by the cavity fields. These photoinjectors enable the creation of high charge, short pulse length beams. However, they also create problems for the electron beam diagnostics. A photoinjector accelerates the electrons to relativistic velocities very quickly. As a result, the beam does not have time to come to equilibrium. Its spatial distribution will be unknown and cannot be well approximated by a Gaussian. Therefore, diagnostic techniques can make no assumptions about the beam’s spatial distribution. A class of diagnostics that fulfills this requirement look at the image charge “wake” generated in the metal walls of the beam pipe as the electron beam passes. These devices are generically known as beam position monitors and are normally used to measure the first moment of the image charge signal, thereby determining the position of the beam’s center. However, coupled with a good knowledge of the beam line, they are also capable of determining the rms emittance of the beam by measuring the second moment of the image charge signal. In addition, when used in tandem with a deflecting “-, .uar.b cavity, beam position monitors can also be used to perform a measurement of the beam pulse length. Both of these measurements are independent of the beam’s spatial distribution, making them ideal for photoinjectors. Described here is their theory and implementation. To my parents Jack and Pat I .I\".zv- 5 usbtl 7— ~.. ‘3.) LAD... . .. 7) ~ \Tm . .1 un‘ls..l .k‘ .gu Dr. R ~-‘o-f . I AK‘] ext" $L‘ . “d . u. t. e\., .‘ 1.1:?‘1;__.‘ ““vul .* fi-iTYV-‘J. -. lira”. ACKNOWLEDGMENTS I extend my thanks to the Michigan State University physics department and the members of LAN SCE-9 at Los Alamos National Laboratory. To Dr. Bruce Carlsten, for his guidance, encouragement and supervision during my thesis work, I owe a great debt of gratitude. I doubt he knew what he was getting into. I owe special thanks to Dr. Brad Sherrill for being my liaison to Michigan State and for remembering who I am. I thank Dr. Rich Shefiield for bringing me into Los Alamos in the first place. I thank Steve Gierman, Dr. Doug Gilpatrick and Dr. Eric Nelson for very helpful discussions. I thank Mike Webber, John Plato, Scott Volz, Boyd Sherwood, Marty Milder, Ron Sturgis, Dr. Ron Cooper and Dr. Doug Fulton for putting the accelerator together and keeping it running. I thank Dr. Dinh Nguyen, John Power, Brad Shurter and Dr. David Oro for providing valuable assistance and equipment. I thank Drs. Martin Berz, Jack Bass, Ray Brock and Edwin Kashy for their service on my Ph. D. guidance committee. I thank my family for their support. I especially thank my parents, Jack and Pat, for everything they have given me. My uncle Gary and aunt Elaine I thank for support and friendship during my stay in Los Alamos. I thank my sister and brother, Ann and Tim, for making my life better. I also thank Molly, for her love and inspiration. fioal- I" 'P ' " c,. ..Iunu- _‘ u I am also grateful to Michigan State University for the financial support they have given me during my graduate study and Los Alamos National Laboratory for the opportunity to perform my research. vi ESTIHTT} LIST I)? if- DWI.) D l_‘ I 1.: But in. Q A. (LASER; 3313‘: 1.: Err. 2'3 it; h.) r) r.) to ~r1 ~11 ' 2 .9 TABLE OF CONTENTS LIST OF TABLES ............................................................................................................. xi LIST OF FIGURES .......................................................................................................... xii INTRODUCTION ............................................................................................................... 1 1.1 Background ............................................................................................................... 1 1.2 Measuring emittance ................................................................................................. 4 1.3 Measuring pulse length ............................................................................................. 8 1.4 Beam position monitors ............................................................................................ 9 1.5 Implementation of measurements ........................................................................... 1 1 CHAPTER 1 BEAM PARAMETERS MEASURED BY BEAM POSITION MONITORS ................. 16 1.1 Introduction ............................................................................................................ 16 1.2 Notation .................................................................................................................. 16 1.3 Physical description of BPMS ................................................................................ 17 1.4 Image charge .......................................................................................................... 19 1.5 Model of BPM coupling to image charge .............................................................. 20 1.6 Beam information provided by BPM ..................................................................... 23 CHAPTER 2 MEASURING EMITTANCE WITH BEAM POSITION MONITORS ........................... 26 2.1 Introduction ............................................................................................................ 26 2.2 Emittance ............................................................................................................... 26 2.3 Measuring the emittance ........................................................................................ 30 2.4 Stability of emittance measurement ....................................................................... 32 2.5 Figure of merit for matrix equation stability .......................................................... 33 2.6 Finding a stable implementation of Miller’s measurement ................................... 37 2.6.1 Poor implementations of Miller’s emittance measurement .......................... 37 2.6.2 Singular equations and strong coupling ........................................................ 41 2.6.3 Stable implementation of Miller’s measurement .......................................... 43 2.6.4 Numerical examples ...................................................................................... 45 vii .\.. CL E .\.. -\. .\~ .\ . «\it. .\ . 11. 11. * i v.1 Ilia cc ‘1. Th1 4 4 (\y 4 4 C mwl.‘ WW; I‘ll, TI 3. .3 T- a. is. .3 6 P mi 7. I 1.. 4. .2 «A. v k ‘6 1.9.. 1V. 4 4.? 41. iii“ Dd .\. .\. .\. -\. .\. HRH ta NIH]. 1 P.\ E CHAPTER 3 MEASURING THE RMS PULSE LENGTH WITH FAST DEF LECTING CAVITY AND BEAM POSITION MONITOR ............................................................... 51 3.1 Introduction ............................................................................................................ 51 3.2 Trajectory change of a single electron at fast deflector exit .................................. 53 3.2.1 Field components .......................................................................................... 53 3.2.2 Conversion of field components to Cartesian coordinates ............................ 55 3.2.3 Equations of motion ...................................................................................... 56 3.3 Measuring the rrns length squared of the electron beam bunches ......................... 59 3.3.1 F astdeflector off ........................................................................................... 60 3.3.2 Fast deflector on ............................................................................................ 61 3.3.3 Measuring bunch length ................................................................................ 65 3.4 Calibration of measurement ................................................................................... 66 3.5 Estimate of measurement resolution ...................................................................... 66 3.6 Effect of BPM rotated with respect to fast deflector cavity ................................... 69 3.6.1 Pulse length measurement ............................................................................. 69 3.6.2 Calibration ..................................................................................................... 72 CHAPTER 4 CALIBRATING BEAM A POSITION MONITOR ......................................................... 74 4.1 Introduction ............................................................................................................ 74 4.2 Simulating a relativistic beam ................................................................................ 74 4.3 Mapping the BPM .................................................................................................. 76 4.4 Fitting the map data ............................................................................................... 76 4.4.1 Centroid calibration ...................................................................................... 79 4.4.2 Quadrupole calibration .................................................................................. 84 4.5 Simulating a diffuse beam ..................................................................................... 88 4.5.1 Interpolation versus measurement ................................................................ 91 4.5.2 Check of BPM accuracy for measuring (x2 > — .................................... 93 4.6 Concerns with calibration method ......................................................................... 95 CHAPTER 5 EXPERIMENTAL RESULTS ........................................................................................... 98 5.1 Introduction ............................................................................................................ 98 5.2 Experimental apparatus and data acquisition ......................................................... 98 5.2.1 Experimental apparatus ................................................................................. 98 5.2.2 Capturing BPM signals ............................................................................... 101 5.2.3 Analyzing digitized BPM signals ............................................................... 101 5.3 Stability experiment ............................................................................................. 104 5.3.1 Shot-to-shot stability ................................................................................... 105 5.3.2 Average stability ......................................................................................... 110 5.4 Experiments to check BPM calibration ............................................................... 111 5.5 Emittance measurements ..................................................................................... 117 5.5.] Single emittance measurement ................................................................... 118 viii 5.5.2 On the question of beam scraping ............................................................... 127 5.5.3 Emittance versus bunch charge ................................................................... 133 5.5.4 Emittance versus magnetic field ................................................................. 134 CONCLUSION ................................................................................................................ 141 APPENDIX A CHARGE DISTRIBUTION INDUCED ON INNER SURFACE OF BEAM PIPE DUE TO RELATIVIS'IIC ELECTRON BEAM .................................................. 144 A.l Introduction ......................................................................................................... 144 A2 Solution in beam frame ....................................................................................... 144 A3 Surface charge distribution in lab frame ............................................................. 154 A.4 Relativistic approximation .................................................................................. 157 APPENDD( B SURFACE CHARGE DISTRIBUTION ON INNER SURFACE OF CYLINDRICAL METAL PIPE DUE TO AN INFINITE LINE CHARGE INSIDE THE PIPE AND PARALLEL TO ITS AXIS .................................................... 160 B.1 Introduction ......................................................................................................... 160 B2 Constant potential surfaces due to two infinite line charges in free space .......... 160 B3 Electric potential from infinite line charge inside an infinite metal pipe ............ 163 8.4 Surface charge distribution from infinite line charge inside infinite metal pipe.166 B.4.1 Image charge distribution ........................................................................... 166 B.4.2 Expansion of image charge distribution in Fourier series .......................... 167 APPENDIX C VOLTAGE SIGNAL GENERATED ON OSCILLOSCOPE FROM BEAM POSITION MONITOR SIGNAL TRANSMITTED THROUGH TRANSMISSION LINE .................................................................................. 169 C.1 Introduction ......................................................................................................... 169 C2 General Solution .................................................................................................. 169 C21 Solution to circuit model ............................................................................ 169 C22 Expression for beam current ....................................................................... 172 C23 Solution ...................................................................................................... 175 C3 Approximate solution for short beam pulse ........................................................ I75 C.4 Gaussian beam ..................................................................................................... 176 APPENDIX D EXPANSION OF BPM SIGNAL AMPLITUDE IN CARTESIAN COORDINATES..179 D.1 Introduction ......................................................................................................... 179 D2 Expansion of amplitude in Cartesian coordinates ............................................... 179 D2] Expansion of summation term in Cartesian coordinates ............................ 180 D.2.2 Expressing amplitude as a sum of moments .............................................. 181 ix El 121'.» EC Elect E3 Tm: E43371 ES $03-: E0 Eit‘t’i APPENDEX f0‘~‘.tR:--t.\ ALCL’LAI ~ \aci APPENDIX E FIRST ORDER CALCULATION OF THE TRAJECTORY OF AN ELECTRON DUE TO IDEAL FAST DEFLECTOR FIELDS ....................................... 185 El Introduction ......................................................................................................... 185 E2 Electric and magnetic fields of fast deflector ...................................................... 185 E3 Transformation of fields to Cartesian coordinates .............................................. 187 E4 Demonstration of dominant field ......................................................................... 193 E5 Solution to the first order equations of motion .................................................... 196 E6 Electron position and divergence at exit of fast deflector cavity ......................... 198 APPENDIX F COVARIANCE MATRIX AND THE STANDARD ERROR IN THE CALCULATION OF THE EMITTANCE ...................................................................... 201 El Introduction .......................................................................................................... 201 F2 Estimating measurement errors ........................................................................... 202 F3 Covariance matrix ................................................................................................ 207 F .4 Estimated error in calculation of the emittance ................................................... 209 REFERENCES ................................................................................................................ 215 [¢‘ 1" (h 'i‘ a .... 7-4 3.3: in pt: ~ 5. ms Z A\ 01‘ t‘. 111’ for LIST OF TABLES Table 3-1: Value of a? ((1):) vs. drift length, d, and the FWHM pulse length of the beam .................................................................................. 70 Table 4-1: Table comparing the values of i, y and (x2 ) — (y’) as measured by a BPM to their actual values for several . simulated, diffuse beams .................................................................................. 94 Table 5-1: Average measured value of (x2 ) - (y2 > , predicted value of (x2 > — (yz) (from fit) and the difference between them for each quadrupole setting in emittance measurement for charge equal to approximately 0.2 nC/bunch ........................................... 123 Table 5-2: Same as Table 5-1, but measurements 2, 3, 5 and 19 are all discarded because of beam scraping ......................................................... 126 Table 5-3: Value of (x2) — (f) from simulation, predicted value of (x2 > - (from fit) and the difference between them for each quadrupole setting in simulated emittance measurement with beam pipe ......................................................................... 131 Table 5—4: Values of the RMS beam parameters for different fits in simulated emittance measurements ................................................................ 132 xi I]. as ‘.-b Flu. phi. Illa s. Q .A ‘I-I ‘ ~ .2 “C “C a . L L. a ~ s» ... n‘ s \u pit . p... FL. F'.‘\y. .9 a tidy ~. ‘ is N) .e .e .. .. c «C; v..\\ an. tr. ‘ .3 ‘\ . 'P 5‘se Figure 1-1: Figure 1-2: Figure I-3: Figurel-l: Figure 1-2: Figure 2-1: Figure 2-2: Figure 2-3: Figure 2-4: Figure 3-1: Figure 3-2: Figure 3-3: LIST OF FIGURES Schematic of SPA photoinjector ..................................................................... 13 Schematic of SPA beam line .......................................................................... 14 a) Schematic of magnetic chicane. b) Energy versus beam bunch length from simulation. .............................................................. 15 Schematic of beam position monitor cross section. The beam will travel along the z axis, out of the page .......................................... 18 Circuit model of BPM electrode coupling to electron beam. CD is the capacitance of the BPM electrode. Zc is the characteristic impedance of the transmission line. ib represents the image induced image charge from the passing electron beam .................................................................................................. 21 The x phase space of the SPA beam from simulation .................................... 28 Schematic of beam line for implementation of emittance measurement using only drifts ....................................................................... 38 Schematic of beam line consisting of quadrupole magnet, drift and BPM ................................................................................................. 40 Schematic of beam line consisting of a triplet followed by a beam position monitor ................................................................................. 44 Illustration of fast deflector cavity streaking a beam bunch .......................... 52 Schematic of fast deflector cavity .................................................................. 54 BPM rotated with respect to the x and y axes defined by the fast deflector fields ................................................................................... 71 xii he“ '14-). 31 Ca: uf‘ \\ l: [he Fm, . ”:JIC 4-71 81 an ant FELT 4-8: St: F‘E‘ire 4.9; bl] Cle Figure 4-1: Schematic of pulsed wire apparatus for calibrating BPM .............................. 75 Figure 4-2: Maps ofthe a) right (0 = 0°) and b) left (0 = 180°) electrodes of a BPM ....................................................................................... 77 Figure 4-3: Maps of the a) top (0 = 90°) and b) bottom ( 0 = 270°) electrodes of a BPM ....................................................................................... 78 Figure 4-4: a) R, versus actual x position of wire, b) R" versus x position of wire as calculated by fitted equation ............................................ 81 Figure 4-5: a) Ry versus actual y position of wire, b) Ry versus y position of wire as calculated by fitted equation ............................................ 82 Figure 4-6: a) Difference between actual x position of wire and that calculated from the fitted equation versus radial position of the wire. b) Difference between actual y position of wire and that calculated from the fitted equation versus the radial position of the wire ......................................................................... 83 Figure 4-7: a) Plot of the difference between actual value of x2 — y2 and its calculated value using the fit of Equation (4-6) , and b) using Equation (4-7) ............................................................................ 87 Figure 4-8: Schematic showing grid points for simulation of diffuse beam with a single pulsed wire ...................................................................... 90 Figure 4-9: a) Plot of (x2 > — versus Q for a number of simulated beams (32 = y = 0) using the apparatus in Figure 4-1. b) Identical to a) except that the responses of the BPM electrodes for the individual grid points are interpolated from BPM maps ............................................................................................. 92 Figure 4-10: Plot of the difference between the actual value of (x2 > — and that calculated from the BPM signals in mm2 for a single simulated beam as it is move radial outward from the BPM center ........................................................................ 97 Figure 5-1: Schematic of end section of SPA beam line .................................................. 99 Figure 5-2: Schematic of data acquisition system for capturing BPM signals ............... 102 xiii ’ ‘ Fr VP'p‘ - " lid-:5 . U ”T [.2 7‘? ’4 (Y. " Lb“ Figure 5-3: Figure 5-4: Figure 5-5: Figure 5-6: Figure 5-7: Figure 5-8: Figure 5-9: Voltage versus time signal from BPM electrode for a typical beam shot. There are two full beam bunches and part of a third displayed ................................................................................ 103 a) Intensity (sum of four BPM electrodes) versus successive beam shots. b) (x2) — versus successive beam shots .................................................................................................... 107 a) x position of beam center versus successive beam shots. b) y position of beam center versus successive beam shots ......................... 108 a) Average intensity (sum of four BPM electrodes) of beam bunch versus measurement number. b) Average value of (x2 > — versus measurement number. Each measurement is the average over 99 consecutive beam shots ...................... 112 a) Average value of x position of beam bunch center versus measurement number. b) Average value of y position of beam bunch center versus measurement number. Each measurement is the average over 99 consecutive beam shots ................................................................................ 113 a) Another example of the average intensity (sum of four BPM electrodes) of a beam bunch versus measurement number. b) Another example of the average value of (x2 > - versus measurement number ......................... 1 14 a) Quadrupole moment versus 322 — yz. The slope of the fit line is 0.95 i 0.021. b) (x2) — versus measurement number for the same data points shown in a). Each point is the average of 99 beam shots ........................................ 116 Figure 5-10: A matrix associated with settings for quadrupoles in Figure 5-1 used to measure the electron beam emittance ........................... 120 Figure 5-11: Average beam intensity (sum of four BPM electrodes) at BPM versus measurement number for emittance measurement a charge equal to approximately 0.2 nC/bunch .................... 122 Figure 5-12: Intensity vs. measurement number for simulated emittance measurement ............................................................................... 130 xiv Jp—J clap Figure 5-13: A plot of normalized emittance versus bunch charge ................................ 135 Figure 5-14: Emittance versus magnetic field on photo-cathode ................................... 140 Figure A-l: Relativistic electron beam pulse in metal pipe: a) cross sectional view, b) longitudinal view ........................................................... 145 Figure A-2: Lab and beam frame for relativistic electron beam bunch traveling down beam pipe ........................................................................... 155 Figure B-l: Two infinite line charges parallel to the z axis with charge per unit length A and —A, respectively ............................................. 161 Figure 8-2: Infinite line charge inside an infinite metal pipe ......................................... 164 Figure C-l: Circuit model of BPM electrode coupling to electron beam. Cp is the capacitance of the BPM electrode. Zc is the characteristic impedance of the transmission line. ib represents the image induced image charge from the passing electron beam ................................................................................................ 170 l a) 2 Figure C-2: The fimction e 2L“ J vs. frequency for a 6 mm, or 20 ps, FWHM long electron pulse ............................................................... 178 Figure E-l: Schematic of fast deflector cavity ................................................................ 186 k Figure E-2: a) J l(knr) (blue) and #r- (red) versus radius, 1 b) 12(kur) (blue) and §(k”r)2 (red) versus radius .................................... 191 . XI! 2 Figure E-3: 1— 157x vs. x (cm) ............................................................................... 192 . Av Figure E-4: I? vs. x (cm) for an 8 MeV electron ......................................................... 195 XV Ll Backgroun [11 W34 ii‘it' “as to Jet-chi Exac’rai‘lc 3 fi .5 3 Effig’m “JD As SDI gt 13:1": 3.1111 mm Mere-d 2;,“ of sufficiem l 121: held , {ICE INTRODUCTION 1.1 Background In 1984 the Strategic Defense Initiative (SDI) was officially launched. Its stated goal was to develop weapons capable of destroying nuclear missiles in flight, creating an impenetrable shield around United States interests. Since the technology to develop such a system was not in existence, substantial funding was provided to the scientific and engineering community towards its development. As SDI got under way, it was not clear what final form the weaponry of SDI would take and many potential solutions were pursued. Of particular interest were the high powered laser programs. Fast and precise, lasers were a perfect fit to SDI if laser systems of sufficient power could be developed. The free electron laser (FEL) was one candidate that held great potential to satisfy SDI needs[1]. Although a rigorous description is quite complicated[2], F ELs are conceptually simple devices. A high energy beam of electrons is directed down the axis of an alternating magnetic field. In this field, the electrons move back and forth across the path of their initial trajectory, generating light that can be used to amplify a conventional laser beam or to create a coherent light beam inside a resonator cavity. At the time that SDI came into being, FELs had been in existence for a little over a decade[3]. However, this was the first time that significant resources were applied 1 1011“,} II‘";' J.“ “‘3 H »'~\-"»'.: ‘ - ‘ 5L5‘“‘&_‘L'n3 '. - Em. In 1“" ' fl- 1 \- «3.8 3131\- L? lbs 623.. 1ch tier technit much alike. Literati-3n of Thumb . JMment c 4 . «twee. Th; 1 grams. 2 toward their development. Because their physics can be described classically, powerful simulations were developed that indicated fantastic performance was possible using F ELS. In fact, two machines boasting an average laser power to be measured in mega- watts and operating over a broad range of wavelengths were proposed[1]. However, in the end, neither of these devices were constructed. SDI came to a halt and FEL funding was sharply curtailed. The SDI program advanced the knowledge of F ELs very rapidly in a short time. F ELs still hold great promise as high powered, tunable light sources and the knowledge gained during the frenetic SDI years has proved very valuable. Although in hindsight it is apparent that the attempts to build the huge, mega-watt machines was premature, many other technical advancements that came out of the programs of the past are still very much alive. Of particular importance to the electron accelerator community was the invention of the radio-frequency (rf) photoinjector[4], [5]. Throughout the history of FELs, it has been apparent that the success of an F EL experiment depends strongly upon the quality of the electron beam used to drive the device. This fact was fitrther underscored for those who worked in the SDI FEL programs. Therefore, there was a significant effort to advance electron accelerator technology to achieve better beams. The electron source, as one might imagine, is a very important part of any electron accelerator. For many years, the only choice was to use a thermionic cathode[6]. This is a simple device where the cathode material is heated to the point that electrons on its surface obtain enough energy to overcome the material work function. Immersed in a static electric field, the electrons are accelerated as they boil ofl‘ the cathode surface to m 3 dc N :lecl'k‘m is n' mam in" mm “III; 11: mars”. Amati ' n rm 0er 'h': 5 b L med. Ihc agzrst the PL Ejector will this means LL. “"jfikih- ‘ Lt....-r...312011 3 form a dc beam. Since high energy accelerators are pulsed devices, this do beam of electrons is not appropriate for immediate injection into the accelerator. First, a pulsed structure that matches that of the accelerator is imposed. This is done by bunching the beam with time varying electric fields. Only then are the electrons accelerated to high energy. Although thermionic cathodes are very reliable, they severely limit the command one has over the shape of the electron beam that is injected into the accelerator. While being bunched, the electrons are at low energy and the repulsive force between them works against the bunching process. The end result is that an electron beam from a thermionic injector will approach an equilibrium shape[6]. Although not obvious, experimentally this means that the spatial distribution of the beam will be very nearly Gaussian. The combination of low energy and repulsive space charge force will wash out any other structure that might be dictated. The rf photoinjector was invented by Richard Sheffield and John Fraser[4], [5] as an alternative to the thermionic injector for rf accelerators. The idea was based on the lasertron concept[7]. Instead of a heated filament, the photoinjector uses a photo-cathode as its electron source. The photo-cathode is a photo-emissive surface located inside the accelerator. A short pulse, high energy laser impinges upon the photo-cathode, stripping electrons from the cathode surface. Once free, the electrons are quickly accelerated to relativistic velocities. The inventors of the photoinj ector had two powerful insights. First, they realized that our ability to manipulate pulsed laser light is much greater than our ability to manipulate pulsed electron beams. By using a laser to make the electron beam, much of this greater Q ‘ \9y 0K3 b\ul)n x I “1"- 1» cube .3; '7‘] l "u aw" 1 inimdfi I V ‘1» up. a )i;‘\|\§ Lil-‘- .; .~ 49.. .— . u‘ «V'L :““‘\ “ CCT‘L'I‘eriM . “"4“. ‘ . lfflt‘l’v 4' . ‘71 S‘MH. 4 I‘M pa... ‘ \Ul‘ v. 1 H ‘J‘ 0“ c 4 capability is transferred, improving our capacity to impose a desired initial shape for the electron beam. Second, since the electron beam is already bunched, the photo-cathode can be placed inside the first cell of the accelerator. Here, the very high electric fields accelerate the electrons to relativistic velocities over a distance an order of magnitude shorter than that required by a thermionic injector. Therefore, because of relativistic effects, much of the original structure of each electron beam is preserved. This allows a great deal of control over the spatial distribution of the final electron beam. No longer is a Gaussian-like shape inevitable. The ability to control the final beam distribution, at least partially, is the most significant advancement that the photoinjector brings to the electron accelerator community. Employing this control wisely can improve the beam quality and enable longitudinal compression of the electron beam that is much more effective than what can be achieved with a thermionic beam[8]. However, this also creates new challenges for the beam diagnostics. Because the beam is no longer GauSsian-like and because our control over its shape is not complete, we can no longer make accurate assumptions about the spatial distribution of the beam[9], [10]. Therefore, it is important that our diagnostics make no assumptions about the beam distribution. [.2 Measuring emittance Each electron in a beam bunch is described by six coordinates: the three spatial coordinates and their associated momentum. Taken as a whole, the bunch occupies a six dimensional volume. Ideally, we could know the beam distribution in this six dimensional phase space at any given time. However, the ability to make such a meesrcmt " lt’a screen pix-s: syrcc 1 terms: 311. 02301116 x as. b} the anti knowledge 0' determine 1h. are 1:263:65], Inert 33 km Using 1 eWEISS of n ”165121 “hit effCii'le lg 11 LL31 13 mean! large amfiun: ls .I. t‘akkgIOuI-ld ( 3r (\s “limit. 5 measurement has not yet been realized. Instead, we look at projections. If a screen is inserted into the beam path we see the projection of the six dimensional phase space onto the x, y plane. This is a very useful diagnostic that tells us the transverse shape of the beam at a given point in its transport. However, the projections onto the x and y phase spaces tell even more. These are the planes with one axis defined by the position coordinate and the other by the respective momentum. In principle, knowledge of these projections at any given point in the beam transport allows us to determine the shape of the beam at any other point in the beam-line if the focusing forces are linear[6]. There are schemes for mapping out the complete transverse phase space of an electron beam using slit and collector type schemes[9]. However, for high charge beams with energies of more than a few MeV, it is questionable how efficacious these methods are. The slit, which is used to select slices of the beam while blocking the rest, becomes less effective as the beam energy increases. The electrons start to punch through the material that is meant to stop them and at the same time produce copious x-rays. This results in a large amount of noise in the collector necessitating some scheme for subtracting the background out of the desired signal. At high charge and high energy this becomes difficult. For higher energy electron beams, complete maps of the transverse phase spaces are usually abandoned in favor of an envelope description. This simplifies the measurement greatly and still provides useful information. In this scheme, the x and y phase spaces are characterized by the x and y root-mean-square (rms) emittances defined by m m J mi 11: 3.15ch t fiergcncies. beans. ln If. ellipse. Tried 0525: }' emit. From the l and a. J-2 and 8, \/-2 . The angled brackets indicate an average over the beam distribution. The x and y divergencies, x' and y' , are proportional to the x and y momenta for relativistic electron beams. In the x phase space, the three numbers, (x2), (x'z) and (xx'), describe an ellipse. The emittance is the area of this ellipse divided by the number 1:. The meaning of the y emittance is similar. From the rms emittance, we can define the normalized rrns emittances as 8,... E 1578,. and syn 5 Bye, where [3 and y are the usual relativistic parameters associated with the average energy of the beam. The normalized emittance is a useful metric because it has the property that it is a conserved quantity in a linear focusing channel with acceleration[6]. Because of this property, it is an excellent indicator of unwanted nonlinear processes. Also, the emittance is to charged particle optics what wavelength is to light optics: it provides a fundamental limit on how tightly a beam can be focused and indicates how fast it will diverge from that focus. Since the main goal is often to pack as many electrons as possible into a given area, normalized emittance is widely used as a metric for beam quality. Accelerator facilities will always quote normalized emittance as a standard for machine performance. an optical In“; \ hem SN” If he M3? and j)". I‘" mesons that it Spies in the ir measurement. hiersities. the range. on the c brfght central c ”~va l:\ 1 10300. 7 A typical procedure for determining the rrns emittance is to measure (x2) and (y’) at several points in a linear focusing channel. If, for example, we wanted to know the rms x emittance, (x2) would be measured in at least three different beam line locations. This results in a set of three, or more, linear equations that can be solved for (x2 ) , and obtain , and (yy'). Measuring (x2) and can be a challenging task. A common method would be to insert a screen in the beam path. This screen can have a phosphor coating that generates an optical image of the beam spot. A series of mirrors and lenses is then used to direct the beam spot image to a camera where it can be captured. If the beam spot image were perfect, a direct numerical integration would give (x2) and (f). For a real image, however, integration is a poor option. There are two main reasons that it fails: image noise and the limited dynamic range of the camera. Noise spikes in the image, whatever their origin, are always positive. That is the nature of the measurement, there is never a negative intensity. Because integration sums the intensities, the noise will add together, causing substantial error. The limited dynamic range, on the other hand, will cause some of the beam image to be lost. Away from the bright central core of the beam, the light generated by the electrons is too faint for the camera to see. This might seem unimportant since a faint image indicates a low electron density. However, because the area is large, the total number of electrons in these faint regions can be a large fraction of the total number in the beam. Leaving them out of an integration would also result in a large error. [mead 01°11 91-." if L Dial uc '~ in“ tu no the: on L7“. his ape 01pm xiii“. ‘hzit 0.1.: 1" "id 5’ Any district? 1.... .att'ratc \a? L’I‘cn these \ .1 8 Instead of integrating the image, the problem can be greatly simplified by assuming that the beam has a particular type of distribution. Then, the obtained beam image can be fit to this distribution and (x2) and fall out naturally. Noise spikes essentially have no affect on the fit and the central region of the beam image is enough information for this type of processing if the distribution assumption is a good one. Thennionic beams, with their Gaussian nature, are ideal candidates for this technique and accurate values for (x2) and result. For photoinjector beams, however, the distribution is not known. Any distribution assumption, Gaussian or otherwise, will generally be a poor one. Inaccurate values for (x2) and — (yz). When the beam pulses are very short, as is the case for our photoinjector beam, the determination of these quantities is independent of the beam’s spatial distribution. BPMs have been used for quite some time for measuring the beam position[11]. They have not been used extensively to determine (x2 > — . However, knowledge of this quantity can be exploited to measure both the rms emittance of the beam and the rms pulse length. To measure the emittance, we perform essentially the same measurement as was described earlier. It was first proposed by Miller et. al.[12] to measure (x2>—, instead of (x2) or , at various points in a well characterized, linear focusing channel. If this is done at least six times, a set of linear equations results and we can solve for (x2), , (xx') , (yz) , and — (yz) before and after the cavity is turned on, it can be shown that the difference between the two measurements will produce the rrns length of the beam pulse. The advantage that the BPM brings to the method is that, unlike the screen, a good focus is not necessary at the BPM location. This allows us to increase the drift, and therefore the resolution, between the BPM and the ll cavity indefinitely as long as the beam does not intercept the beam pipe walls. 1.5 Implementation of measurements The Sub-picosecond Accelerator (SPA) facility at Los Alamos National Laboratory is an 8 MeV, rf photoinjector operating at a frequency of 1300 MHz[13]. Its primary mission is to explore the uses and dynamics of compressed electron beams. State of the art in this field, SPA is capable of compressing electron pulses containing more than 1 nC of charge to sub-picosecond lengths with a magnetic chicane[8]. In its previous incarnation, the SPA photoinjector was the electron source for the High Brightness Accelerator FEL (HIBAF) facility[14]. Schematics of the important components of the SPA facility are shown in Figure LI, [-2 and I-3. The chicane, shown in Figure I-3a, is a series of four dipole magnets whose field orientations are such that an electron will travel a path through them like that shown in the figure. Utilizing the unique capabilities of the photoinjector, electron beam pulses of an appropriate length are injected into the accelerating structure at a phase in the rf cycle so that an energy versus phase correlation is introduced. This energy slope, shown in Figure I-3b, is largely linear and is such that the electrons in the front of the beam bunch have lower energy than those at the back. Because of their lower energy, the electrons at the front of the pulse are directed along a bigger are through the chicane than those at the back. Therefore, they travel a greater distance. If the energy slope and initial bunch length are chosen correctly, the particles at the back of the bunch will catch those at the front as the beam exits the chicane, compressing the beam. 12 Compression technology is an important issue in the electron accelerator community. The delivery of large amounts of charge in small volumes is a critical ability for both applications and fundamental research. However, recent work has predicted an unfortunate degradation of rrns emittance as a bunched beam passes through a bend[15]. Since a chicane is a series of bends, it is very likely that, at the same time it compresses the beam, it causes serious harm to its quality. What is needed are the tools to perform the relevant measurements of the SPA beam properties. The two diagnostic techniques described here will fill important diagnostic needs for SPA, if they prove practical. What is presented here is the theory and implementation of the nns emittance measurement using BPMs and the theory behind the rms pulse length measurement using a cylindrical cavity and a BPM. Solenoid 1 Solenoid 2 Laser Il|>r Figure I-l: Schematic of SPA photoinjector. 14 2250 5082.83 2mm .60 9...:on EEO beacon“ a: 52% E0 £2332 Somavwzo 38:5 52:02 =8 mucusm .8: .53 $5 co 2322.3. "2 as»; E396 2mm =00 .335 wetusm 81m l‘IIaIiQn. 15 Dipoles Electron / \I Trajectory \ O S O O 8) Electron Energy vs. Position in Bunch From Simulation 8.80 . 8.6M 0 8.40 ._ 8.20 + 8.00 4» 7.80 1» 7.60 I 7.40 ~~ 7.204— P 4. L v i : f t a i -0.60 -0.50 ~0.40 -0.30 -0.20 0.10 0.00 0.10 0.20 0.30 0.40 Electron Energy (Mel) Electron Position Relative to Bunch Center (cm) b) Figure I-3: a) Schematic of magnetic chicane. b) Energy versus beam bunch length from simulation. Chapter 1 BEAM PARAMETERS MEASURED BY BEAM POSITION MONITORS 1.1 Introduction Before beginning any other discussion, it is important to demonstrate what it is that BPMs measure. A complete understanding of the signals they produce and how they can be exploited to obtain important beam parameters is presented in this chapter. 1.2 Notation Before proceeding, a brief statement conceming notation is in order. Throughout this document, quantities will be averaged over the electron beam distribution. This will be done in two ways. The first is called an ensemble average. This is the average of a quantity over the beam distribution in the coordinate system whose origin corresponds to the center of the beam. An ensemble average is denoted by angled brackets: jjjquanfity x p(sz)dV Origin conesponds to beam center mas-w ’ Origin corresponds to beam center (quantitY) 5 (14) where p(x) describes the electron beam’s spatial distribution. By definition (X)=(y>=(2>=0. 16 17 The second way in which the average of the beam distribution is taken defines the transverse, or xy, origin to correspond with the center of the beam pipe. The longitudinal, or z, origin corresponds to the longitudinal center of the beam bunch. This average is important when describing the signals produced by the BPM. This average will be referred to as a BPM average and is denoted in the following way: ”Iquantity x p(x)dV xy origin corresponds to beam pipe center, 2 origin to beam bunch center WW xy origin corresponds to beam pipe center, 2 origin to beam bunch ccnte (quantity)BPM a (1-2) The BPM averages of x and y yield the x and y position of the center of the beam with respect to the beam pipe and BPM = 0- 1.3 Physical description of BPMs The BPMs employed on SPA are dual axis, capacitive type probes that differentiate the beam image charge[16]. Physically, they are short sections of beam pipe in which 3.2 mm long slots that subtend an angle of 45° have been cut out of the beam pipe walls. Metal electrode are inserted into the gaps created by the cutouts. Somewhat smaller than the slots and electrically isolated from the rest of the BPM, the electrodes are slightly inset from the pipe wall. They are placed at 90° intervals around the pipe circumference: two on the x axis and two on the y axis. Figure 1-1 is a schematic of the BPM geometry. Top Lobe Left Lobe Right Lobe 20. = 45° x F Bottom Lobe Figure 1-1: Schematic of BPM cross section. The beam will travel along the z axis, out of the page. 19 1.4 Image charge As an electron beam bunch travels down the z axis (out of the page in Figure 1-1) it is accompanied by a “wake” of image charge in the beam pipe walls. The distribution of the image charge depends upon the shape of the beam bunch. Assuming that the BPM electrodes introduce a negligible perturbation, the image charge distribution that they see can be well represented by the analytical result obtained for a smooth metal wall. For a bunch of charge moving at a relativistic velocity along the z axis of the pipe, this is r! n m a —flm|z-2'l X c(0,z,t) = $177 ij(r',0’,z',t)Z;an cos[n(0 —0')]ZlT-Te “ d3x' V n= m= n nm where 1 a : E’nzo. (1'3) 1, n :t 0 The radius of the beam pipe is a, the xnm’s are the Bessel function zeros and y is the usual relativistic parameter. The beam bunch has a density distribution function pL(r,9,z, t) in the lab frame. (See Appendix A) When the beam is highly relativistic a useful approximation can be made. One definition of the Dirac delta function is _lx-X'l e 8 28 6(x — x') a ling Making the definition 20 a 8: YXnm gives _|z-2'| _a__ _Iz—z'l “Y‘X—mllz-z'l a 6 Wm" a e 8 e a = =2 YX... a m... 28 Yxnm When 7 is large one can make the approximation X -r :"lz-Z'I a :2 8(z — 2'). (1-4) nm Substituting (1-4) into (1-3) gives O'(9,Z,t) E 5;; I area of Pipe pL(r',9’,z,t){l+2i(-;-') cos[n(6—9')]}r'dr'd0'. (1-5) The geometrical term in parentheses is the distribution function for an infinite line charge inside a cylindrical pipe. (See Appendix B) This is a result of the well known “pan- caking” effect. When the beam hunch is relativistic, the electric field lines are almost perpendicular to the direction of motion. 1.5 Model of BPM coupling to image charge The coupling of the BPM electrodes to the beam image charge can be modeled by the circuit in Figure 1-2[17]. The image charge is represented by the current, ib. Z6 is the characteristic impedance of the transmission line and CD is the capacitance of the BPM electrodes. In the frequency domain, this model is accurate up to approximately 2 GHz[16]. 21 Transmission Line /\ U K) O Figure 1-2: Circuit model of BPM electrode coupling to electron beam. Cp is the capacitance of the BPM electrode. Zc is the characteristic impedance of the transmission line. ib represents the image induced image charge from the passing electron beam. 11): signal an OSClilOSCI‘P‘ short a large inaccurate rho ensure that in modified sight functions are Ate) for the c 22 The signal generated by a BPM electrode travels down a transmission line to where an oscilloscope displays the resulting voltage signal. Because our beam bunches are very short, a large part of the signal content is at very high frequencies. Since the model is inaccurate above 2 GHz, low-pass filters are placed on the oscilloscope inputs in order to ensure that we are far from that regime. The end result is that the original signal is modified significantly by the time it is displayed on the oscilloscope. Therefore, transfer functions are assigned in the frequency domain: 0(0)) for the transmission line and A((o) for the combination low pass filter and oscilloscope. As already mentioned, the electron beam bunches on SPA are quite short. The maximum expected full width at half maximum length (FWHM) is 6 mm, or 20 ps. Under these conditions the beam bunch is essentially a delta function longitudinally for all frequencies of interest. Taking this into account and using the circuit model in Figure 1-2 and the expression for the image charge given in equation (1-5), the voltage signal seen by the oscilloscope is area of -ao n=l Pipe 1 +ao co , n . vosc(t) = 4? I da' jdz'pL(r',0',z’){2a + 42 (21-) srnnnct cos[n(0 — 90]} m afizo ® 3‘6 2n w [1 _ 6-1;?) Lam/1(a))" , ujmtdm , (1‘6) 1+ JCOCPZC where L is the length of the electrode and 20 its longitudinal position. (See Appendix C) Without knowledge of the form of the transfer ftmctions 0(0)) and A(co) or the values for the various constants, the shape of the time signal cannot be predicted. However this does not present a problem. As will be shown, it is the amplitude of the '1, nmesumtm- Mmemh firmmk Mumnm; Al‘xndtx D} 23 time signal that provides the useful information about the electron beam. 1.6 Beam information provided by BPM The amplitude of the time function in (1-6) is given by 1 M °° r' " sinnct A = Fatima ldz pL(r ,9 ,2 ){2a +421?) n cos[n(0—9 H}. (1-7) pipe The term in parentheses can be expanded and converted to Cartesian coordinates. (See Appendix D) Then, the integral can be taken over each term in (1 -7) yielding 4 . A = 4:, {2a +—S;flx-(Ycos0 +YSin0) 2 sin 2a 2 [((x’ >391“ _ (yz >BPM)coSZ¢ + 2BPM sin2<|>] a + g 8:13“ “()8)an — 3(xy2 >BPM)COS3¢ + (3BPM — BPM)Sin 3¢] + Okla-j} . (See Appendix D) (1-8) The x and y coordinates of the beam center with respect to the beam pipe are given by x and y respectively. The BPM electrodes are placed every 90 degrees around the circumference of the beam pipe at 0, 90, 180 and 270 degrees. Substituting these values for 0 into (1-8) gives 4 ' 2 ' 2 A(e.=0)EAR =42, {2a+ 81:“;th 8;”, 010(2),,le —B,M) estate--3..>+ot.al Altl : / A 9: at A' 9 = “16 SUbSCnva\ 24 4sinoc 2 ' 2 A(9=“)EAL=fiz—{2a‘ a i+ 8:12 “(BPM—BPM) ‘éSiZEa (BPM —3BPM)+O(;:T)}’ (1-10) 1r q 4sina_ 23in2a A(0 :2) EAT 23:7{20H a y- a2 (BPM -BPM) 4 ' 3 1 “381:3a (3BPM -BPM)+O(_a_4-)} ’ (1-11) and 31; q 4sina_ 23in20t A(G=—2_)EAB=41:2 {2a— a y— a2 (BPM_BPM) a4 +§Si:3“(s...-...)+0(-‘-l}- W The subscripts R, L, T, and B identify the right, left, top and bottom lobes respectively (Figure 1-1). It is easily shown that the charge in the bunch is given by 1:2 (beam size)4 (1:2;(143 +AL+AT+AB) to order a4 , (1'13) and that the centroid locations are given by an AR —-AL (beam size)3 -= t d , 1-14 x a28inct AR+AL oor er a3 ( ) _ at AT —AB to order (beam size)3 (1 15) = a . . " y Zsmct AT +AB a3 The last bit of information that can be extracted is the quadrupole moment, given by 2 . 4 a a AR +AL —AT —AB (beam srze) t d . 1-16 sin2ct AR +AL +AT +AB o or er a4 ( ) (x2 >BPM — (yz >BPM = In Appendix I measure of r 25 In Appendix D it is shown that (X’lm —(y’),,,, = (fl-(WNW -Y’- Since i and y are determined by (1-14) and (l-15), equation (1-16) is essentially a measure of (x2 > — . ME 2.1 lntrodu This err deems “h? BPM emitt'd numerical ch There is: lfthe techniq amplified gre problem and c 22 Emittance Eath electr COilltllitates am Chapter 2 MEASURING EMITTANCE WITH BEAM POSITION MONITORS 2.1 Introduction This chapter will first give a definition of the x and y rms emittances and briefly discuss why they are important. It will then move on to describe the theory behind the BPM emittance measurement. Ending the chapter is a valuable discussion of the numerical characteristics of this diagnostic. There is a strong tendency for this emittance measurement to be numerically unstable. If the technique is implemented improperly, the measurement errors in the BPM data are amplified greatly in the fitting process. The last part of this chapter addresses this problem and describes how it is avoided. 2.2 Emittance Each electron in a beam bunch is described by six coordinates: the three transverse coordinates and their associated momentum. Taken as a whole, the bunch describes a six dimensional volume. The x and y nns emittances are derived from the projections of this six dimensional volume onto the x and y phase spaces. The x phase space is two dimensional with one axis defined by the x position and the other by the x momentum. The definition of the y phase space is similar. In charged 26 {1331le 11:12 djtergenee. \\ plane. It is rei. where (i and '5 electron mass. By will essest. The same It’hr formulation of A numeric accelerator is 5 al'fmges (X: (3.x2 ~ Thefim three. 4'," B. s \ E (1 =3 , a t and / 27 particle beam dynamics, the momentum is replaced by the divergence[6]. The x divergence, written as x' , is the angle that the electron makes with the z axis in the x plane. It is related to the x momentum according to the equation dx dzdx v2 = v = —= ——= Px ym x Ymdt Ymdt dz me e x' = Bymcx' where B and y are the usual relativistic parameters, c is the speed of light and m is the electron mass. If the energy spread within each electron bunch is small, then the value of By will essentially be a constant within the beam bunch and x' will be equivalent to px. The same relationship exists between y' and py. Using the divergence facilitates the formulation of the beam dynamics as an optical, or geometrical, system. A numerical computation of the x phase space of the SPA beam as it exits the accelerator is shown in Figure 2-1. The superimposed ellipse is defined by the ensemble averages (x2 > , (xx') and (x’2 ). The equation for this ellipse can be written as 2 t '2— Bxx -(XXXX +yxx —1re . X The first three constants, or Twiss parameters, are given by and \' (”Hill I , . I l I it . '1’! . xi- ‘.-' 4.00 ‘r’ 3.00 -» 2.00 -. x' (mrad) -1.00 ~ -2.00 - 28 Simulated x Phase Space of SPA ‘ ll. J" Int- .3, EE'J r.’l I. I. -3.00 4» I - ' I 4.00 .L + l t l e a H 4.00 -3.00 -2.00 -l.00 0.00 1.00 2.00 3.00 4.00 x (mm) Figure 2-1: The x phase space of the SPA beam from simulation. The) half the l3 '4 - II I The this x en:- E‘ \ \‘ ltisthe area giten by m "I .a “£111ch and I" “here B? is t comm“ qu; change in the nonlinear Proc ml) eminanch “fees. 1 till he at a foo 29 They have the property that BxYx —a: =1' The rrns x emittance, ax , is given by a, EJ—(xx'>2 . (2-1) It is the area of ellipse divided by the number n. Equivalently, the rrns y emittance is given by a, ((y2>(Y">-(yy'>2 - (2-2) It can be shown that the normalized rrns emittances, defined as s .. 2 Bye. - (2-3) and am a Byey (2'4) where By is the relativistic parameter associated with the average beam energy, are conserved quantities in a linear focusing system with acceleration[6]. Therefore, any change in the value of the normalized x and y rms emittances are necessarily due to nonlinear processes in the beam transport. For this reason, knowledge of the normalized rrns emittances is a valuable diagnostic. Changes in their value, unforeseen or otherwise, can indicate misaligned focusing elements, nonlinear interactions and other undesirable effects. The normalized rrns emittance is also a valuable measure of beam quality. The beam will be at a focus in x when the value of ctx is zero. When this is true, I Substituting 1 _ in essence. th- “iil diverge it 23 Sleasurin Roger M; prohefll]. L: tithout refer: photoinjector The trans. Channel can t. the end of t} channeh b)" If M115. “near 30 In essence, the emittance indicates how tightly a beam can be focused and how quickly it will diverge from that focus. 2.3 Measuring the emittance Roger Miller et. al. first proposed using BPMs in a non-intercepting emittance probe[l2]. Later, it was demonstrated that this technique measures the rrns emittance without reference to the spatial distribution of the beam[19]. Because of the difficulties photoinjectors present for diagnostics[9], [10], this technique is ideal for SPA. The transverse motion of a single charged particle traveling down a linear focusing channel can be characterized by a set of linear equations. The final particle parameters, at the end of the channel, are related to the initial parameters, at the beginning of the channel, by the matrix equation (xf) "R“ Rl2 0 07m 0 0 X; __ R21 R22 xi [6] Yr 0 0 R33 R34 Yr . 0'” 0 0 R43 RMXYU L. The transfer matrix is determined by mapping the electric and magnetic fields of the focusing elements. A focusing channel that consists of quadrupole magnets and drifts will be linear. The section of beam line that is used to measure the emittance on SPA consists 0t -—_. r4 :7 a F," x Where the than rel em Jpn IN MI III and 31 consists of only these two elements. It is easily shown that (x2)f —f = (Rll)2i +2R11R12(XX'>i +(R12)2 (x'2>i ‘(R33)2, ‘2R33R34 <33"), ‘(R34 )2 (VIZ), [12], where the f subscript refers to the BPM location and the i subscript to the focusing channel entrance. Changing the transfer matrix m times, where m 2 6, and measuring (x2 > f — (y2 > f for each change, results in the matrix equation A: II a (2-5) where Ml treat]. PM 4““)(5 (R33)2 L "' [2R33R34 L " [(R34 )2 N I ~ 2 >11 III 9(2'6) _[ PK”) 0 > (W). ( > yt2i) “I III N \ and 32 5'1 111 t[. -'.]m. Solving for i , in the least squares sense, estimates the rrns beam parameters (x2)i , (x'z)i , (xx')i , (y’)i , (y'2>i and (yy'>i. In turn, we can estimate the x and y emittances at the start of the focusing channel using (2-1) and (2-2). 2.4 Stability of emittance measurement Because 5 in (2-5) is determined by measurement, there will be errors associated with it. These errors propagate to the estimate of it. How accurate this estimate will be depends upon the stability of the matrix equation. Consider the true value of i as existing at the bottom of a potential well. A determines the shape of that well. When the stability of the matrix equation is good, the well is deep with sheer walls and it is difficult for the errors in 5 to move the estimated value of i far from the true value of it. However, if the stability of the matrix equation is poor, the well will be very shallow and the errors in b will push the estimated value of it far from the true value of i . A matrix equation’s stability is inherent and cannot be improved using clever data processing techniques. However, stability is also relative. The stability demanded of the matrix equation depends upon how accurately b is measured and how precisely we need to lino“ i. the BPM me we could act enough to toi' The quest equations. so: is often enou this problem finding a st applicable 10 33 to know i . Because the emittance of the SPA beam is small, the accuracy demanded of the BPM measurements for typical implementations of Miller’s method was more than we could achieve. A realization of Miller’s technique was required that was stable enough to tolerate a BPM’s limited precision. The question of stability can arise in any diagnostic technique that involves linear equations, sometimes rendering a clever measurement approach useless. However, there is often enough flexibility in the way a given measurement can be implemented so that this problem is avoided. Miller’s technique is such a measurement. The approach for finding a stable implementation of Miller’s method that is outlined here may be applicable to other diagnostics. 2.5 Figure of merit for matrix equation stability In this section, a measure for the stability of a general matrix equation is derived. This metric will be used in the next section to compare different implementations of Miller’s emittance measurement. Consider the general matrix equation, ‘ — ‘ Ar'i = b , where A has m rows and n columns, it has dimension n and b has dimension m. Assume that m 2 n and A has rank n. The least squares solution for it is ( 1 z: :: :: AT is the pseudo-inverse[20] of A and is denoted by A’. >11 >11 -1 5'1 ll >11 5:1 - -1 i TA) (2-6) >11 ( TR) | To. met»; and the resul normal and 1 elements of i Th6 mat damp—1,11 ;, 3'11 11 34 To measure the stability of the matrix equation, a relationship between the errors in b and the resulting errors in it needs to be established. Assuming that the errors in b are normal and have value i o , an upper bound on the errors for the estimates of the elements of it is established. The matrix A can be factored into three matrices called the singular value decomposition of A [20]: ‘ A $6. (2-7) 011 O, is an m by m orthogonal matrix. Like A , E is an m by n matrix. Its first It entries along the main diagonal are A, , where the A, ’s are the eigenvalues of the matrix —. 1‘ ATA , and all other elements are zero. (:22 is an n by n orthogonal matrix whose >11 columns are the n orthonormal eigenvectors, vi , of AT Using (2-7), the pseudo-inverse of A can be written as ,6? >11 II 011 M11 Because they are orthogonal, the inverses of O, and O, are their transposes. E’ is the pseudo-inverse of E and is an n by m matrix with the first n entries along its main diagonal given by m and all other elements zero[20]. Writing Ii as The cut hare maenit % approximate 35 c‘ ‘ b = b0 + e, , where 50 is the ideal value of b and e, is an error vector, the error in it is given by e, = 6,i+6, a, (2-8) The exact form of 6,, is unknown. However, the elements of 6b are estimated to have magnitude 0, the error in the measurements that determine 5. Therefore, the approximate magnitude of e, is given by |é,| = ,/é, re, 5 x/mo'z = m/m and the approximate value of 6,, can be written as was , Ill éb where ii is some unit vector that is unknown. Substituting this into (2-8) gives (st/$6, M11 Ill 6, *Offi. Because O, is orthogonal, its transpose will only rotate ii into some other unit vector, 11' . Therefore, 0756, M11 I it ' . (2-9) III as Like ii, 11' is unknown. However, it is assumed that the measurement errors in b are random. Therefore, the elements of ii' , on average, have magnitude 1/ 75 . Recalling the definition of E’ and O, , (2-9) becomes “here \ multiplies: “here ) V.1'1'1111 1‘ II Should I ”are that it < ch00 Sem ”1 an 36 v12 v22 . . . v"2 iAmTz :9: III Q a _vIn v2n . . . vnn_ i 1 k m)»,; where vij is the jth element of the im eigenvector of IVA. Doing the matrix multiplication and adding in quadrature gives e . 50' A (2-10) where ex). is the error in the jth element of i . Since the eigenvectors V, are orthonormal, the maximum value of any given element is 1. Therefore, from (2-10), the maximum magnitude for any particular ex]. is o A. It is not unreasonable, then, to define a figure of merit (FOM) to measure the stability of the matrix equation, 1 V Amin . is the smallest eigenvalue of 3T; . FOM = (2-11) where Ami" It should be pointed out that the FOM as defined here is only a useful tool if one is aware that it does depend upon the units chosen for the vector i. For instance, if we choose mm and mrad for our length and angle units in Miller’s method, we are making >, oll -- 2.6 ms; couv EX}; the] 37 the choice that an error of :1 mm2 (in (x2)i and i) is as severe as an error of :t:1mrad2 (in (x’z)i and i) and as severe as anerror of i1 mmmrad (in (xx')i and i to i0.1 mm2 and i and i to i 0.1 mrad2 , then this choice of units is appropriate. However, if we wish to determine (x2)i and (yz)i to i0.l um2 and i and i to i0.1rad2, then choosing mm and mrad will cause the FOM to provide inaccurate information when comparing different implementations of Miller’s method. 2.6 Finding a stable implementation of Miller’s measurement This section will first present naive attempts at implementing Miller’s emittance measurement that fail. It will then move on to discuss near singular equations and coupling, the cornerstones of making Miller’s method stable. At the end, three numerical examples from SPA are presented and are compared using the figure of merit derived in the last section. 2. 6.1 Poor implementations of Miller ’3 emittance measurement Figure 2-2 shows a schematic of a very simple attempt to implement Miller’s measurement: several BPMs separated by drifis. The number of BPMs, m, is at least six. The linear transfer matrix for a drifi is 38 A .matu Eco m5? #:0805308 oocwEEo mo couficofioag How on: :83 mo unmaonom ”N-N 8:me lthrva Enema 88802 :oEmom Edam TEE T. til 3501 2711 39 wit 6. II Ot—‘OO ~O‘oo OOOF‘ COD-I'D- I— _ where d is the length of the drift. From (2-6), then, r 1 2d, cl? —1 -2d, —df 1 2d, d; —1 —2c12 —d§ X: _ 1 2dm dfn —1 —2dm —dfnd The second three columns are linearly dependent upon the first three columns and it is readily obvious that this A is singular and the matrix equation has no solution. Therefore, the emittance cannot be measured by BPMs separated by drifts. Figure 2-3 shows a schematic of a second configuration that often already exists in an accelerator beam line: a single quadrupole magnet followed by a drift and a BPM. The quadrupole magnet acts like a lens that focuses in one direction and defocuses in the other. Although a thick lens formula is more accurate, it is assumed that the effect of the quadrupole can be approximated by a thin lens. The transfer matrix for a thin lens that focuses in one direction and defocuses in the other is '1 o o o“ : -%1 O 0 R: t... 0 o 1 0’ o o %1 where f is the focal length of the quadrupole. The total transfer matrix of the drift/lens combination is given by 40 .Emm can and .8:me 2833:: .«o 9:63:00 0:: :83 mo oumaonom - .. . AIIII Sacco «2&va .8552 :oEmom 88m 283630 ”3 2am; mu [sing {2-6 results in 3.” ll 2.6.2 Singll/a Ending a Ln? 410 [ma] proc El \‘en Co r “figUl 41 p— 1-% d o o : = _—. —1f 1 o 0 R”‘=R"R'““= 0 0 ”Cyf d' 0 o y, 1 Using (2-6) and varying the focusing strength of the quadrupole m times, where m 2 6, -(1—%): 2d(1—%) c12 —(1+%.): _2d(1+%1) -d2_ (1%) 2.10%) d2 (1%) 441%) _,2 2 . . . . 2 . . 4‘) {—dJZ—(dl—(dJ—z -0 A“ 2d] A“ d ”A“! 2d ”A“ d - Because column three and column six are linearly dependent, this matrix is also singular. If the thick lens formula is used to describe the quadrupole magnet, A in the second example would not be singular. However, it would be close to singular and the matrix equation would be very unstable. What these two examples illustrate is that stable configurations of Miller’s measurement do not necessarily occur naturally. Typically, they must be searched out. 2. 6.2 Singular equations and strong coupling Finding a stable implementation of Miller’s emittance measurement is a somewhat informal process. Although the figure of merit, (2-11), will indicate whether or not a given configuration is good enough, it does not disclose how a stable implementation is to be found. That task requires some trial and error. There a first has 33: consider \\ Miller's to 3110“ trans R) R:; an. R3: 31’? zen 3’” 42 There are two aspects to consider when searching for a stable matrix equation. The first has already been discussed: avoid nearly singular matrix equations. To do this, first consider what control is available over the elements of the matrix A. For instance, in Miller’s technique assume that we can implement the measurement in such a way as to allow transfer matrices with the following four characteristics: in the first, the elements Rn, R33 and R3,, are zero, in the second, R”, R33 and R34 are zero, in the third, R“, Rl2 and R3, are zero and in the fourth, R11, Ru and R33 are zero. Substituting these into (26) gives q r[(Rrr)2]l 0 0 0 0 O o o [(R,,)’]2 o 0 o 3: Z Z O -[(R(:3) L 2 -.(R0 2‘ . (2-12) [11ml],[2R.,R..1.[(R.)2]5[(R..)]-[2R..R..5a.): _[(R11)2]6[2R11R12]6[(R12)2] [—(R33) 26] -[2R,,R,, -:(R34) The first four rows are perpendicular to each other. The settings for the last two rows are :5 6 .6 —I now easily chosen to avoid a singular matrix. The second aspect to be considered when searching for a stable matrix equation is the coupling of the desired parameters. Good coupling is when ASE is much larger than the error in the measurement of b. For the matrix equation to be sufficiently stable, each of the initial parameters, (x2), (x'2 > , (xx') , , and in at least one of the measurements. Consider the motion of an electron in the fields of a quadrupole magnet. As it passes through the magnetic field of the quadrupole, the strength of the field that the electron La IF. it; 43 sees depends upon the electron’s position in the magnet aperture. The resulting change in the electron’s trajectory will be strongly dependent upon its initial position in the quadrupole field and much less dependent upon its initial direction, or divergence. Therefore, the final value of (x2 ) — will depend very little upon the initial values of and but very much on the initial values of (x2) and . A quadrupole magnet will provide strong coupling between the initial values (x2) and , and the final value of (x2 > — . The transfer matrix for a drift of length d has Rn=Ru=d. R12 and R 34 in the total transfer matrix of the beam line determine the coupling of the initial values (x'z) and (y'2 ). Therefore, long drifts tend to amplify the coupling of the initial values of and to the final value of (x2 > — . 2. 6.3 Stable implementation of Miller ’s measurement Taking into consideration near singular matrices and coupling, an excellent implementation of Miller’s emittance measurement is that shown as a schematic in Figure 2-4: a triplet followed by a BPM. The triplet consists of three quadrupoles separated by roughly equal drifts. Having two quadrupoles ensures enough control over the transfer matrix elements to avoid a nearly singular matrix equation. The third quadrupole adds another degree of freedom to guarantee satisfactory coupling of the initial values of (x2) and to the final value of (x2)— . Sufficient coupling of the initial values of 8:88 838m 853 a 3 330:8 833 a .8 wfiuflmaoo on: :83 .8 £228:an ”arm 0.8me All Me Ilv Allan llv ALe IV 4 w J 1 a no No 8 1| :aoe o k f k F k .8882 838m 83m $0:me 282.895 kmwnu Zdlfium To dc examples They; and The quad. beam em “'11 UQS of and 45 (x'z) and to the final value of (x2)— is assured by making the drift lengths between the quadrupoles long enough. 2. 6.4 Numerical examples To demonstrate the effectiveness of the triplet configuration, three numerical examples using the parameters from SPA are presented and compared. The values for the drifts in Figure 2-4 are (11 = 83.1 mm, (12 = 326.75 mm, (13 = 425.2 mm and cl4 = 236.6 mm. The quadrupole magnets are electromagnetic and have an effective length of 86 mm. The beam energy is 8 MeV. From simulations of SPA with the code PARMELA[21], the values of the beam parameters at the end of the accelerator for a 3 nC beam are (x2) = 7.05 mm2, (xx') = —3.15 mm mrad , (x'z) = 152 mradz, = 050 mm2 , to o = i05 mmz. Six quadrupole settings will be used in each example. According to simulation, each setting transports the beam past the BPM location. The transfer matrices are calculated using the linear beam transport code Trace3D[22]. The first example is a redux of Figure 2-2 using only the last quadrupole in Figure 2-4. This time, however, the proper transfer matrix for the quadrupole magnet is used, not the thin lens approximation. The second example employs all three quadrupoles in Figure 2-4 with random field strengths. In the third example the matrix is made stable using the concepts discussed previously. In example one, three arbitrary values for the current in the third quadrupole are chosen. The signs of the three currents are then reversed to get to six settings. A typical result is _ 3.6529 1.3 725 0.1289 - 0.0260 — 0.0927 - 0.0828‘ 2.7403 1.1553 0.1218 — 0.1466 — 0.2275 — 0.0882 = 1.9742 0.9526 0.1 149 — 0.3720 - 0.3739 — 0.0940 A = 0.0260 0.0927 0.0828 — 3.6529 — 1.3725 — 0.1289 ' 0.1466 02275 0.0882 — 2.7403 — 1.1553 — 0.1218 0.3720 0.3739 0.0940 — 1.9742 - 0.9526 — 0.1 149_ I-.. 1“ CEJLMJ'. Tile exp and ObViOus COmPlEit 313m Oxj n Fort leagr QHC T.” 47 Calculating the eigenvectors and eigenvalues of AT}: and using (2-11) results in 1 4 - 3.05x10 . M- The expected errors in the estimated values for the beam parameters are, from (2-10), FOM = err(x,) = $190 mm2 , errm.) = :20 x 103 mm mrad , err(x,,) = :11 x 10" mrad2 , err , = $190 mm2 , (Y) err , =i2.0x103 mmmrad (yr) and err(y,,> = $1.1 x 104 mrad2 . Obviously, when compared to the actual values of the beam parameters, these errors are completely unacceptable. Also note that the magnitudes of the two largest errors are approximately 6 times the FOM. For the second example, six settings were chosen at random, using all three quads at least once. A typical result is P 0.0104 — 0.1505 0.5419 — 4.6088 — 8.3564 — 3.78791 0.0191 0.3555 1.6529 - 0.6651 — 1.3695 - 0.7049 7.5388 8.5015 2.3968 — 0.4586 15146 — 1.2506 05010 — 0.3159 0.4098 — 0.1028 — 1.4157 - 4.8723 ' 0.0550 0.2471 0.2776 — 3.3319 — 8.0093 — 4.8132 3.6529 8.7298 5.2157 — 0.0260 — 0.1450 - 0.2025 >11 II “f1 3: ll: 48 Again calculating the eigenvectors and eigenvalues of AT; , (2-11) yields FOM = 3.0. From (2-10), the expected errors in the parameter estimates are err = i071 mm2 , errm.> = 3:053 mm mrad , err and err ,, =:l:0.33 mradz. (y ) This is much better than the first example. However, the errors are still bigger than some of the beam parameters. Again, note that the largest expected error is approximately 0 times the FOM. In the third example, the six settings were carefully chosen to make the matrix stable. In this case, the matrix A is P 0.0000 0.0000 4.7779 — 0.0454 0.0000 0.0000 , 0.0454 0.0000 0.0000 0.0000 0.0000 — 4.7779 0.0178 0.0000 0.0000 — 8.9987 0.0000 0.0000 8.9987 0.0000 0.0000 — 0.0178 0.0000 0.0000 0.0003 0.0096 0.0887 — 4.3470 - 102809 — 6.0787 4.3470 10.2809 6.0787 0.0003 0.0096 0.0887 _ >11 ll b Calculating the eigenvectors and eigenvalues of AT; , (2-11) yields From 12- e e e 8: er and er Thfse CIT again. the In 111 meaSUIErr the ratio ( FOM for l 49 F OM = 025. From (2-10), the expected errors in the estimated parameters are x2 err< ) = $0.056 mm2 , cum.) = i0.070 mm mrad , err< > = i0.105 mrad2 , x12 err , = 350.056 mm2 , (y ) err , = £0070 mm mrad (yr ) and err ,, =i0.105 mradz. (y > These errors are very reasonable and much better than the previous two examples. Once again, the magnitudes of the two largest errors are approximately 0' times the FOM. In the examples, the FOM, together with the expected error in the BPM measurements, provides an accurate indicator of the maximum expected error. Therefore, the ratio of the FOMs is a good comparison of each implementation. Taking the ratio of FOM for examples one and three gives FOMr-zx.r s FOMEH — 1.22 x10 . The ratio for examples two and three gives FOMEXJ =120 FOMEL3 ° ° So, although the BPM measurements are equally accurate, the estimates of (x2 > , (x'2 > , 50 (xx') , , (y'z) and an — (y2 >BPM , with the BPM when the deflecting cavity is on and when it is off determines the rrns length of the beam bunch. The rrns length of the beam bunch is defined as the ensemble average (22). It will prove convenient to replace the longitudinal coordinate, z, with a phase angle, 41,. This 51 ‘ >223 matrix: : we :25: 53.5.3 ~35: A: :99: 232.495.? 3:: 53.9.3. 874: 0.2.42.4.22LC 28:71.2; 02:5 52 .855 Enos m map—«ohm .038 882.88 “mam 8 88.33: ”Tm onE $.60 882.80 5mm 1 3 88m 88m one: x a a 888m 58m 88m f / \ k < 538 88253 x mm 855 Enos .8 888 3 zoom acreage Ea fimaobm Bow 38:me .8 8an8% 08C. phase an; c3111}: T The freq; 3.2 Trait To 5:. relativism Calculalio The 1': PICSemed is a lime , 0f mOIlon 3'2" F18]. The fa is ShO“'11 i and 53 phase angle is referenced to the wavelength of the rf frequency of the fast deflecting cavity. The rms length can then be written as <¢:>=[-§§)2=[31‘5)2<22>. (3-1) C The frequency of the cavity is f and the speed of light is c. 3.2 Trajectory change of a single electron at fast deflector exit To start off the discussion, this section presents the change in trajectory of a single, relativistic electron as it travels through the fields of the fast deflector cavity. This calculation is to first order. The results of this section are essentially a summary of a more complete derivation presented in Appendix E. It begins by demonstrating that the dominant field in the cavity is a time varying magnetic dipole field. Then, using only this field, the simple equation of motion is solved in the appropriate coordinates. 3.2.1 Field components The fast deflector is a cylindrical cavity that operates in a TM“o mode. A schematic is shown in Figure 3-2. The ideal electric and magnetic fields are 132 = E0J1(k”r)cosecos(cot +¢) 9 2 B =wfiEoJKknrfiinOsinbt‘tl’) 1' 11 and //\ 54 .538 882.88 “mm.“ 8 otmEonom ”mrm PEEL A CD All other there x of the cat (3.) Where the Thfift‘forc “16 160g: The mini: kinellc Cnr apeIIUre O or 1.27 CIT 3'2'2 (Om Using 1 -n l/ 55 B6 = a) fiEOJKknrfiosO sin(o)t + 11)). 11 All other field components are zero. The constant kll is defined as 1(11 x11 3 where xu , equal to 3.8317, is the first zero of the first Bessel function and a is the radius of the cavity. The angular frequency, (1), is given by or = 27tf where the frequency, f, is 1300 MHz for our cavity. The relationship between the angular frequency and the geometrical properties of the cavity is 0) = knc. Therefore, the cavity radius is a—i‘iE—flg-OMrn _ co -21tf-' ° The length of the cavity, L, is independent of frequency and on SPA measures 14.48 cm. The maximum amplitude of the electric field, E0, is 24 MV/m, from measurement. The kinetic energy of the electrons as they enter the cavity will be approximately 8 MeV. The aperture of the cavity, the opening that the beam travels through, is one inch in diameter, or 1.27 cm in radius. 3.2.2 Conversion of field componena' to Cartesian coordinates Using the relationships f: xcose + ysin0 and 13- the clectr: E. B and B I SlflCC [he dfflct‘tor t“. El Bl and Bi. . 3'2'3 Equal ofthe r3110, 56 and 0: -xsin0 + ycost) , the electric and magnetic fields can be converted to Cartesian coordinates, giving E = EOJl(k“r)cosecos(wt + (1)) , Z Bx = 3(02 J2(k“r)E0 sin208in(o)t+¢) xnc and By = $E0[fi;ll(knr)— J;,_(k”r)cos2 0] sin(ort + (it). Since the beam is limited to the transverse region defined by the aperture of the fast deflector cavity, these expression are well approximated by Er; EEEO2 xcos(cot + (h) , (0x11 Bx E 2 4ac ony sin((ot + 111) and 2 5:281:73, sin(cot + (1)). (See Appendix E) (3'2) 11 3. 2.3 Equations of motion Of the three field components, By is dominant. In the aperture region, the magnitude ofthe ratio of B, to By is 11 W showing t show to] 8 MeV b alloxxingl 10 fir and “here 2 This eq % 11 mg and 57 (0X11 B, 3,02 onmaxymax xfirjm (3.8317)2(1.27cm)2 s = , = , =0.03, lByl ma E 2a 4(14.0cm) 2xnc2 0 showing that Bx can be ignored to first order. The electric field along the axis can be shown to produce a relative change in an electron’s energy of less than four percent for an 8 MeV beam. (See Appendix E) In most cases it will be much smaller than this, allowing the electric field to be ignored as well. To first order, then, the only equation of motion that is of consequence is " - eZ—(BE-E sin((ot + 111) m ZXHCZ 0 ° Using the relationships and t = 133’ (33) where 2 equal to zero is defined as the entrance to the fast deflector cavity, gives x"- e coa E sin[9-z-+¢) —BYmc 2x11C2 0 BC . This equation can easily be integrated to give the divergence and position of the electron as it moves through the fast deflector cavity: 6 3 (DZ X'(Z) = —-'Y;EX172_EO COS[B: + 4)) + Cl (3'4) and “here and The taluc: The chap.é can be for and It Ml Quit}. fig 10 be mm the bunch AS m: e a [3c , (oz X(Z) = —RZXITEo—QTSIH[E+¢) +CIZ+CZ, (3-5) where ' e a C, = Xi +7m—m2—EO COS¢ (3-6) and + e a E 5° ' 3 7) =x. — -—— , - C2 I szxllcz 0 (0 81nd) ( The values of x and x' at the entrance to the fast deflector are xi and x; , respectively. The change in the electron’s trajectory caused by the action of the fast deflector cavity can be found by setting 2 equal to L, the length of the cavity, in (3-4) and (3-5), resulting in e a Bc , (9L XL =X(L)=——YI;WEo-Eo_sm(fig+¢)+C1L+c2 (3-8) and e a coL XL = X'(L) = —-y;n—'2—x;:2—Eo COS(BC_+¢] + Cl . (3-9) It will prove useful to rewrite the phase angle, (11, as 41 = «l. + Al + «1.. The angle (110 + A111 is defined as the phase of the beam bunch center with respect to the cavit)l fields. The angle Ad) is included for calibration purposes. Its magnitude is defined to be much less than one. The angle (11, is defined as the phase of a particular electron in the bunch with respect to 410 + All) . As mentioned in Chapter 1, the beam bunches on SPA are 6 mm FWHM in length or less. 11.: 1 will ht “18801; [I Suhsrltulir aPPIOXims and 3'3 ”tag", After fix plpe 10 [he ] Chime} 50 U 59 less. This is a time duration of 20 ps. At the frequency 1300MHz, then, the magnitude of 02 will be l¢.| S (10 ps)(2rrf) = 0.082 . Therefore, IA¢ + 02' << 1. Substituting (3'6) and (3'7) into (3'3) and (3-9), this condition makes the following approximation possible: xL = x +fo +-Ye;XEé-;Eo%g{sin¢o +%cos¢o —sir{%:1+¢0) +(A¢+¢z)|:cos¢o -%::sin¢0 —cos(%+¢0]]}, (3-10) and x' 2x: +-— e a 213,,{c05111 —cos(——+¢0) L — szx xcll 0 , (0L , . + (A4) + ¢Z)[srn(B(-:- + 410] — 81ml)0 J}. (See Appendix B) (3-1 1) 3.3 Measuring the rms length of the electron beam bunches After exiting the fast deflector, the electron beam will travel down a section of beam pipe to the location of the BPM. It will be assumed that this region is a linear focusing channel so that a linear transfer matrix can be assigned, [sing R eiectronh 1011-141; in Figure 3.3.1 Fas. “hen Therefore the BPM xi! ”11 ll Using It , and equations (3-10) and (3-11), it can be shown that the rms length of the electron beam bunches can be determined by measuring the values of i and y , according to (1-14) and (1-15), and (x2>BPM — BPM , according to equation (1-16), with the BPM in Figure 3-1 when the fast deflector is on and when it is off. PR1] R12 0 R21 R22 0 0 R33 _ 0 0 R43 3. 3.1 Fast deflector off When the fast deflector cavity is turned ofi‘, it is nothing more than a section of drift. Therefore, the total transfer matrix between the entrance to the cavity and the location of the BPM is ”11 -1 ”It -1 Therefore, the final parameters of a single electron at the location of the BPM will be FRI] R12 = R21 R22 0 0 11,, _ 0 0 R43 R11 R12 + L1(11 _ R21 R22 +1"‘1121 ' 0 0 L 0 0 60 0T1L0 0010 R3400] R,,__000 0 0 0 0 R33 R34 +LR33 . R43 R44 + LR34, --t-'oo and The BM locailglx and 61 xf pR” Rl2 -l-LRll 0 0 7x, x; R2, R22 + LR2| 0 0 x; Yr _ O 0 R33 R34 + LR33 Yr . Yi case, _ 0 0 R43 R44 + LR34AY1' Doing the matrix multiplication yields (x,)mfi = Rnxi +(R12 + LR,,)x; (3-12) and (y,)mflr = R3,)», +(R,3 + LR,,)y;. (3-13) The BPM in Figure 3-1 will be used to measure x, 7 and (x2 >am — (y2 >BPM at the BPM location. That is, (Etienne = «sheer-hm, (3-14) (Valera.r = (00.0%),”, (3-15) and , (txiiaai... -<(y%)....>.... = (tuna-(tyne...) +002)... —(rr)i..er- (346) 3. 3.2 Fast deflector on When the fast deflector cavity is on, the values of x, y and (x2 )3,“ " (y2>3p~1 will change. To calculate that change, start by noticing that, according to the approximate equations of motion, the cavity fields will have no effect in the y plane of motion. The fast deflector is still a drift of length L. Therefore, the results for the y center of the beam GI 13 Therefore in the the 10*:th Making 11 62 are identical to those for the first case, (3%)“)0“ = R33Yi +(R33 + LR34 )Yi Ol‘ (Yr)FD0n =(Yr)FDOff- (3-17) Therefore, the BPM will measure (mm, = (7.)“,0... (3-18) In the x plane, we must use equations (3-10) and (3-11). The values of x and x' at the location of the BPM are given by (xi) _ [R11 R12 ](XL] Xi R21 R22 xi . Doing the matrix multiplication yields ' e a BC , c0L (xf)FDOn = Rllxi +(R12 +LRll)xi +fo—“EE'E0{R11 '0:[Sm¢o +Ecos¢o _ sin(%:; + 410)] + R,2[cos¢0 - cos(-(E%- + ¢0)] +(A¢1 + ¢z){R11 %[cos0 _—(;%sin¢o —cos(%+¢o]]+ R,2[sin(%+¢o) —sin¢0]}}. (3—19) Making the definitions ad nmphhesl (x, [Sing first; (x, I l 0 meleftilrel Tofinr 13.17) and R [% j ' 320 + 12 srn Bc+¢10 —sm(j)0 (- ) and __e_ a E RB: -¢+% ¢ (93.4,) 32—m2Xllc2 0 ”(0 srn 0 BCcos 0 srn BC 0 +R,2[cos¢10 —cos(%cli+¢0)]}, (3-21) simplifies (3-19) to (xf)FDOn = Rnxi +(R12 + LR”)xi' +a,(A¢ +¢z)+a2. Using equation (3-12) this becomes x = xf +al A111+1hz +a . (3-22) ( f)n)on ( )FDOff ( ) 2 Therefore, the BPM will measure (XIX-‘00“ = <(Xf)mon>BPM = <(xf)n)off>8pM +<31A¢>Bm +BPM +3pM- Since 412 is proportional to z, <¢Z>BPM = 0' Therefore, (if)FDOn = (2,)mofi + a,A¢ + a,. (3-23) To find (x2 >am — (y2 )3?” at the BPM location with the fast deflector on, first square (3-1 7) and (3-22) then subtract the results to obtain {Sing (3.] N0“; beCar 64 (x2)... —(yi)...,. =02)... ”termite+tl+2[(x.)....]a. +a,2(riq>2 +2A¢¢z +¢§)+2a,(A¢ +¢,)a, +a§ —(y§)mm. Taking the BPM average of this expression yields <(xiimonirm ‘<(Yi)mo.>,m = <(xiirnoe>,,m ‘<(Yi)rnoe>anr + 2a,A¢<(xf)FD0fi>BPM + 2al <(xf)mofi¢z>8m + 2a2 <(Xr)mofi>3m +312A¢2 +2afA¢<¢z>BPM +af<¢i>8m +23132A¢+23132<¢Z>BPM +ag. Using (3-14), (3-15) and (3-16), and realizing that <(xf)morr¢z> = 0 gives (00%).... -<(Y?)m.>,m = (Wiener-ti -<(y%)reer>+(ir):pea -('y‘r):ear +2a,A¢(r,)mm +2a,(r,)mfi +afA¢2 +af<¢§)m +2ala2A¢ +a§, <(x§)FDOn>BpM _ <(yf)m0n>BpM = <(xf)roorr> _<(y§)rporr> +[(if)m0ff +alA¢+32r "(yfx'non +af<¢i>BPM° Using (3-18) and (3-23), this becomes <(xi)FDOn>BpM _ <(yi)FDOn>BPM = <(xf. )roorr> - <(yi)morr> _ 2 _ 2 +(xf)FDOn _(Yf)1=n0n + a? <¢i>BPM ' NOW, because 11), is a longitudinal coordinate and because the longitudinal origin defined in the ensemble average, equation (1-1), is the same as that defined in the BPM average, equation Therefore- 3-3.3 Men [Sing 13°34), 11-;- .\l and M , Sui‘tractinrt M , harm, "sf. Rita” that bUHChes. 65 equation (1-2) , we have 0:)... = <¢i> - Therefore <(xi)m0n>3m - <(yi)r00n >BPM = <(xi )roorr> — <(yi )morr> 3.3.3 Measuring bunch length Using the six measured quantities given in (3-14), (3-15), (3-16), (3-18), (3-23) and (3-24), we can define the following quantities: _. 2 2 _ 2 _ 2 MFDO“ = «x1 )roorr >BpM _ <(yf )rnorr >BPM - (Xf)roorr + (”Loon (3'25) and Mae. 2 <(xi).,,.,,,>m —<(y%),.,o,,>m —(ir):,,o,, +(rr):,,o,,. (3-26) Subtracting these two expressions yields MFDOn _MFDOff = ai<¢i> Therefore ®9=Mmm;Mmm- can 1 Recall that, from (3-1), (412) is equivalent to the rrns length of the electron beam 2 bunches. 3.401111 10c. This is .j shitting '. “he: center 01 _ mum} B." ”13111:: HT and 1ilefeltlre. 3'5 [still]; The re. can be 13111 “Mmm BPM H0 66 3.4 Calibration of measurement To calibrate this measurement, the value of al , defined in (3-20), must be determined. This is done easily by measuring the position of the beam in the BPM aperture while shifting the phase of the fast deflector cavity. When measuring the bunch length, the phase of the cavity fields is set so that the center of the beam is very near the center of the BPM. By shifting this phase slightly, the value of Ad) is changed, steering the x coordinate of the beam according to (3 -23): (alum!) = (EJFDOE +aIA¢ +a2. By making measurements of x for two values of A11) we get a, = (2,)mofi + a,Atll + a, (3-28) and x, = (20mm +a,A¢, +a,. (3-29) Therefore, by measuring x, , i2 and A11)l -— A02 , we have x1"‘xz a =———. l A¢l—A¢2 (3-30) 3.5 Estimate of measurement resolution The resolution of this measurement depends upon several factors: how much power can be put into the fast deflector cavity before it breaks down, the accuracy of the BPM and the nature of the transfer matrix between the fast deflector and the location of the BPM. However, by making some reasonable assumptions, it is possible to obtain an estimate of the technique’s resolution. 67 Assume that the region between the fast deflector cavity and the BPM is nothing more than a drift. Therefore, and where d is the length of the drift. From (3-20), then, e a BC 00L , S(00L ] a1 - 7m 2xnc2 E°{m [cosdl0 — BC smd)0 —co BC +d)0 :I . wL . + d[sm(Ec- + 00) — 81nd,,” (3-31) When measuring the beam bunch length, the phase of the fast deflector cavity fields is set so that the beam is nearly centered in the BPM aperture. This condition is satisfied when the y magnetic field given by (3-2) is zero when the center of the beam bunch arrives at the center of the cavity. Using (3-3), (3-2) can be rewritten as (03 , (DZ By = 38702-130 Sln(T3; + (1)0) where Ad) and d)z have been set to zero. At the center of the cavity, N II NH" Therefore, By is zero when _ 211:. (ho—-208 Substituting this into (3-31) gives e a a =— ' ym2xuc2 0 e a e a a =—— ' ym2xuc2° y =16.63. kinetic energy of 8 MeV yields ti m _ 68 “S"‘izli—c XE: 2“; As mentioned at the start of this chapter, the maximum value of E0 is 24 MV/m. A a1 = 0.051 x (0.037 meters+ 2.0 x d) . FWHM = 2.35% . ED-L- sin(— [3c in time yields a compression from 20 ps to less than 1 ps. 31:) 20c _ 00L coL T3?“ 20c Looking up the other constants and substituting them into (3-32) gives relationship between the FWHM and the rrns length of the beam bunch is ——li (3-32) (3-33) SPA is capable of compressing the electron beam bunches from 6 mm in length to less than 0.3 mm in length. These are FWHM measurements. Expressing these distances The longitudinal distribution of the beam bunches is unknown. However, for the sake of this estimate, and for simplicity, we will assume that it is Gaussian. Therefore, the 69 Using (3-1) this becomes ((1):) = (L22 X 10-5) X [FWHM (in picoseconds)]2 . (3-34) Table 3-1 shows the estimated value of af using (3-33) and (3-34) for various 2 beam pulse lengths versus the length of the drift after the fast deflector cavity. It is expected that the BPM will have an accuracy of i 05 m2. Therefore, with a drift length of two meters, a one picosecond resolution is feasible. 3.6 Efl'ect of BPM rotated with respect to fast deflector cavity As a final note it should be mentioned that it is not always easy to align the BPM and fast deflector. Therefore, the BPM will often be rotated slightly with respect to the x and y axes defined by the cavity fields. As will be shown, as long as the angle of rotation is small, this is not a significant effect. 3. 6.] Pulse length measurement If the BPM is rotated as shown in Figure 3-3, then a point in the BPM frame is related to a point in the fast deflector frame by xm,M mm = xcosor + y sinor (3-35) and yBPM Fm, = —xsinot + ycosor. (3-36) When the BPM is not rotated with respect to the fast deflector, it was previously shown in equation (3-27) that the rms pulse length squared is given by 70 Table 3-1: Value of af ((1):) vs. drift length, d, and the F WHM pulse length of the beam. FWHM of Beam Pulse (in picoseconds) d (in meters) 20 10 l 0.1 0.5 13.65 mm2 3.41 mm2 0.0341 mm2 0.000341 mm2 1.0 52.67 mm2 13.17 mm2 0.1317 mm2 0.001317 mm2 1.5 117.1 mm2 29.28 mm? 0.2928 mm2 0.002928 mm2 2.0 206.9 mrnj2 51.73 mm2 0.5173 mm: 0.005173 mmf 71 Figure 3-3: BPM rotated with respect to the x and y axes defined by the fast deflector fields. 72 _ MFDOn "Mr‘norr <¢:>- a]. where MFDOfr and MFDO" are defined in (3-25) and (3-26) respectively. When the BPM is rotated, it is easily shown using (3-3 5) and (3-36) that this equation is modified to < 2>_ MFDOn—MFDOff z af(cosZOL—sin2 or) The definitions of Mmopf and MFDOn do not change. Therefore, small rotations will have no significant effect. 3. 6.2 Calibration The calibration with the rotated BPM proceeds just as before. However, instead of just measuring the x position of the beam when the phase of the cavity fields is shifted, as in (3-28) and (3-29), the y position must also be measured. Using (3-35) and (3-36), this results in the four measurements it, = (if)FDOflr +(a,Atlrl + a,)cosot, (337) 'y‘, = 6,)an +(a,A¢, +a,)sinot, (3-38) x, = (if)FDOPf +(a,A¢r2 +a,)cosot (3-39) and y, = (mumr +(a,A¢, +a,)eoso. (3-40) Keeping track of the phase shift Ad)I — Ad)2 , (3-37), (3-38), (3-39) and (3-40) yield X]— (A11)! - 22 Ad)2 )cosa 73 Chapter 4 CALIBRATING A BEAM POSITION MONITOR 4.1 Introduction In general, a real BPM will have flaws in its construction. The electrodes will not be identical and the actual image charge distribution will be perturbed from its ideal. For these reasons, each BPM needs to be calibrated to understand its response and to demonstrate that we can measure the desired beam quantities with accuracy. To calibrate a BPM, a thin wire is placed inside its aperture. A current signal on the wire simulates a relativistic, pencil beam[23]. Since the position of this wire can be controlled very accurately, the response of the BPM versus wire/beam position can be mapped. From this map, accurate calibrations of the BPM are established. 4.2 Simulating a relativistic beam A schematic of the calibration apparatus is shown in Figure 4-1. A thin wire antenna is threaded down the axis of the BPM. Short sections of beam pipe are attached to either end of the BPM to maintain the proper boundary conditions. The wire is attached at one end to the center conductor of a coaxial cable and at the other is soldered to a ball bearing. The ball bearing is held in place by a magnet on the base of the apparatus, stretching the wire taut. The position of the wire in the x, y plane is determined by two 74 75 Coaxial cable -—"> RF Signal 8’ T x Wire attached to a center conductor r J ’ BPM W W I Short sections of beam pipe -"" Magnet l/' Stepper Motors Figure 4-1: Schematic of pulsed wire apparatus for calibrating BPM. 76 two stepper motors, one on each axis, controlled by a MacintoshTM computer running LabView© from National Instruments”. To simulate a highly relativistic beam, an rf sine wave signal is generated on the wire. 4.3 Mapping the BPM When mapping a BPM, the center of its aperture is found first. Moving the wire along the x axis in the plus and minus directions until it just makes electrical contact with the BPM wall locates the x center of the BPM. Likewise, the y center can be found. Once the wire is positioned in the aperture center, the stepping motors are zeroed and the response of each of the four electrodes is measured with the rf signal on versus wire position within the BPM aperture. Typical maps for the electrodes are shown in Figures 4-2 and 4-3. These show the amplitude of the signal induced in the BPM electrodes versus the position of the wire. 4.4 Fitting the map data Once the map data has been taken, it can be used to find a calibration for the BPM. By fitting the proper equations to the map data, calibrations for measuring the position of the beam center and for measuring the quadrupole moment, (x2 >BPM — (y2 >an , are found. 77 -10.0 a) Right electrode E a E x (m) 10.0 b) Left electrode Figure 4-2: Maps of the a) right (0 = 0”) and b) left (0 = 180”) electrodes of a BPM. 78 flectrode Signal (mV) a) Top electrode . ."l\ I' I' Hum, 1. .‘ \“unr‘t‘uc‘g. \\ H . 0‘ 0“.‘|““‘uu. ‘ Electrode Signal (mV) b) Bottom electrode Figure 4—3: Maps of the a) top (0 = 90") and b) bottom (0 = 270“ ) electrodes of a BPM. 79 4.4.1 Centroid calibration To calibrate the BPM to measure the beam center, the proper equation must be fit to the map data. Na’r’vely, one might use equations like (1-14) and (1-15). However, this is unwise. These equations assume an ideal BPM, but as was mentioned at the start of this chapter, a real BPM will be flawed. The four electrodes will have slightly different angular widths and each will have a slightly different capacitance, causing each to couple to the beam differently. It is simple to derive equations similar to (1-14) and (1-15) that take into account the differences between the BPM electrodes. When this is done and the results are used to fit the BPM map data the results are quite good. However, even better results are obtained if the following equations are used: x = x0 +s,,Rx +sx,R: +Sxy,RxR: (4-1) and y = y0 + SyRy + Sy,R: + Syx, RYR: (4-2) where x0, Sx , Sx, , Sxy, , yo, Sy , Sy, and Syx, are all fitted constants. The values of RK and Ry are defined as AR RX 5 20Log '11— (4-3) L and Ar Ry E 20L0g ? . (4-4) B This is a strange set of equations and it is not at all obvious why they should be 80 preferred. Their origin comes from the electronics used to process the BPM signals. In larger machines there are often several hundred BPMs being monitored at all times. In these situations it proves to be advantageous to do as much processing of the BPM signals with analog electronics as possible before they are sent to the control system. There are different schemes for accomplishing this task[24] and one of these naturally measures the quantities in (4-3) and (4-4)[25], [26]. The expressions in (4-1) and (4-2) were developed to take advantage of this fact and, as it turns out, give very good results for the beam position[24], [27]. Fitting (4-1) and (4-2) to the BPM map data results in the following values for the constants: x0 = 0.122 mm, Sx = 0.374 mm, 8‘, = —0.000072 mm, Sxy2 = 0.00023 mm, yo = —0.034 mm, S3' = 0.373 mm, Sy, = -0.000070 mm and SW, = 0.00022 mm. Figures 4-4, 4-5 and 4-6 show how effective this fit is. Figure 4-4a shows a plot of Rx versus the x position of the wire. Figure 4-4b shows the same plot but with the x position 81 RK vs. Actual x Position of Wire -100 -s.0 -o.0 -4.0 ...0.. 00 2.0 4.0 6.0 8.0 1<.0 R, vs. x Position of Wire From Fit mn Ir Iv l 1 20.0 i l I l0.0 + o“... .100 -8.0 45.0 40 ..fi).. 0 2.0 4.0 6.0 8.0 it .0 ' o b) Figure 4-4: a) R, versus actual x position of wire, b) Rx versus x position of wire as calculated by fitted equation. 82 Ry vs. Actual y Position of Wire vv-v l 0 O moi .... l 0" 10.0 . .. ML fl. - o 0 31' e; fie i i . i —4r + —— —-——+—————— -100 -8.0 -6.0 -4.0 . .00. 0,0 2.0 4.0 6.0 3.0 l( 0 . . -10.0 1 .g... i O -200 .1 . O 30.0 y (m) a) Ry vs. y Position of Wire From Fit OE ‘ ‘fi t ——*—*—‘-— -————' -1 1.0 -8.0 -6 0 -4 0 1c .0 2:: 1b 5: . o r—-———r—— — i y (mm) M Figure 4-5: a) Ryversus actual y position of wire, b) Ry versus y position of wire as calculated by fitted equation. 83 Actual x Position — Computed x Position of Wire vs. Radial Position of Wire 0.4 O 0.3 1- O. 0.2 » 0.1 » i; 00 «0 co. -0.2 , 0.0 ~ Computed x [111111) -0.1 At 111.11 x -0.3 — -o.4 0.0 1.0 2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0 10.0 Radius (mm) 3) Actual y Position — Computed y Position of Wire vs. Radial Position of Wire ltlunl 1‘ e Computed _1‘ (mm) -0.3 -0.4 0.0 1.0 2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0 10.0 Radius (mm) b) Figure 4-6: a) Difference between actual x position of wire and that calculated from the fitted equation versus radial position of the wire. b) Difference between actual y position of wire and that calculated from the fitted equation versus the radial position of the wire. 0110111.! 101 lilt‘ Values resolut: 4.4.: Q T0 igill 5’ the be... betweer be deri and i “here It a | 3 at 5.,a 84 calculated from (4-1) using the fitted constants. Figure 4-5 is the same as Figure 4-4, but for the y direction. Figure 4-6 shows the difference between the calculated and actual values of x and y versus the radial position of the wire, demonstrating sub-millimeter resolution. 4. 4.2 Quadrupole calibration To calibrate the BPM to measure the quadrupole moment, (x2>BPM -epn = (X’i-(YWY’ -7’ = X’ - 2’ where x and y are the positions of the wire. Second, the current signal on the wire is not nearly as intense as an actual beam. The BPM maps in Figures 4-2 and 4-3 show that the amplitude of the signals from the BPM electrodes peak at a little less than 6 mV. The signal induced by our electron beam will easily be 20 to 100 times greater than this. Based on the calibration done in the last section, we can expect to measure the quadrupole moment to i 0.6 mm2 or better. However, when measuring the emittance, we need to determine (x2 > — by subtracting 22 — yz away from the quadrupole moment. How accurately this can be done is hard to judge with the pulsed wire measl uegc Tt pnnci scherr i'OCt'lill Stiperr also k dismb dUC to Where Weigh. 89 measurement because (x2 > — is zero and because the signal is much less than what we get with an electron beam. To simulate a diffirse beam where (x2>— is not zero, we can employ the principle of superposition. In Figure 4-8 a square grid is superimposed upon the schematic of a BPM. Using the apparatus in Figure 4-1, the wire is moved to each grid location and the signals from the BPM electrodes are measured. The principle of superposition tells us that the sum of the signals recorded for a particular electrode is the signal one would get from that electrode if all the pencil beams were present concurrently. By manipulating the size and shape of the grid, the value of (x2 > — is changed. By shifting its position, different values for R and y result. In addition to changing the size and shape of the grid in Figure 4—8, (x2 > — can also be modified by assigning a weighting value based upon some superimposed distribution function to each point in the grid. For example, the signal on the right lobe due to the diffuse beam that is represented by all the wire positions would be AR = ZciARi where AR, is the signal on the right electrode for the wire at the ith position and ci is a weighting value. The value of ci is determined by the distribution ftmction one chooses to overlay on the grid of points. Left ‘. Figure PUiSe-d Left Lobe 90 Top Lobe Bottom Lobe Right Lobe x Figure 4-8: Schematic showing grid points for simulation of diffuse beam with a single pulsed wire. 4.5.1 I T0 for art is sim; Houel COHIr'o arbitra in Fig ment 9l 4. 5.1 Interpolation versus measurement To simulate diffuse beams, the response of the BPM electrodes must be determined for arbitrary wire positions. With the apparatus in Figure 4-1 this is quite easy. The wire is simply moved to the desired location and the response of the electrodes is measured. However, this is also very time consuming, even though the entire process is computer controlled. A much faster method is to predict the response of the BPM electrodes at arbitrary wire positions by interpolating between the grid points in the BPM maps shown in Figures 4-2 and 4-3. To show that this is valid, an experiment was done to compare the two methods. In Figure 4-9, two sets of data are shown. Each point in the two plots represents a single, simulated, diffuse beam. Each beam has for its center x = 0 and 'y' = 0. The value of (x2)— is different for each beam and is calculated from the known wire positions. The grid for each beam consists of 225 wire positions. A Gaussian distribution is superimposed on each grid. In Figure 4-9a the response of the BPM for each wire position is measured using the apparatus in Figure 4-1. In Figure 4-9b the response of the BPM for each wire position is predict by interpolating between the points of the grid of the BPM maps. (It should be noted that the BPM used for this experiment, although of the same type, was not the same one whose maps are shown in Figures 4-2 and 4-3.) Because all the beam centers are at zero, (4-6) says that plotting the value of (x2 > — (y2 > versus the value of Q, from (4-5), should be a straight line. As can be seen from the fitted lines in Figures 19a and 19b this is true. Using the fitted line, the Figuh 115mg eleclh 92 vs. Q, Data From Pulsed Wire Apparatus A {D 2.0 , 0: i r . 7‘ 9.8L E -010 -0.08 -0.06 -0.04 -002 2 O0. 0. )8 i; -4.0 .. i’ -6.0 _. -8.0 a 19.9 Q (mm’) a) Slope = 81.7 i 0.21, Intercept = -2.l65 :1: 0.0082 mm2 vs. Q, Data From Interpolation 5.- i 4.0 ,L l .2 2.0 1 E: l v _ 3. - as 1 . °’ -0 06 oho 0.08 0 10 Q (m’) b) Slope = 82.02 i 0.075 ,Intercept = —2.212 i 0.0028 mm2 Figure 4—9: a) Plot of (x2 > — versus Q for a number of simulated beams (i = y = 0) using the apparatus in Figure 4-1. b) Identical to a) except that the responses of the BPM electrodes for the individual grid points are interpolated from BPM maps. predh ofdat metht largel aPPJT 10510 4112 aCCUrz arbitr; \Vner hon, Cakul iSthp “1105, OUlWa 93 predicted values of (x2 > - match the actual values to within i 0.1 mm2 for both sets of data. The slope of the line in Figure 4-9a is 81.7 $021 and its intercept is —2.165i0.0082 mmz. In Figure 4-9b the line has slope 8202:0075 and intercept — 2.212 i 0.0028 mmz. The properties of the two lines are very close, indicating the two methods, although not identical, produce very similar results. These discrepancies can largely be attributed to errors in the program that controlled the wire position in the apparatus of Figure 4—1. This error was later corrected, but access to the equipment was lost before this experiment could be repeated. 4. 5.2 Check of BPM accuracy for measuring (x2 > — As a check to verify that (x2>-, and the beam center, can be measured accurately with a BPM, several simulated, diffuse beams were created. Ten of these, arbitrarily chosen, are shown in Table 4-1. Each beam consists of approximately 121 wire positions. The table shows the actual values of i, y and (x2) —— , as calculated from the known wire positions that make up the simulated beam, and the values as calculated from the signals from the BPM electrodes. The BPM used for this experiment is the one that was used to measure the emittance in the next Chapter and is the BPM whose calibration constants are shown in this chapter. Figure 4-10 is created by taking a single, simulated beam and moving its center radial outward from the BPM’s center. The value of (x2 > — (yz) is held constant and 121 wire Table 4-1: Table comparing the values of x, y and (x2 > — as measured by a BPM to their actual values for several simulated, diffuse beams. Actual x x Measured Actual y 7 Measured Actual (x2 ) .. (yz) (mm) by BP M (m) by BPM (x2)- (yz) Measured by (mm) (mm) (nine) BPM (mm’) 0.00 0.05 0.00 0.03 —3.74 —3.78 —l.9l —l.87 —1.29 —1.24 0.75 0.75 2.52 2.60 1.63 1.64 2.23 2.04 0.54 0.60 —3.86 -3.89 —1.27 —0.87 0.14 0.19 —0.99 —0.97 —1.31 —1.37 0.45 0.50 —0.23 -0.20 1.25 1.20 -0.29 —0.25 1.47 1.48 3 .00 3.09 —0.34 0.28 —O.37 —0.37 —12.5 —12.7 1.83 1.97 —0.81 —0.79 6.04 5.83 0.25 0.29 0.05 0.08 —O.94 —O.95 position: the actu: expected Altht beams in if 'he cor BPM ape; these Cm Tilt’leitlrc hate all 31 4.6 C Once L'Slng Calibrale 8 Wire is a sir comlntlum . 1101 eqUil‘air Change depe into (11163110,, An ideal . 95 positions were used to create each beam. Figure 4-10 is a plot of the difference between the actual value of (x2) — and that calculated from the BPM signals. It shows the expected decrease in accuracy as the radius increases. Although only a few examples are shown here, numerous simulation of these diffuse beams indicate that the BPM can measure the value of (x2 > — to i 0.2 mm2 reliably, if the conditions are right. That means the beam must be stable, be well centered in the BPM aperture and the data acquisition system must have sufficient accuracy. Typically these conditions are not met with SPA, especially the beam stability requirement. Therefore, when making error estimates, it was generally assumed that the BPM would have an accuracy of i 0.5 mm2 when measuring (x2 > — . 4.6 Concerns with calibration method Using a pulsed wire apparatus like that described here is a very common way to calibrate BPMs. However, there are some concerns with its efficacy. The rf signal on the wire is a single frequency sine wave. Our electron beam, on the other hand, consists of a continuum of frequencies. Obviously, then, there is a possibility that the two signals are not equivalent. In fact, it is not at all uncommon for the electrical center of the BPM to change depending upon the frequency of the sine wave used to calibrate it[28]. This calls into question the accuracy of the pulsed wire calibration. An ideal calibration scheme would use the electron beam that the BPM is intended to monitor instead of the pulsed wire. At the moment, it is not clear how this would be done and in any case, as will be shown in Chapter 5, the SPA electron beam is currently too expt mic! 96 unstable for the task. Hopefully, future work will better this stability, allowing for clever experiments to calibrate BPMs with the electron beam and eliminate any ambiguity that might exist from the pulsed wire calibration. ~11 twirl liiflll".1|il"i iii 1 . ir‘tH' r» 11 I 97 Difference between Actual - and Measured vs. Radial Position of Beam, From Computer Simulated Data 0.45 0.40 i O. 0.35 h 0.30 i» O ”’1 o o 0.25 ~~ .0 (mill 2. 0.20 .. .0 Difference. between amino] and measured 0.00 (196-... t #1 A. . a; a 0 1.0 2.0 . 4. .0 .0 7 0 .005 3 0 0 5 6 Radial Position of Beam (mm) Figure 4-10: Plot of the difference between the actual value of (x2>— and that calculated from the BPM signals in mm2 for a single simulated beam as it is move radial outward from the BPM center. Chapter 5 EXPERIMENTAL RESULTS 5.1 Introduction In this chapter are presented the results of beam experiments intended to demonstrate Miller’s technique for measuring the x and y rrns emittances using a BPM. The chapter begins by describing the experimental apparatus and the data acquisition system. It then moves on to describe three different experiments: the first is a check of the electron beam stability, the second is a verification of the BPM calibration done in Chapter 4 and the third demonstrates Miller’s emittance measurement. 5.2 Experimental apparatus and data acquisition This section describes the experimental apparatus and the data acquisition system. 5. 2.1 Experimental apparatus The experimental apparatus is merely the end section of the SPA beam line shown in Figure 1-2. A schematic of this end section is shown in Figure 5-1. It consists of quadrupoles 7 and 8, a steering coil, a BPM, the spectrometer and the drifis between the magnets. (The fast deflector cavity, because it is not used, is left out of the figure.) Quadrupoles 7 and 8 are identical. They are electromagnetic, have a pole length of 98 99 dc: :83 $5 Mo .5503 use we oumaozom “Tm uSwE 955 Emom was Aulmu IV A||€|V AILvIIV =00 wctooam Sacco $388825 .4. “8:82 notion 88m 100 2.75 inches and a gap radius of one inch. The fields of these quadrupoles have been simulated and measured. From this it has been determined that their effective length is 86 mm and that, at a radius of 1 cm, the multipole components of the field are less than 1 percent of the quadrupole field. Attached to one pole of each magnet is a small Hall probe. The Hall probe voltages have been correlated to the gradients of the quadrupole fields. During beam operation, monitoring these voltages enables us to determine these gradients to within a percent. The steering coil is used for positioning the beam inside the BPM aperture. It is electromagnetic, of a standard design and is capable of deflecting the 8 MeV electron beam several mrad. Its field has not been characterized. The BPM is the same BPM whose calibration is discussed in Chapter 4. The spectrometer is an electromagnetic dipole magnet that bends the beam 90°. Its edge angles are such that it focuses the beam on the screen shown in Figure 5-1. The average energy of the beam is determined by adjusting the current of the magnet until the beam spot is centered on the screen. Measuring the width of the beam spot determines the energy spread of the beam. The spectrometer has been calibrated so that the average energy can be determined to within 2 percent accuracy. The three drifis in Figure 5-1 have the following lengths: d, = 496 mm , d2 = 425 mm and d3 =237mm. 101 5. 2.2 Capturing BPM signals A schematic of the data acquisition system for capturing the signals from the BPM electrodes is shown in Figure 5-2. The signals from the four BPM electrodes travel down 50 Ohm, coaxial HeliaxTM cables of equal length to 300 MHz, low-pass filters. From there they go to two, dual channel HPTM 54111D digitizing oscilloscopes. The oscilloscope digitizers operate at 1 giga-sarnple per second with six bit accuracy. Linked to the oscillosc0pes via GPIB is a PC running a control program written in LabView© from National Instruments”. The PC stores the digitized BPM signals in binary files. It can capture the signals from up to 99 individual beam shots. Each beam shot consists of several (usually less than 10) beam bunches traveling one after the other. 5. 2.3 Analyzing digitized BPM signals The digitized BPM signals are read into the IDL© data analysis software from Research Systems, Inc. Here, each electrode signal is processed with a 250 MHz digital filter. Utilizing the sampling theorem[29], the signals are filled in by interpolating ten additional points for each data point taken to obtain a voltage versus time signal like that shown in Figure 5-3. This trace shows two full beam bunches and part of a third from a typical beam shot. After the electrode signals are reconstructed, the peak-to-peak voltage of each beam bunch is determined. This is defined as the voltage difference between the first negative peak and the first positive peak of the bunch. The peak-to-peak voltage is only dependent Hp 541 1 1D Digitizing Oscilloscope Hp 54] 1 1D Digitizing Oscilloscope GPIB Interface to Computer 300 MHz Low Pass Filter Figure 5-2: Schematic of data acquisition system for capturing BPM signals. 103 Voltage vs. Time for a Typical Beam Shot 100.0 80.0 -~ 60.0 ~ 40.0 «- 20.0 -» 0.0 Voltage (m\') 23:23 a 54 l 2604 l -3.3 54 + 104 + —2 -18 no - —1605 - -1355 a» ~1105 - -855 L .4’ -606 - -3 56 T ~106 lAA rim _ 1) -20.0 4- -40.0 .. 450.0 .. m. U u -lO0.0 Time (as) Figure 5-3: Voltage versus time signal from BPM electrode for a typical beam shot. There are two full beam bunches and part of a third displayed. 104 upon the amplitude of the signal and has the property that any dc bias that might be present is eliminated. Once the peak-to-peak voltages are determined, the values of x , 37 and (x2 > - for the desired number of beam bunches are determined according to equations (4-1), (4-2) and (4-7) using the calibration constants determined in Chapter 4. 5.3 Stability experiment The electron beam from SPA is not very stable beam—shot to beam-shot. This is due, mainly, to fluctuations in the drive laser beam that strips the electrons from the photo- cathode. This first experiment is meant as a check of this stability. The drive laser is located a considerable distance from the accelerator vault. The laser beam is transported several hundred feet from the laser location to its injection point in the accelerator beam line via an evacuated pipe using multiple mirrors and lenses. There are two stability issues associated with the technology used to create the drive laser beam: amplitude fluctuations and pointing instabilities. The amplitude fluctuations are changes in the amount of light energy contained in each laser pulse, causing corresponding amplitude fluctuations in the electron beam. The pointing instabilities are small changes in the location on the photo-cathode where the drive laser beam strikes. These are due to small deflections of the laser beam caused by air currents and vibrations in the Optics. Because of the great distance the laser beam travels, these small deflections are greatly atnplified. This translates into position fluctuations in the electron beam and, because the photo-cathode surface does not emit electrons uniformly, amplitude fluctuations as well. To test how severe the electron beam instability is, two BPM experiments were done. 105 In the first, the stability of the beam shot-to-shot was investigated by measuring the intensity of the beam (sum of all four BPM electrodes), 35, y and (x2>— for 99 successive beam shots. In the second experiment, the average stability of the beam was observed by taking the average intensity, average beam center and average value of (x2 > — over 99 successive beam shots. This was done for multiple sets of 99 beam shots to determine if the average values of these quantities change over time scales on the order of about one hour. There are also long term (days) stability questions arising from changes to the photo- cathode. The photo-cathode material used in SPA is CszTe, a fairly reactive substance. Although the accelerator is maintained at a pressure on the order of 10’9 Torr, the photo- cathode surface is slowly contaminated over time. Also, breakdown in the accelerator cavities ofien results in electrical arcs that damage the photo-cathode surface. The end result is a slow degradation of the photo-cathode performance. We attempt to neutralize this effect by replacing the cathode every few months (when possible) and by increasing the laser power to maintain constant charge levels. However, the effect of photo-cathode aging on the electron beam has not been investigated. 5. 3.1 Shot-to-shot stability In the first experiment, the electron beam was first transported to the position of the BPM in Figure 5-1. To ensure that the majority of the beam that exits the accelerator arrives at the BPM position, the intensity of the beam at the BPM at the beginning of the SPA beam line (Figure I-2) was compared to the intensity of the beam at the BPM in 106 Figure 5-1. Using this diagnostic, and adjusting the strength of the focusing elements, nearly 100 percent transmission of the electron beam from the accelerator exit to the experimental BPM was achieved. This procedure was followed as a precursor to all the experiments described in this chapter. Once good beam transport was established, up to 99 successive beam shot signals were captured using the data acquisition apparatus shown in Figure 5-2. This was done without changing the focusing or steering of the beam. For each shot, the BPM signals were processed to extract x, y, the intensity (sum of the four electrodes) and (x2 > — . A typical result is shown in Figures 5-4 and 5-5. As can be seen in the figures, the shot-to-shot stability of the beam is not very good. This is especially true of the (x2 > — measurement, which is the most susceptible to error. These fluctuations have two possible origins: actual changes to the electron beam from shot-to-shot and the limited accuracy of the oscilloscope digitizers. The digitizers operate with 6 bit accuracy and there was some concern that this limited precision was responsible for the observed beam instability. The rrns scatter that is introduced by the digitizers can be estimated and compared to the observed scatter. In Figure 5-4a, the rrns scatter of the beam intensity versus shot number is calculated to be 0‘ = il7.4 mV. A simple calculation of the scatter due to the limited accuracy of the digitizers yields Average Intensity = 33'- 2Number ofbits = 353-] mV. 5 Digitizers 107 Beam Intensity vs. Shot Number 300.0 250.0.l~ 0 o r. O Q Q . O O . E 200.00 ’9 . ‘0’. .9. ’0 ~00... \.O~.O 0’ o O” t. '. $0. °¢.9..OOOOQ. ~; 0 ’ o 0 g «to. . 0 . o. 5 150.0” 9 E 100.0-L 5.5 50.0.. 0.0 t . f . . . . . o 10 20 30 40 50 60 70 80 90 ShotNumber 8) - vs. Shot Number 20.0 15.0«» . O . . O 100 9 0 o 07‘ . .. . 9 E 5.0.. .0 ." o 0 o . ’ N, 0.0~lF §.——— % . . O ; +0; fit . -50“: 10’ a)” 30 .40 .050 .60. 7.0 0 &.°. 90 '5. ' o - . . O O O ’ O O . 40.0.- o 0 ~ 0 o - - O . o 15.0 » , . -2o.0 . ShotNumbcr b) Figure 5-4: a) Intensity (sum of four BPM electrodes) versus successive beam shots. b) (x2 > — versus successive beam shots. 108 x Position of Beam Center vs. Shot Number 2.00 1.50.» 1.00.. 050+ . . g 000 W—h—a—k 3 4 H. l . 7 lo°010~ 20 . 30 .40 .‘50 6% .73 ’30. 90 .050 ’0 o o co ’0 400‘... .o.o.0.0'o 0‘ .’ .. . ~ .0 . O o -150 . . .9 O . ’. O O . O o -2.00 ShotNumbcr a) y Position of Beam Center vs. Shot Number 2.00 1.50.. 1.00.. ° . ° 2.. 050”. . ’ .’.... . O:O\O. ..o 0.0.0. .0 .I ’~OO g 0.00 ~ fir $.13... .+ t t 4 $49 .4 >450}! o 1%. 20. 30 400 .3 ..600 70. q) 90 4.004» " . . 4.50.. .200 ShotNumber 19) Figure 5-5: a) x position of beam center versus successive beam shots. b) y position of beam center versus successive beam shots. 109 Assuming the scatter due to the beam and the scatter due to the 6 bit digitizers add in quadrature, the scatter due to the beam is found to be 68m = $17.2 mV. This indicates that beam fluctuations are the dominate source of noise for the intensity measurement. In Figure 5-5, the rms scatter for the x position of the beam versus shot number is calculated to be c = $0.41 mm and for the y position 6 = $0.38 mm. The scatter due to the digitizers is calculated to be 20 2J5 oDigitiRl’S = 11110 2Number ofbits Sx = i0'14 mm in x and 20 2.5 GDigitizers = 1 mm 2Numbcrofbits Sy = 1130-14 mm in y. SK and S y are the calibration constants found in Chapter 4. Therefore, the scatter due to beam fluctuations is one”, = $0.38 mm in x and 0'Beam = $0.35 mm in y. 110 In Figure S-4b, the rrns scatter of (x2) — versus shot number is calculated to be o=$62 mmz. An estimate of the scatter due to the accuracy of the oscilloscope digitizers yields ._ +__C_1____ _ +1 4 2 oDigitizcrs " - 2Numbcrofbits " — - mm a where CI is the calibration constant determined in Chapter 4. Therefore, the scatter due to the beam fluctuations is (5ch = $6.0 mm2 . The estimates of the scatter due to the 6 bit digitizers are accurate to about a factor of 2 for the four plots. Therefore, it is apparent that the dominate source of noise in these measurements is beam related. Oscilloscopes with more accurate digitizers would have been nice, if they had been available. But they are not necessary. The error introduce by the oscillosc0pes is effectively swamped by beam noise. 5.3.2 Average stability To check the average stability of the electron beam, a similar experiment was performed. Again, good transport of the beam to the BPM in Figure 5-1 was achieved first. In this experiment, sets of up 99 beam shots were captured using the apparatus in Figure 5-2. Typically, each beam shot contained 5 beam bunches. For each set of 99 shots, the average values of 3:, y , the intensity and (x2 > - were calculated for each beam bunch. This was done for successive sets of 99 beam shots without changing the beam focusing or steering. The time lapse between measurements was 2 to 5 minutes. 111 Because the focusing remains constant, the average value of (x2 > — (y2> should not change if the beam is stable. The average stability of the beam was tested several times on different days using different focusing and different amounts of charge per beam bunch. Figure 5-6 and 5-7 show the results of one of these experiments for a single beam bunch. Comparing these to Figures 5-4 and 5-5, it is apparent that the average stability is better than the shot-to- shot stability. However, it is still poor. Figure 5-8 shows the results of a similar experiment done on a different day at different charge and different focusing. Obviously, the beam was more erratic when this data was taken than it was for the data shown in Figures 5-6 and 5-7. These experiments demonstrate that the stability of the SPA electron beam is not very good. This adversely impacts the precision with which one can expect to measure the emittance using Miller’s technique. 5.4 Experiments to check BPM calibration Using the pulsed wire technique described in Chapter 4, the BPM was calibrated to measure 2, y and (x2 > — (yz). To check that this calibration is valid for a real electron beam, the following experiment was performed. This experiment is very similar to the one described in the previous section. Again, good transport of the beam to the location of the BPM in Figure 5-1 was first established. Then, without changing the upstream focusing, the electron beam was steered to different transverse locations inside the BPM aperture using the steering coil shown in Figure 5-1. 112 Average Intensity vs. Measurement Number 700 600 -. . . 500 ll ‘ " . 400 .. 300 ~- 200 0 Average Intensity (ml) 100 Ji- 0 2 4 6 8 10 Measurement Number 8) Average Value of vs. Measurement Number 10.0 9.0 « - 8.0 « . .7; 7.0 .. E 6.0. I i T 5.0 «» 9.12:: {ii} {iii 2.0 .. 1.0 0 0.0 0 2 4 6 8 10 Measurement Number b) Figure 5-6: a) Average intensity (sum of four BPM electrodes) of beam bunch versus measurement number. b) Average value of (x2 > — versus measurement number. Each measurement is the average over 99 consecutive beam shots. 113 Average x Position of Beam Center vs. Measurement Number 1.5 it 1.0 _ E 05 f :3 00 J I 5 . i 4 :5" 0 I I i 6 8 g 3r. -O.5 » -1.0 .. -l.5 Measurement Number a) Average y Position of Beam Center vs. Measurement Number 1.5 1.0 .. E 0.5 ~- Z 00 a 1. a g, h i 4 g I 8 § . 4?. -0.5 ~ I 1 I i -1.0 —. -1.5 Measurement Number b) Figure 5-7: a) Average value of x position of beam bunch center versus measurement number. b) Average value of y position of beam bunch center versus measurement number. Each measurement is the average over 99 consecutive beam shots. 114 Average Intensity vs. Measurement Number 300 250 .. 7‘ . . . . . ” o ‘ O a t o 0 o o 5 200” o ’ ‘ ‘ o . E- 150 A if 100 .. 3: so .t 0 . . . . 0 5 10 15 20 Measurement Number 80 Average Value of vs. Measurement Number 5.0 323% H i , this}. T i} . f- r 4.01! 5 10 15 20 “:21: ll; H I} 4.04» -5.0 ’ ) ’) (mm v‘ Measurement Number b) Figure 5-8: a) Another example of the average intensity (sum of four BPM electrodes) of a beam bunch versus measurement number. b) Another example of the average value of (x2 > -— (yz) versus measurement number. 115 At each location, the signals from 99 beam shots are captured with the apparatus of Figure 5-2. Each beam shot consisted of 5 beam bunches. For each beam location, the average values of SE2 — yz , the quadrupole moment and (x2 > — (y2> were calculated for each beam bunch. In Chapter 4, the BPM was calibrated (Equation 4-7) to measure (lem - (flaw = 09- + Y2 - Y2- Recall from Chapter 1 that this is called the quadrupole moment of the BPM signal. In this experiment, because the focusing is kept constant, the value of (x2 > — should stay constant. (Even though the experiments fiom the last section show that this is not necessarily true for the SPA electron beam, we will assume that it is for the present circumstances.) Therefore, the only change in the quadrupole moment is due to the change in the value of r2 — y? that occurs when the beam is moved to different locations within the BPM aperture. The value of this term is known because the ability of the BPM to measure 2 and y accurately has been verified on a similar electron accelerator[16]. Therefore, if the calibration constants in Equation 4-7 are correct, a plot of the quadrupole moment versus x2 —72 should be a straight line with slope equal to 1.0. Figure 5-9 shows the results of one of these experiments. The slope of the line in Figure 5-9a is 0.95. This is close to 1.0, suggesting that the calibration is fairly accurate. Repetitions of this experiment indicate that a slope of 0.95 is typical. It is tempting to try to correct the calibration so that the small error that is indicated is eliminated. However, because of the instability of the electron beam, illustrated by Figure 116 2 Quadmpole Moment vs. T — y -30.0 , ‘) Quadrupole Moment (mm‘) 2 2 vs. Measurement Number 5.0 4.0 T 213% l l i l i :35} 3ij 7.} {in} an. {i} i T (mm?) 2 .\ \ -3.0 «- -4.0 .. -S.0 Measurement Number b) Figure 5-9: a) Quadrupole moment versus x2 -y2. The slope of the fit line is 0.95 $ 0.021 . b) (x2 > — versus measurement number for the same data points shown in a). Each point is the average of 99 beam shots. 117 5-8b and the previous section, it is uncertain how much faith one can put into this calibration check. Also, this experiment says nothing about the constant term in Equation 4-7. Therefore, no change to the calibration found in Chapter 4 was made. One other note. This experiment was performed several times and in each case the data yielded plots very much like that shown in Figure 5-9, even thought the amount of charge per bunch varied by as much as a factor of 20. This demonstrates the BPM’s expected insensitivity to charge when measuring the beam position and quadrupole moment. 5.5 Emittance measurements The final experiments presented in this chapter are intended to verify that the emittance of the beam can be measured by Miller’s technique utilizing the BPM and the beam line components shown in Figure 5-1. The main difficulty is that there is no independent verification that the emittance numbers obtained this way are, in fact, correct. As was discussed in the Introduction, one of the main reasons this method is being pursued is that there are no other satisfactory approaches to measuring the rrns emittance of photo-injector electron beams. The validity of Miller’s technique must be inferred by looking at the numerical error estimates and the behavior of the emittance as beam parameters are changed. The first part of this section goes through the approach to a single emittance measurement. This will serve as an example and it can be assumed that all other emittance measurements are done in the same manner. The second part of this section shows the results of measuring the emittance of the beam with different amounts of 118 charge per bunch. It is expected that the emittance will increase as the charge is increased. The third part of this section shows the results of measuring the emittance with different amounts of magnetic flux on the photo-cathode. It can be shown that the emittance changes in a predictable way as the strength of the magnetic field in the photo- cathode region is changed [6], [30]. All of the emittance measurements presented here were done at an average beam energy of 7.77 MeV with an energy spread of less than 1 percent. 5. 5.1 Single emittance measurement To measure the emittance with Miller’s technique, the first thing that needed to be done was to find focusing settings for quadrupoles 7 and 8 in Figure 5-1 that resulted in a stable matrix equation. This subject was discussed at length in Chapter 2 where it was concluded that a quadrupole triplet was a very good optics configuration for performing this measurement. As can be seen in Figure 5-1, however, only two quadrupoles were used in this experiment. Initially, three quadrupoles were used. However, it became apparent early on that the emittance of the SPA electron beam was not as good as was predicted by simulation. (This will be discussed later.) Because of this, the beam size tended to be bigger than anticipated and there was a substantial problem with the beam intercepting the beam pipe walls when the triplet configuration was used. To minimize this problem, just the two quadrupoles were used. Although this does not provide as good a resolution as the triplet configuration, it proved to be adequate. Utilizing the ideas presented in Chapter 2, 18 settings for quadrupoles 7 and 8 that produced a stable matrix equation with sufficient resolution were determined. Added to 119 these 18 settings is one more that is known to transport 100 percent of the electron beam from the accelerator exit to the experimental BPM. This 19th quadrupole setting allows one to determine if a significant amount of the beam is intercepting the beam pipe wall for any of the other 18. The matrix A that results is shown in Figure 5-10. The figure of merit (FOM), as defined by Equation 2-9, for this matrix is FOM = 0.30 This shows that these quadrupoles settings result in a matrix equation that is sufficiently stable. After choosing the quadrupole settings that produce the matrix in Figure 5-10, considerable time was spent focusing the beam as it entered the section of beam line where the emittance measurements occurred (Figure 5-1). The goal was to adjust the properties of the entering electron beam so no beam was lost in the diagnostic section of beam line (Figure 5-1) for any of the 19 quadrupole settings chosen for the emittance measurement. Again, this was done by comparing the intensity of the beam at the BPM at the start of the SPA beam line to the intensity of the beam at the BPM in Figure 5-1. This task was complicated by the unstable nature of the beam intensity (Figure 5-6a and Figure 5-8a) and, in the end, was not accomplished with complete success. Very often measurements were discarded when too much scraping of the beam occurred. When making an emittance measurement, the quadrupoles in Figure 5-1 were set to each of the 19 settings in turn and the beam was approximately centered in the BPM aperture using the steering coil. For each setting, 99 beam shots were captured and stored on the computer. Each beam shot typically contained 5 beam bunches. Each of these 5 120 - 1.1450 2.9264 1.8697 -0.8651 -2.4034 -1.6693_ 8.1 73 5 -0.3 626 0.0040 -0.0073 0.0060 -0.001 3 5.0447 -1.4027 0.0975 -0.0478 -0.1 145 -0.0686 2.8484 -1.7965 02833 02306 — 0.4483 — 02179 0.0033 0.1852 25660 - 0.0260 0.0067 — 0.0004 0.0578 0.7794 2.6251 - 0.0014 — 0.0140 — 0.0360 0.1694 1.3450 2.6699 - 0.0461 — 0.1495 - 0.1212 0.0127 - 0.0032 0.0002 — 9.1505 — 0.1079 — 0.0003 0.0048 0.0208 0.0227 — 6.0285 1.1742 - 0.0572 A = 02427 0.4643 02221 — 3.3388 1.6799 — 0.21 13 0.0289 — 0.0036 0.0001 — 0.0092 02934 — 2.3290 0.0016 0.0150 0.0350 - 0.0078 — 02723 - 2.3836 0.1237 0.3197 02067 — 0.0596 - 0.7340 - 22605 0.0643 — 0.0039 0.0001 — 5.3022 — 12.7231 - 7.6325 0.0184 - 0.0350 0.0167 — 4.6875 — 1 1.3255 — 6.8409 0.0001 - 0.0050 0.0668 — 4.0891 — 9.9595 — 6.0643 6.8308 15.4086 8.6894 — 0.0934 — 0.0209 - 0.0012 6.0439 13.7133 7.7786 — 0.03 81 0.0330 0.0071 _52439 1 1.9836 6.8464 — 0.0052 0.0313 — 0.0469_ Figure 5-10: A matrix associated with settings for quadrupoles in Figure 5-1 used to measure the electron beam emittance. 121 bunches were analyzed to find the intensity, 3?, y, and (x2 ) - . Any beam outside a 4 mm radius of the BPM center was then discarded because the BPM calibration for the quadrupole moment is not valid in this range (Chapter 4). Of the remaining beam shots, the average value of the intensity and (x2 > — was calculated for each quadrupole setting. A typical result of such a measurement is shown in Figure 5-11 and Table 5-1. The charge per bunch was approximately 0.2 nC'. Figure 5-11 is a plot of the average beam intensity for each of the 19 quadrupole settings. The second column of Table 5-1 presents the average measured value of (x2 > — for each of the 19 quadrupole settings for one of the beam bunches. Using this data and the matrix A shown in Figure 5-10, one can solve for the rms beam parameters as described in Chapter 2, yielding: (x2) = 3.46 mm2 $ 0.408 mmz, (xx’) = -351 mm mrad $ 0582 mm mrad , = 426 mradz $1.004 mradz, = 0.95 mm2 $ 0.333 mmz, (yy') = -0.22 mm mrad :t 0532 mm mrad, and = 1.42 rnradz $ 0.933 mradz. The error estimates are obtained from the well known covariance matrix as derived in Appendix F and assume the measurement errors are normally distributed. 122 Intensity vs. Measurement Number 80 70 4. 50 .. 40 .. Intensity (m\') 30 4» 20 at 0 t : 4 : t : 7 . . 0 2 4 6 8 10 12 14 16 18 20 Measurement Number Figure 5-11: Average beam intensity (sum of four BPM electrodes) at BPM versus measurement number for emittance measurement a charge equal to approximately 0.2 nC/bunch'. 123 Table 5-1: Average measured value of (x2 > — , predicted value of (x2 > — (from fit) and the difference between them for each quadrupole setting in emittance measurement for charge equal to approximately 0.2 nC/bunch'. Measurement Average value Error estimate, Predicted value Difference Number 2 _ 2 o, for average 2 _ 2 between 0f ()(‘m>m2)< y > value of Of ()(‘m>mz)< y > predicted value (x2 > _ (Y2) and measured (m2) value (m2) 1 -2.6 $0.90 -1.0 -1.6 2 23.1 $0.95 29.6 -6.4 3 26.3 $0.82 22.7 3.6 4 23.3 $0.91 16.9 6.3 5 6.6 $0.87 10.3 -3.7 6 8.3 $0.81 8.6 -O.3 7 7.5 $0.89 7.1 0.5 8 -8.6 $0.82 -8.6 0.1 9 -7.1 $0.86 -6.1 -1.0 10 -2.7 $0.77 -3.7 1.0 11 -2.9 $0.76 -3.3 0.3 12 -3.7 $0.83 ~32 -O.5 13 -2.6 $0.81 -2.9 0.3 14 -12.5 $0.77 -12.8 0.3 15 -11.8 $0.85 -11.4 -O.4 16 -10.0 $0.80 -10.0 0.0 17 11.3 $0.82 6.5 4.8 18 11.2 $0.86 5.9 5.3 19 -6.0 $0.85 5.2 -11.1 124 Using (2-1) and (2-2), the x and y nns emittances can be calculated, yielding ex 21.6 mm mrad $0.49 mm mrad and 2y = 1.1 mm mrad $ 0.36 mm mrad. Multiplying these number by the relativistic factor By to obtain the normalized emittances (Equations 2-3 and 24) gives em = 25.2 mm mrad $ 7.94 mm mrad and syn = 18.5 mmmrad$5.89 mmmrad. The formulas for the error estimates are derived in Appendix F. Again, normally distributed measurement errors are assumed. After performing the fit to estimate the rrns beam parameters, one can then use those estimates to calculate the predicted values of (x2>— , shown in column 4 of Table 5-1. In column 5 of Table 5-1 is shown the difference between the average measured value of (x2 > — and the predicted value. From this column, the value of o, the error in the measurements, is estimated to be $4.71 mm2 (See Appendix F). This is much different from the values of o in column 2 of Table 5-1. It is apparent that there is often poor agreement between the measured and predicted values. To improve the fit to the data, data points where excessive beam scraping occurred need to be eliminated. For instance, in Figure 5-11, the intensity for measurement 19 is obviously much lower than the rest. The electron beam, for whatever reason, changed, or, more likely, was intercepting the beam pipe walls during this measurement. So, this 125 data point is thrown away. Although less obvious, the same is true for measurements 2, 3 and 5. Now, doing a fit without these data points yields (x2) = 5.34 mm2 $ 0.250 mm2 , (xx') = —4.07 mm mrad $ 0.169 mm mrad , = 4.37 rnradz $ 0.270 mradz, = 0.97 mm2 $ 0.069 mmz, for each of the measurements kept. The result is Table 5-2. From column 5 the value of o, the error in the measurements, is now estimated to be $ 0.98 mm2 (See 126 Table 5-2: Same as Table 5-1, but measurements 2, 3, 5 and 19 are all discarded because of beam scraping. Measurement Average value Error estimate, Predicted value Difference Number of (x2 > _ (Y2) o, for average of (x2 > _ between (mmz) v Inc of (mmz) predicted value (x2 ) _ and measured (mmz) value (mm ) 1 -2.6 $0.90 -0.3 -2.3 4 23.3 $0.91 23.3 0.0 6 8.3 $0.81 8.7 -0.4 7 7.5 $0.89 7.1 0.4 8 -8.6 $0.82 -9.3 0.7 9 -7.1 $0.86 -5.7 -1.4 10 -2.7 $0.77 -4.0 1.3 11 -2.9 $0.76 -3 .4 0.5 12 -3.7 $0.83 -3.3 -0.4 13 -2.6 $0.81 -2.7 0.1 14 -12.5 $0.77 -12.8 0.3 15 -11.8 $0.85 -11.3 -0.5 16 -10.0 $0.80 -10.3 0.3 17 11.3 $0.82 10.8 0.5 18 11.2 $0.86 10.2 1.0 127 Appendix F). This is much closer to the values of 0' given in column 3 than the is previous value of $ 4.71 mm2 . It might be argued that there is no reason to expect that the estimated value of o from the fit be anywhere near the values of o in column 3. Based on the stability experiments presented in the previous sections it should be much bigger. However, obtaining a smaller estimated value of c was not the reason that data points were discarded. That was based solely on concerns that the beam was scraping. The fact that the estimated value of 0' did approach the values of o in column 3 is quite remarkable. In fact, this was a typical behavior. Based on observation, whatever beam fluctuations that caused the large changes in the average value of (x2 > — shown in the stability experiments seemed to be damped when quadrupoles 7 and 8 were set to their measurement values. Unfortunately, no experiments were done during this run cycle to verify this quantitatively 5. 5.2 On the question of beam scraping The last section presented an example of a fairly typical emittance measurement using Miller’s method on SPA. However, when analyzing the data certain data points were discarded to improve the fit to the model. As it turns out, this was also typical. Sometimes, as was the case with measurement 19 in the example, discarding a data point was easily justifiable. Obviously, some kind of beam scraping had occurred. However, as is the case with at least one of the other three data points that were thrown away, arguing that the beam was intercepting the beam pipe is not always so easy. As can be 128 seen by comparing Figures 5-8a and 5-11, the fluctuations in intensity seen in the emittance measurement (Figure 5-11) are not so different from the fluctuations in intensity when no focusing changes are made (Figure 5-8a). The risk one takes when throwing away “bad” data points is that the fault may not be in the data, but in the model used to fit it. By throwing out data to make the fit better, one could be ignoring a physical effect that the model does not take into account. To verify that this is not true here, Miller’s emittance measurement was simulated using the particle code PARMELA[21]. First, a beam bunch containing 20,000 particles and having a Gaussian distribution was generated. Its rms beam parameters were (x2) = 526 mm2 , (xx') = —3.97 mm mrad , = 4.31 mradz, = 1.08 mm2 , = —0.25 mm mrad , and = 1.39 mradz. The beam bunch has an energy spread of 1 percent and a F WHM length of 3 mm longitudinally. This is about what is expected of the SPA beam. The rrns beam parameters were chosen to be close to those measured in the example from the last section. The charge was assumed to be 1 nC in order to exaggerate the space charge effect, if any. A Gaussian distribution was used because the point of this exercise is to 129 simulate a diffuse beam, not because that is the expected distribution of the SPA beam. The distribution of the SPA beam is generally unknown. PARMELA takes this beam bunch and moves the particles down a simulation of the beam line shown in Figure 5-1 and includes non-linear effects as it does so. The simulation was run twice, one with a boundary where the real beam pipe should be and one without. When a particle in the first simulation “hit” the beam pipe, it was discarded. After running both simulations for each of the 19 quadrupole settings, the value of (x2>— was calculated for each. Also, for the first simulation, the number of particles left at the BPM position was recorded. A plot of this number versus measurement looks like Figure 5-12. As can be seen, the way in which the beam intensity increases from measurement 2 to 4 is very similar to that seen in Figure 5—11 for the real data. Fitting the data from the first simulation and keeping all the data points yields Table 5-3 and the rrns beam parameters in Table 5-4. Comparing the predicted values of (x2 > - for measurements 2 through 4 to the values calculated from the simulation, there is a similarity to the relationship between the predicted and measured values of (x2 > — (yz) in Table 5-1: the predicted value of (x2 > — for measurement 2 is larger than the measured value, the predicted value for measurement 3 is about right and the predicted value for measurement 4 is too small. When the values of (x2) — from the second simulation, where there is no beam pipe, were fit, the predicted values matched the simulated values. Also, if measurements 130 Intensity vs. Measurement Number 25000 20000»O..OOOOOOOOOOOOOOOO 15000 «» 10000 4» lnlt-nsilt (Number of Particles) 5000 4» 0 t * : * : 1 % . . 0 2 4 6 8 10 12 14 16 18 20 Measurement Number Figure 5-12: Intensity vs. measurement number for simulated emittance measurement. 131 Table 5-3: Value of (x2>- (y2> from simulation, predicted value of (x2)— (yZT (from fit) and the difference between them for each quadrupole setting in simulated emittance measurement with beam pipe. Measurement Calculated value of Predicted value of Difference between Number (x2) _ (Y2) (m2) (x2) _ (Y2) (m2) predicted value and from simulation simulated value (m2) 1 -0.3 -0.1 -0.2 2 32.7 34.8 -2.1 3 27.3 25.9 1.4 4 21.2 18.8 2.4 5 10.4 10.8 -0.4 6 8.6 9.2 -0.6 7 7.0 7.8 -0.8 8 ~95 -9.5 0.0 9 -6.7 -6.6 -0.1 10 -3.8 -3.9 0.1 11 -3.6 -3.6 0.0 12 -3.6 -3.6 0.0 13 -3.1 -3.1 0.0 14 -14.1 -14.1 0.0 15 -12.6 -12.6 0.0 16 -11.1 -11.0 -0.1 17 13.1 12.9 0.2 18 11.8 11.6 0.2 19 10.2 10.1 0.1 132 Table 5-4: Values of the RMS beam parameters for different fits in simulated emittance measurements. RMS Beam Actual Predicted Predicted Predicted Predicted parameters values values from values from values from values from fit using data fit using data fit using data fit using data from from from from simulation simulation simulation simulation with beam with beam with beam without pipe pipe, but pipe, but beam pipe discarding discarding data points 2 data points and 3 2, 3 and 4 (x2) 5.26 4.10 4.84 5.28 5.26 (mmz) (xx') -3.97 -3.51 -3.71 -3.93 -3.92 (mm mrad) (x’2> 4.31 4.49 4.29 4.34 4.34 (mradz) (Y2) 1.08 1.05 1.05 1.05 1.06 (M) 1.39 1.58 1.57 1.57 1.57 (mradz) 133 2 through 4 are discarded from the first simulation, then the fit to that simulated data is also very good. Table 5-4 shows the results for the rrns beam parameters for several scenarios. What the simulation without beam pipe boundaries shows is that there are no unexpected discrepancies between the model and what is really going on in the beam dynamics. The linear model is quite good, even at a relatively high charge of 1 nC per beam bunch. What is apparent from the first simulation, where the beam pipe was present, is that the beam intercepting the pipe wall is a problem. From this one can conclude that throwing away data points because it is suspected that beam scraping has taken place is acceptable. In fact, from simulation, a good rule of thumb is that, when (x2 > — gets bigger than about $ 20 mm2 , beam scraping should be looked for carefully. What this simulation does not address is the difficulty of distinguishing beam scraping from the inherent instability of the electron beam. As has already been established, changes in beam parameters and intensity are to be expected as a normal property of the beam. Determining which changes are due to the beam intercepting the wall is often arbitrary. This is not a very satisfactory solution, but until improvements to the stability of the electron beam are made it is unavoidable. 5.5.3 Emittance versus bunch charge To verify that this method for measuring the emittance actually works is difficult. We would like to compare the numbers from this technique to others. However, as has 134 already been discussed, there are no other methods that we trust because of the unique qualities of a photoinjector beam. This limits us to more a more indirect approach. One way to verify Miller’s technique is to vary the emittance in a predictable way. For instance, as the charge per beam bunch is increased, we expect the emittance to increase. By measuring the emittance at different charge levels, a definite trend should emerge. In this experiment, the emittance of the beam is measured versus the charge per bunch of the beam. The charge per bunch is the only variable changed. The focusing elements upstream from the experimental section are kept constant. The emittance at each charge level was measured using the method described in section 5.5.1. Each beam shot contained 5 bunches. The emittance for each bunch was measured at each charge level. The average of these 5 emittances at each charge level is plotted in Figure 5-13. The x emittance shows a definite upward trend, as expected. The trend for the y emittance is less clear, although it does seem to increase as well. 5. 5.4 Emittance versus magnetic field A better check of the efficacy of Miller’s emittance measurement is to measure the emittance as the magnetic field on the cathode is changed. In Figure I-l, three solenoids are shown around the front end of the SPA photoinjector. The two large solenoids are used to focus the beam as it is accelerated. The smaller bucking coil is used to cancel the magnetic fields of the two larger solenoids in the region of the photo-cathode. What will be shown is that, as the current through the bucking coil is moved away from its proper value, the emittance of the electron beam will increase. 135 Average Normalized Emittance vs. Bunch Charge 70.0 LA 5: o ”-1 8 o 1.1 30.0 4- I i I If B 0 Normalized Emittance (mm mrad) 10.0 '1' 0.0 : 5 4 4 5 : 4 4 0.00 0.05 0.10 0.15 0.20 0.25 0.30 0.35 0.40 Bunch Charge (nC)‘ Figure 5-13: A plot of normalized emittance versus bunch charge. 0.45 Ox Emittance I y Emittance 136 The front end of the SPA photoinjector is designed so that the electric and magnetic fields are cylindrically symmetric about the axis that runs through the center of the cathode. Therefore, % a w'm" (5-1) where d) is the scalar potential and A is the vector potential. The equations of motion for a charged particle in cylindrical coordinates are d . . 31-(ymi) —')(mr02 = q(Er +r0Bz —2Be), Et-(ymrzél) = q(1~:6 +213r 413,), and d . $(ymZ) = q(Ez + m, — r013,)[6]. Using (5-1), we have 6A6 E9 =— at , 6A9 Br — - aZ and 1 a BZ =;“a—r-(I'A9) Substituting these into Equation 5-2 gives __( 2(3)— (6A9 .6A6 .6A9 iAej rdtymr —q 6t+r6r+zaz+ r (5-2) 137 or d . a:(ymr20 + qrAe) = 0. Therefore, ymr20+qrAe = constant. (5-3) This is equivalent to saying that the canonical angular momentum in the Hamiltonian formalism is a conserved quantity when the system has cylindrical symmetry. The magnetic flux through the circle defined by the radial position of the particle is w = [fr-as = [(w A)-dS = (TA-di = 2mA, [6]. Therefore (5-3) can be rewritten as 2 ‘ q ymr 9+5“, = constant. (5-4) This is known as Busch’s theorem [6]. The bucking coil on the SPA photoinjector was incorporated in the design in order to nullify the magnetic fields from the other two solenoids on the surface of the cathode so that w in (5-4) is zero. When its current is not properly set, however, there will be a magnetic field perpendicular to the photocathode surface that is nearly constant with radius. Then 1); will be given by w=nfiBw where Bc is the magnetic field on the cathode and rc is the radial position of the electron at the cathode. Equation (5-4) now becomes erzB C C ymrcz0- = constant. 138 This is significant because, when the electrons are emitted from the cathode surface, their angular velocity will be very small. So, we can say that 2' q ercch where r is the radial position of the electron at some point downstream. As the beam is accelerated away from the cathode, the magnetic fields, and therefore the magnetic flux, from the solenoids decrease to zero. According to (5-5) the angular velocities of the electrons grow to compensate. This leads to an increase in the in x and y momenta of the electrons as they pass into the field free region downstream from the cathode, enlarging the area of the beam in x and y phase space. Since the x and y rrns emittances are proportional to this area, they also increase. An analyses of the beam envelope equation [6], [30], shows that the emittance increases with the magnetic field on the cathode according to RZB 2 en=\/s§+(e ° °) (5-6) 4mc where an is the normalized rrns emittance, t:i is some intrinsic emittance and Rc is the radius of the cathode. This equation holds for both the x and y directions although the intrinsic emittance will be different for each. By moving the current of the bucking coil away from its proper value and using Miller’s technique to measure the emittance, a distinct curve that follows (5-6) should emerge. The results of such an experiment are shown in Figure 5-14. The fitted curves in Figure 5-14 are slightly different. The magnetic field dependent term was slightly bigger (20%) for the x direction than it was in the y direction for a 139 given magnetic field. However, the fits to (5~6) are quite good considering the simple model used to obtain the dependence of the emittance on the magnetic field. According to Figure 5-14, the x emittance is determined with better accuracy than the y emittance. This is not a failure of the technique, but a problem with the signal to noise ratio. The poor stability of the electron beam limits the resolution of Miller’s emittance measurement. It would appear that oftentimes the value of the y emittance falls beneath this resolution. With improvements to the beam, better values with smaller error bars for the y emittance will result. 'The charge per bunch was measured using a wall current monitor. Recent experiments have call into question its calibration. Therefore all charge measurements are not accurate to better than a factor of two. 140 Normalized rrns Emittance vs. Magnetic Field on Cathode -AA 2 “LU 45.0 g 40.0 a . I v 30.0 Fit to x Emittance g 9 x Emittance E 25'0 —Fit to y Emittance 20.0 I 1 Emittance T Y . E 15.0 i 5.0 : 4 : 3;, . 4 : t -80 -60 40 -20 O 20 40 60 80 Magnetic Field on Cathode (Gauss) Figure 5-14: Emittance versus magnetic field on photo-cathode. CONCLUSION The goal of this thesis was to present a sound theoretical basis for measuring both the rrns emittance and the rms pulse length using BPMs and to demonstrate Miller’s emittance measurement technique experimentally. This has been achieved. However, in the process some questions were raised and problems encountered. The poor stability of the SPA electron beam presented the greatest obstacle to implementing Miller’s emittance measurement successfully. The hope we have is to use Miller’s method as a routine emittance measurement. To do this, however, the beam stability must be improved. At the time of this writing, changes are being made that should improve the stability considerably. As was mentioned briefly in Chapter 5, the measured x and y emittances of the SPA beam were greater than anticipated. Simulations of the machine show that, at 1 nC per beam bunch, the normalized emittances should be about 10 mm mrad. At 0.2 nC per beam bunch, the normalized x emittance was three to four times this value. The normalized y emittance was, perhaps, more reasonable. It is not yet known why this discrepancy exists. Possible reasons are that the simulations are wrong, something in the beam line is causing the emittance to grow, the emittance measurement is flawed or, quite simply, we are not running the accelerator in an optimal fashion. In its previous incarnation as the injector for the HIBAF facility[14], PARMELA 141 . 142 simulations of the injector and experiments agreed quite well. For this reason, we have great faith in PARMELA to accurately predict the performance of SPA. For the simulations to be incorrect, a substantial physical effect would have to be neglected. In our PARMELA simulations of SPA, it is assumed by the code that the photo- cathode emits electrons uniformly when struck by the laser beam. However, we know that this is not true in the real accelerator. When fabricated, a photo-cathode’s surface does not have a uniform quantum efficiency. This is a result of the fabrication process. These discrepancies are small, and simulations done in the past indicate that they do not degrade the beam quality significantly. However, it is not clear what happens to the photo—cathode surface over time after it is placed inside the accelerator. Because of limited access to the photo-cathode preparation equipment, the photo- cathode that was in place when the emittance measurements presented here were performed was well over one year old and had been inside the accelerator for nine months. This is longer than any cathode of this type has been used. During this time the cathode was damaged by arcing in the accelerator cavities, it was poisoned on one occasion when a vacuum pump failed and its average quantum efficiency degraded by a factor of 20. It is unknown what this abuse did to the cathode surface. It is possible that the initial shape of the beam, because of the damage to the cathode, is the cause of the larger emittance. There is also a possibility that some part of the SPA beam line is producing nonlinear forces that are causing substantial emittance growth. This is unlikely. However, the possibility should also be investigated. 143 There is also a chance that the emittance measurement is flawed somehow. However, I consider this to be the least likely explanation. Presented in this thesis is ample evidence that Miller’s emittance method is sound. Also, based on the poor behavior of the beam, there is no reason to think that the emittance is any better than what was measured. The difficulties in transporting the beam and beam spot size on the two screens in the beam line tend to support the higher numbers. The simplest explanation for the higher numbers is that the accelerator is not being run optimally. That is, the currents in the solenoids are such that the emittance of the beam is not minimized. The simulations are run such that the magnetic fields from the solenoids are very close to their optimum value. Hence, if the currents in the real solenoids are not set properly, simulation and experiment will not agree. Since the magnetic fields from the solenoids have never been mapped, setting their currents properly is not automatic. With experience, this condition should improve. Appendices Appendix A Appendix A CHARGE DISTRIBUTION INDUCED ON INNER SURFACE OF BEAM PIPE DUE TO RELATIVISTIC ELECTRON BEAM A.1 Introduction Consider Figure A-1. An electron bunch that is described in the lab frame by the density distribution pL(r'i) traveling with a relativistic velocity, v, inside a metal pipe with radius a. The distribution function pL(x‘) is referenced to the coordinate system whose origin corresponds to the pipe center. The electric potential, (I), is defined to be zero on the pipe. In the metal walls of the pipe, the electron bunch induces an image charge. A relationship between the bunch density distribution and this image charge will be derived. The problem will broken down into two parts. First, the problem is solved in the beam frame where v = 0. Then, to find the solution in the lab frame, a relativistic transformation is made. A.2 Solution in beam frame In the beam bunch’s rest fiame it has a density distribution that will be denoted by p364). To find the image charge distribution that is induced by the bunch, Poisson’s equation must be solved, 144 *‘< radius = a pL(i’t) k . (I) = 0 b) Figure A-l: Relativistic electron beam pulse in metal pipe: a) cross sectional view, b) longitudinal view. 146 VZMR) = 4313365), for the potential (12(x) using the proper boundary conditions. This problem was first done by Smythe[31]. The image charge distribution on the pipe walls is then given by l o(0,z) = —4_7t.fi. E m, fr =f 1 1 aq>(r,o,z) ‘5 ‘2; a. 0"") In cylindrical coordinates, Poisson’s equation becomes 62:55:) + -} at?) + :1,- 523‘," + 6:32)?) = 4an0?) (A-2) The boundary conditions on (12(x‘) are (142))”, = 0 (A-3) and <1>(s)|zm = 0. (A-4) To solve for the potential, the Green’s function, (3(a)?) , is found. Then cr>(2) = [p,(x')o(x,sz')d3x'— ‘4— cj ¢(x )————— ad” ——),xda' [32]. (A-5) Volume 11: Surface By evaluating the surface integral over the boundary where the potential is zero, (A-3) and (A-4), (A-S) becomes <1>(i) = IpB(X')G(x,x')d3x'. (A-6) Volume By definition, the Green’s function has the following properties: G(x,x') = G(x',x), (A-7) 147 17206152): —47r6()‘t — x') (A-8) and G(x,X') has the same boundary conditions as (12(2). Therefore, from (A-3) and (A-4) = o (A-9) and = 0. (A-lO) In cylindrical coordinates, the Dirac delta function is given by _ _ 1 5(x — x') = ;5(r — r')5(0 — 0')5(z — 2’). Therefore, from (A-8), 1 Woe-1,2): —47t;8(r—r')8(0—0’)6(z—z'). (A-ll) It is known that 1 2n ; Icos[n(0 — 0')]cos[n'(0 — 0')]d0 = 5m , (A-12) 0 % [5.4.46 .. 6414.14.49 —e')]de = 5...... and 2 8 32.12 (Km) Irlv(xvm Slim,“ 22de = 5m“. (A-13) v+1 where v 2 —1 and xum is the Bessel function zero[33]. Therefore, we can expand the function 148 Tao—mew) in the following series[32]: —6(r—r)8(0— 0): 2a ZJHXU 3{Amcos[n(o-o')] m=1 + B"m sin[n(0 —0')]} (A-14) where l - 0 an = 2 ’ n— , 1 , n at 0 2 211: a 1 1' Am- — 43213.50 m) ojdoojdn-r-ao—r')6(0—0')Jn(x,,m 2) cos[n(0—0')] ( ‘3 2J0 xnm _ = a naZJrzr+l(x rim), and [do ]dn-:-8(r — r')8(0 — 001(me 3314140 -0')] 00 D B l :1 m N t... A X 3 V Expanding the Green’s function in a similar fashion yields 66:30:22: “ZZZ um(z, z')J M( 3AM, cos[n(0 -0')]. (A-15) The constants are the same as in (A-l2) and an(z,z') contains the z dependence of G(x,x’). (The sin term is dropped because G(i‘t,)‘i') = G(x',x) and sin[n(0-0')] 9’: sin[n(0' —0)]. Therefore, it is expected that the sin term coefficients 149 should, in fact, be zero.) Substituting (A-15) into (A-l 1) yields 62G 16G 162G 62G _. _., 1 r r r V G(X, X=) 51‘2 -1-'-"a-r—+‘lja92 + 622 =—47t-r-6(r—r)8(0—0)8(z—z), a’Jnhm-il 164%.?) 2a cos[n(0— 0012A“, an(z,z at, +; (it L _ 2 622 , ' 1 4.1.0-4 ”(4.) “92> z4......-r.).(.-.t...-..). r a a 62 r Making the definition this expression becomes 62J (x) 16] (x) 112 23a“ COSID(9“9')];Anm Tan(z,z 'X"( a —) T—ax2+§_:K__x—21“(x)j azz , ' 1 +Jn(xnm 1) “(22 z )} = —47t-5(r — r')8(0 —0')8(z— z'). a 62 r By using Bessel’s equation, this becomes Zan cos[n(0- 9' ”2:4,“,an ma)T62 Z'g‘zgz z)-(:fl)22nm(z,z’)] m=l a = _4n%5(r—r')8(0—0')8(z—z’). 150 Multiplying both sides of the equation by 1 r ;c03[n (0 — 0 )]rJ n. (xwm. E) and integrating over r and 0 from 0 to a and 0 to 27: respectively gives gan izj‘coinm — 0')]cos[n'(0 — 00kt); Am 1d" (xnm BJ n, (xm' 3.) dr @Tazzm(z,z') —(xfl)22nm(z,z')T 022 a 1 271a r 1 = —4n — j Icos{n'(0 - 0')]rJn. xm, — -5(r — r')8(0 — 0')8(z — z')drd0. 1t 0 o a r Using (A-12) and (A-13) yields 2J2, ' ' 2 , ' , . ' 2 a a n+l(xnm )An.m,[:a an (zgz)_(in_fl_) Zn'm'(z,zr J "' 2 From (A-14) 2 2 I an’ a Jn'+1(xn'm')An'm' = J"! (x ’ l L) , 2 "m a leaving the equation 2 r 2 where the primes on n and m have been dropped for convenience. To solve this differential equation, first simplify the notation by making the definition 151 *0 III S 3 Then, 622nm (2’ 2') [(2 522 _ an (2,2') = —47t5(z — z'). 62mn (z, z') Multiplying both sides of the equation by 62 and integrating, gives .1. 2 rummage-.1 (Z (z,z'))2 "m = 47:ng (z', z’) + constant. (Zlm(2)) — k2 2 '9. Equation (A-10) requires that, as 2 —-) $00 , Z goes to zero, and, as a consequence, so does its derivative. Therefore, 47tZ;m (z',z') + constant 2 0 , leaving (Z:1m (z,z'))2 _ k2 (Zmn(z,z'))2 = 0 2 2 Therefore an (2,2') = ejtkz+C , where C is some constant. To determine the final form of the function an (z,z') , first rewrite the constant C in the following way: C -—) AeC. This gives an (2,2,) : Aeikz+C . 152 From (A-10) and (A-7) an(z,z') —> 0 (A-17) 2.41.. and an(z,z') = an(z',z). (A-18) Now, consider the special case of a point charge located at 5%. (9(2): [p,(x')G(x,x')d3x' = [q5(i'—x,)6(rr,x')d3x'=qG(x,ro). V V Therefore, 2' can be considered the longitudinal position of the point charge. Given the symmetry of this problem, it is expected that the function an(z,z') will be symmetric about that position. This, combined with (A-17) and (A-1 8) leads to the solution an (2,2') = Ae'k'z‘z'l. To find the amplitude, A, first take into account the discontinuity at z = z' . To do this, recall (A-16) and do the integration z'+e 2 ' 2"”: l [d 2.3.2ng ) — 182.42.29sz = ’4“ [5(2 " 2') z'—e z'-e where e —> 0. This becomes A(— Ute-““2“" — A(+ k)e'k(z""+‘) = —4n . When e—>0 Therefore 153 2 -'—‘Z‘Z Z...(zz)=—”3e ., ' we run Combining (A-19) and (A-lS) results in G(3i, i')=-Za cos{n(0— 0')]ZJn Hm(x —)Jn(xm g) ’Eafl'Z‘z'l a"'° "“1 xxnerzrrn( nm) e for the Green’s function. Substituting this into (A-6) to find the potential and then putting the potential into (A-l) gives o(0,z) = E1; jpg(i')gan 004149 " 99] ®Zxa 'd’x'. 2 m=1nxnmJn+l(xnm) Using J;(xm)=—J,,,(x, m)[33], and the final expression for the image charge in the beam rest frame is Jnxn( 2M) -x —"—"'|z-z'| 0(0, (-z)1t — -a—12Jpa(x' )Za cos[n(0— 0' ”20:1— Jnx( )e " d3x' (A-20) where 154 A.3 Surface charge distribution in lab frame Now that the problem has been solved in the beam frame, a relativistic transformation is made to the lab frame. The situation is that depicted in Figure A-2. K is the lab frame, where one wishes to know the surface charge distribution and K' is the beam frame, where the surface charge distribution is already known. The frame K' moves with velocity, v, relative to the K frame in the z direction. In K' , the surface charge, from (A-20), is -1 0° o'(0',z') = E2— [(3801022) an cos[n(0' —0")]. v n= 1," 0° Jn(xnm :) —-x—"fllz'—z"l 3 692 e . dx" (A-21) .(x...) ms] To get the charge distribution in the lab frame, K, make the following transformations: E, =yE; =>o=yo' r' —> r , 0' —-) 0 , r" —> r" , 0" —> 0" , z’ —> y(z— Bct) , z" —) y(z" — Bct) , d3x" —> r"dr"d¢"ydz" = yd’x" , and 155 Figure A-2: Lab and beam frame for relativistic electron beam bunch traveling down beam pipe. 156 p302") ——) pB(r",0",y(z" — Bet» where o|< and Substituting these into (A-21) gives 6(9424) = 72 lelr'xemaz" —Bct)) .. a. cos[n(e—9")] 7:3 V J( L) n xnm a -x"m|z-z“| J a 3 n _ .(X...) e dx . (A 22) a)”: m=1 In the lab frame, the bunch density distribution will be different from the bunch density distribution in the beam frame in two ways: the lab density distribution will be shorter because of length contraction, and, because of conservation of charge, it will also be more peaked. Therefore yp.(r'.e',y(z'-Bct))=p.(r'.e',z',t) (A—23) where pL(r',0',z’,t) is just the bunch density distribution in the lab frame, K. Substituting this into (A-22) and making the double primes single primes for convenience yields the final expression for the surface charge distribution in the lab frame, 157 o(0,z,t) = % IpL(r',0',z',t)ian cos[n(0 - 0')] n=0 2 V where A.4 Relativistic approximation d3x' (A-24) As a final note, a useful approximation is derived that is valid when the electron beam is highly relativistic. One definition of the Dirac delta function is lx-x'l e 8 6(x — x') 5 lim 8—90 28 Making the definition a 8 E Yxnm gives _|z-2'| 3‘ _|z-ZI -yxT"m|z-z'| _ a 6 Wm _ 2 a C E — 7X... 3 _ 7X... 22 Yxnm When 7 is large, then, one can make the approximation 158 X ~17 —'“‘l(z-2’| 3 5(2— 2'). 11m Substituting this into (A-24) gives o,(0 z,)t =--- :(‘TpL r' ,0', z' ,t)za cos[n(0- (9’)]. .2 (.4 pipe ”‘1 xnmJ run (xn From (A-13) any function of r can be expanded in the series f(r) = gAva(xm i) where am a2 2 aXJn+1 ——(——2X.,m )Jrf(r)Jn (xnm 3dr. Expanding the function we". the relation xnmJn+1 (xnm) results. Therefore, (A-25) can be approximated by 6(0, 2, t): ~ at; I pL(r’, 0', z, t ){1+2Z(— 4") cos[n(0—0')]}r'dr'd0’. area of PIPe r'dr'd0' . (A-25) 159 The term inside the parentheses is the distribution function of an infinite line charge. (See Appendix B) This is a result of the well known “pan-caking” effect when charges become highly relativistic. The electric field lines become almost perpendicular to the direction of motion. Appendix B Appendix B SURFACE CHARGE DISTRIBUTION ON INNER SURFACE OF CYLINDRICAL METAL PIPE DUE TO AN INFINITE LINE CHARGE INSIDE THE PIPE AND PARALLEL TO ITS AXIS B.l Introduction In this appendix, the distribution function for the image charge induced on the inner surface of an infinite metal pipe due to an infinite line charge is calculated. The line charge is inside the pipe and parallel to its axis. B2 Constant potential surfaces due to two infinite line charges in free space To begin, the constant potential surfaces that occur in the presence of two infinite line charges in free space are calculated. The line charges are parallel to each other. Figure B-l shows two infinite line charges perpendicular to the page and parallel to the z axis. One has a charge per unit length of it and the other —7\.. They are positioned at (0,0) and (0,d) respectively. The electric potential due to these line charges at some point (x, y) is given by <1>(x, y) = -27.1nr, + 2;. 1m, (B-l) where 160 161 7» 4» 4 d > Figure B-l: Two infinite line charges parallel to the z axis with charge per unit length it and 4., respectively. 162 r,2 = x2 «I-y2 and r22 =(x—d)2 +y2. The constant potential surfaces occur when LI- 1.2 where k is some constant. Squaring this expression leads to r,2 = kzrzz. Using (B-2) and (B-3) yields x2 +y‘2 = k2(x—d)2 +k2 2, x2 +y2 = kzx2 —2k2dx+k2d2 + k2 2, x2(1—k2)+2k2dx+ y2(1—k2) = 1862, kzd kzd2 x2 +2x1_k2 +y2 =1—k2 , k’d 1&12 ,_k2d2 k‘d’ 1_k2+(1_k2)2+y -1_k2+(1_k2)29 x2 +2x T kzd )2 + , 1842-1642 +k‘d2 y = x+1_k2 (1—k2)2 9 kzd 2 , 1(de X+1_k2 +y =‘('i:—kz—)'2-. This is the equation for a circle with its center at 03-2) (B-3) 163 kzd x0 = _1_ k2 (3'4) and Yo = 0 The radius is kd R = 1- k, . (B-S) 8.3 Electric potential from infinite line charge inside an infinite metal pipe It proves necessary to calculate the electric potential for an infinite line charge inside an infinite metal pipe before the image charge distribution can be determined. The line charge is parallel to the pipe axis. In this section, using the results just derived, the electric potential for an arbitrary point is determined for the given situation. In Figure B-2 an infinite line charge with a charge per unit length 7» is placed in a metal pipe of radius a. The line charge is parallel to the pipe axis and is located at (r',0'). Because the potential on the pipe must be a constant, an image line charge of opposite sign appears at (R,0'). In the primed coordinate system, the potential on the pipe is constant if r' is set equal to the result in (B-4), X3 = r. = _ (B-6) and the radius of the pipe is set equal to the result in (B-5) 164 constant potential Figure B-2: Infinite line charge inside an infinite metal pipe. 165 a _ kd B 7 “ 1— k2 ' ( ‘ ) Using (B-6) and (B-7) to solve for k and (1 yields 1.! k — ; (B-8) and 2 '2 d = a ,r (B-9) r Using (B-9) the radial position of the line charge 4. is given by 2 _ ,2 2 R=r'+d=r’+a ,r =a—,. (13-10) The distances from the line charges it and 4. to some point (r,0) can be determined by the law of cosines. Identifying these distances as r, and r_A , we have r: =r'2 +r2 —2rr'cos(0-0') (B-11) and r3, = R2 + r2 — 2chos(0 —0'). Substituting (B-10) into the last expression gives 4 2 r3, = 37+ r2 —2r§r—,-cos(o—0'). (13-12) The electric potential at (r,0) can be calculated using (B-l), (B-1 1) and (B-12). <1>(r,0) = —22.1r(:—:T 166 y a. a. a = —2}, lnlr'2 +r2 -2rr'cos(0—0')] 2 —lnT:;,—2"+I'2 —2r?c08(0-9')] q)(r,9) = —}.Tln[r'2 + r2 — 2rr’cos(0 -0’)] a’ a2 —1nTr7+ r2 —2r7cos(0 -0')TT (B-13) B.4 Surface charge distribution from infinite line charge inside infinite metal pipe B. 4.1 Image charge distribution Now that the electric potential is known, (B-13), the induced surface charge, 0(0) , on the inside of the pipe is given by l _. O-(9)="‘———fi E , fizf' 47: m _ '1—E _L6 27: r'2 +a2 —2ar'cos(0—0') l 2 _ '2 6(0) = — a r (B-14) 27:a r’2 +a2 —2ar'cos(0—0')° B. 4.2 Expansion of image charge distribution in Fourier series It will prove useful to expand (B-14) in a Fourier series. Making the definitions x 5 Ir: S 1 and aEO—W yields f(x,a)=1+ x21:::cosa = 2139+;(an coso: +bn cosa) (B-15) where a“27:1_f=5[ f(x,o:)coino:)d0t and bzfisz(x,a)81n(na)da. . . l 68 Evaluating the first integral, (1 - x2) 2} cos(no:)do: a" = 7: 01+x2—2xc050t (1- x2) “ cos(no:)do: = 2 I 2 7: 0 1+ x - 2xcoso: (1— x2) 7:x“ an = 2 2 (From Tables). 7: I1 —x T [T Since x is less than or equal to 1, E 1—x2=|1—x2T. . Therefore (1 - x2) 7:xn = 2x". (B-16) The second integral is (1 - X2) 2]- sin(no:)do: 7: 1+x2 —2xcoso: 0 b = - (1 2:2) [ln(1 + x2 - 2x cosa)] 27: = 0. (13-17) 0 Substituting the results in (B-16) and (B-17) and the definitions of x and or into (B-15) yields 0(9)- l a2_rv2 —--L 1+2i(r—')ncosln(0—0')l — 27:a r'2 +a2 —2ar'cos(0-0') — 27:a "=1 a ° Appendix C - 'I 9"" Appendix C VOLTAGE SIGNAL GENERATED ON OSCILLOSCOPE FROM BEAM POSITION MONITOR SIGNAL TRAN SMITTED THROUGH TRANSMISSION LINE C.l Introduction As an electron beam bunch passes through a BPM, it generates a signal on the BPM’s electrodes. This signal is transmitted by a transmission line, passed through a low-pass filter and displayed on an oscilloscope. In this appendix, an expression for the voltage signal on the oscilloscope is derived. The coupling between the electron beam and the BPM electrodes is modeled with a simple electrical circuit. C.2 General Solution In this section, the voltage signal seen by the oscilloscope is derived. This is done using a simple circuit model and the results from Appendix A. C. 2. 1 Solution to circuit model The coupling of the BPM electrodes to the beam image charge can be modeled by the circuit in Figure C-1 [17]. The image charge is represented by the current, ib. Zc is the characteristic impedance of the transmission line and Cp is the capacitance of the BPM 169 170 Transmission Line /\ K) K/ o Figure 01: Circuit model of BPM electrode coupling to electron beam. Cp is the capacitance of the BPM electrode. Zc is the characteristic impedance of the transmission line. ib represents the image induced image charge from the passing electron beam. 171 electrodes. In the frequency domain, this model is accurate to approximately 2 GHz[l6]. Beyond this, it breaks down. The relationship between voltage signal into the transmission line, VT, and the current, ib , is Taking the Fourier transform of both sides of this equation, yields VT(co) Z C Ib((o) = + ijwVT(o)) where the well known Fourier transform of a function is given by 12(0)) = If(t)e”"°'dt. Solving for VT(m) gives Zch(0)) v = —. Aw) 1+ ijch (C-l) Because the beam bunches generated by SPA are very short, a large part of the signal content is at very high frequencies. Since the model is inaccurate above 2 GHz, low-pass filters are placed on the oscillosc0pe inputs in order to ensure that the we are far from that regime. The end result is that the original signal is modified significantly by the time it is displayed on the oscilloscope. Therefore, transfer functions are assigned in the frequency domain: 0(0)) for the transmission line and A(w) for the combination low pass filter and oscilloscope. The resulting voltage signal is given by simply multiplying equation (C-l) by these transfer fimctions, yielding 172 Zch(m) WORMAQD) . V...(@) = Taking the inverse Fourier transform of this function gives 1H,*°°21(m) _,,1+j(D (DC ch o(co)A(w)ej°"d0). (C-2) v,..(t)=— C. 2.2 Expression for beam current To find an expression for Ib(a)) , one first finds the current generated by the image charge, ib(t) . It is given by the time derivative of the total amount of charge on the BPM electrode, or, 1 (t)-— [0(9, z,td tArea of Electrode The surface charge distribution for a highly relativistic beam is known from Appendix A, area of PH” o(9,,=zt) 2? I pL(r', 9',,)zt{1+2n2(r:—)n cos[n(0—9')]}l'dr'd0'. The BPMs used on SPA have square electrodes. The electrodes have longitudinal length L, longitudinal location 20 , angular width 20: and angular location 90. Integrating the expression for the surface charge distribution over the surface area of the electrodes gives “(0:21—59 :Eldezoidz I pL(r', 9' ,z,t){1+22(r: _)" cos[n(O—9')]}da' n=1 The integral over 9 is simple and results in .1 173 _1 zo+L co , n . ib(t)=;§: Idz I pL(r',6',z,t){2a+4Z(%) smnacoin(9—9')]}da'. zo area of “=1 n we Taking the Fourier transform yields _1+oo ' (1 10+]. Ib((0) = Elem m a JdZmI§L(T',9',Z,t) pipe ® {20: + 4% (—) .. Sinnn“ cos[n(9 — 9')]}da' . (03) r n-l 3 Inside equation (O3) is the expression d zo+L E lpL(r',9',z,t)dz (04) 1., Recall from equation (A-23) that z and t occur in the charge distribution together as 2 —- Bct. In other words, the density distribution function can be rewritten as pL(r',9',z,t) = pL(r’,9',z- Bct). Taking the time derivative of the distribution gives (1 d EpL(r',9',z,t) = —BcEpL(r',9',z— Bct). Therefore, if the time derivative is moved inside the integral given in (04) then +L 20d I d—tPL(r':9',Zst)dZ = ‘BC[PL(r',O',zo + L — Bct) - pL(r',G',z0 - [3a)]. 20 Then (C-3) becomes 174 Ib((1))=—§:Zlodtem"t flpL( r' ,9' ,—zo+L Bct)- pL(r', 9’ ,—z0 —Bct)] area of pipe ®{2a + 42(31131" “‘1 cos[n(9 - 9')]}da' . (C-S) As was just done for the z integral in equation (C-3), the time integral can be isolated from (OS) leaving M I = Ie‘j“‘[pL(r',9',zo + L— [3ct)—pL(r',9',z0 —Bct)}lt .20 .31 -‘3( +L)+°° '—“’—( +L-Bct) = e 1"“ 2° J‘eJ‘3c 2° pL(r',9',zo + L— Bct)dt -® J10 [Jae-(2031:) (r 0, lo Bet)dt Making the definitions: z'azo+L—Bct and 220 —Bct, gives no ml {Ezojejflcz "pL(r',9',Z" d2". :—_—e-i::(lo+I-)MD j z, :fe 3° ('r ,,z9' ')'dz +6 I= Recognizing that the two integrals are identical yields +00 ,~ “’20”. _jwz.,+1. Jm_ _Jw Je "m e 5° ‘3‘ pL(r',9’,zo+L—Bct)—e BCe BCpL(r',9',z0 —Bct) dt "l 175 ‘j—To e B“ BC [l—e-EL) IejEc-z'pL(r'ae'aZ')dZ'- I: Substituting this back into (C-5) gives 6%?“ --9_ +°° 3,. I b((1)):e 27t[l—e 19*) I da' Idz'eJ‘“ pL(r',9',z’) ® {20: + 4; ( r—Tn Sin ”0‘ cos[n(9— e H}. (06) C. 2.3 Solution Now that an expression for the current has been found, one can write the complete, general solution for the voltage signal seen by the oscilloscope. Substituting (06) into (C-2) yields 1 M"Z o(co)A(co) ~1320 43: *°° 131' _ c Be [So I I Be 7 I I vosc(t) _ 47:2 _£1+jo)CpZ, e [l-e )Iifda idz e pL(r ,9 ,z) " pipe ®{2a +4Z(a —)n Si" no” cos[n(e— 9 fined“). (C-7) n=l C.3 Approximate solution for short beam pulse In general, the analytical forms for the charge distribution and the transfer functions 0(a)) and A((o) will be unknown. What is known, however, is that the electron beam bunches from SPA are very short. The maximum expected full width at half maximum length (FWHM) is 6 mm, or 20 ps. Because of the low-pass filter that signal passes 176 through, the beam pulse is essentially a delta function longitudinally for all frequencies of interest: (.0 [dz'e”jl’3"pL(r',e',z'); [dz'pL(r',e',z') (C-8) to high accuracy. Substituting this into (07) gives vosc(t) = 211:,— ! da'sz'pL(r',9',z'){2a + 42 (13:) " sinnno: cos[n(9 — 90]} area of ~00 n--l PIPe m 4320 .0, (8 [e 9° [1_e-7EL]Zco(w)A(m) cjm‘d . C-9 27: 1+ ijch m ( ) -® CA Gaussian beam To demonstrate that (C-8) is a reasonable approximation, we will demonstrate it using a Gaussian longitudinal distribution. If the beam bunches have a Gaussian distribution longitudinally, the total beam pulse distribution is 2:2 ‘_2 e 20 pL(r',e',z')—>p,.(r'.e') 2....- From (C-8) two integrals can be defined: I. = ldz'pdrzezz'): p:(r',e') and 177 2.2 ,0) . " 2 -1—2 e 2" 1.: Jaye-Wmoaegz'):p.029»1m .. 27:6 ' Therefore, to show that (C-8) is valid, it is enough to show that a third integral, 2:2 _j£D_.z' e 202 +oo I3 = sz'e B“ —cn 27:0 ’ is very close to one for all frequencies of interest. To do I3 , first complete the square: 1 19m I = 3 2no_w Making the definition _1_ L21 2 27::3'e-2 -- —o dxfioe‘x = =e 2 9° I JZno -0 “1%)! .. ' £0). ‘[‘° )’ 27:0 1 a) 2 To see how close I 3 is to one, the function e 2(3" ) versus frequency is plotted in Figure C-2 for a beam bunch with a FWHM length of 6 mm, or 20 ps. This is the approximate maximum length beam bunch expected. The relationship between a, the rms width of the pulse, and the FWHM for a Gaussian pulse is FWHM FWHM o = 5 241n4 2.35 As can be seen, even at 1 GHz this function is very close to one. 1.0000 , 0.9998 «» 0.9996 +— 0.9994 1 0.9992 1- Function Value 0.9990 «- 0.9988 « p 0.9986 ‘ 178 1 -fl, _ A 0.9984 0.0 1.0 r 2.0 A 1 A f 3.0 4.0 5.0 6.0 7.0 8.0 9.0 10.0 Frequency in MHz 1 co Figure C-2: The function e 49° ] vs. frequency for a 6 mm, or 20 ps, FWHM long electron pulse. Appendix D Appendix D EXPANSION OF BPM SIGNAL AMPLITUDE IN CARTESIAN COORDINATES D.l Introduction In Appendix C an expression, equation (C-9), was derived for the voltage signal seen by an oscilloscope due to the signal generated in a BPM electrode by an electron beam bunch. In fact, it is the amplitude of this voltage time signal we are interested in. In this appendix, the first few terms of the amplitude in (C-9) are converted to Cartesian coordinates. These few terms are then shown to be important beam parameters. In Chapter 1, it is demonstrated how the BPM electrode signals can be exploited to measure them. D.2 Expansion of amplitude in Cartesian coordinates The amplitude in equation (O9) is A=-4—1— I da' Idz'pL( r ,,9'z ){2a+42(3a— 4..) Sinnnac04n(9— 9)]} (D-l) area of -co P'Dc in cylindrical coordinates. To change to Cartesian coordinates, start by making the substitution pL(r',9’,z') —> pL(x',y',z’). 179 180 Then, for simplicity, change the bounds on the transverse integral from being just over the beam pipe area to i 00 in x and y. This is justified because the beam is, by necessity, confined to the interior of the pipe. Including areas outside the pipe by going to :1: 00 will contribute nothing to the integral. Therefore, (D-l) becomes {em-MOM A=4'l_(x2”lpn ",,y z) -¢D-€D—® ®{2a + 42C _:..n) 8'“ "a cos[n(9— 9 )]}dx dy'dz (D-2) D.2.1 Expansion of summation term in Cartesian coordinates Looking at the summation in (D-2) out to n = 3 gives 2a+42(a -)n Sinnnacoinw— 9')]= 2a+4sinar—'cos(9— 9') + 2 sin 20:(%) 2 cos[2(9— 9' )] + -sin 3o:(a —) cos[3(9— 9’ )] + O(: —). Exploiting the relationships x' = r' cos9' and y' = r' sin9' , these terms can be written in Cartesian coordinates. Term 1: 2o: 4 sino: Term 2: 4 sino: i—cos(9 — 9') = r'[cos9' cos9 + sin9' sin9] l8l = 432nm (x' cos9 + y' sin9) I 2 . 2 2 Term 3: 2 sin 2a(£-) cos[2(9 — 9')] = 5:12 o: r'2 [cosZ9' 90529 + sin 29' sin 29] a 2 ' 2 = 8:: 0Lr'2[(cosz 9' —sin2 9')cosZ9+25in9'cos9’sin29] = 28:1220t[(x,2 -y'2)cos29 +2x'y'sin29] 4 ' 3 4 ' 3a , , Term 4: 33in3a(r:) cos[3(9—9') =38"; r"[cosB9'cos39+s1n39's1n39] = % sizga r'3[(cos3 9' — 3cos9' sin2 9')cos39 + (3cos2 9' sin9' — sin3 9')sin39] = 1;- sizga [(x'3 — 3x'y'2)cos39 + (3x'2y' — y'3)sin39] Therefore, (D-2) becomes 1 MM‘HD 4 - . A = In? jjij(x’,y',z'){2a+ 8:"! (x'cos9+ y'sm9) -ao-oo—ao 2 $211220: [(x'2 — y'2)c0829 + 2x'y' sin29] 4Sin3a I3 I I2 I2 I I3 ' +5 a3 [(x —3xy )cos39+(3x y —y )sm39] + 0(ai‘) }dx'dy'dz'. (D3). D. 2.2 Expressing amplitude as a sum of moments In Chapter 1, two averages where defined. The first is called an ensemble average. This is the average of a quantity over the beam distribution in the coordinate system 182 whose origin corresponds to the center of the beam. An ensemble average is denoted by angled brackets: j j j quantity x p(x)dV Origin corresponds to beam center llldildv ’ Origin corresponds to beam center (quantity) (D—4) where p(x) describes the electron beam’s spatial distribution. By definition =(y)=<2)=0. The second average defines the transverse, or xy, origin to correspond with the center of the beam pipe. The longitudinal, or z, origin corresponds to the longitudinal center of the beam bunch. This average will be referred to as a BPM average and is denoted in the following way: ”Iquantity x p(3‘:)dV xy origin corresponds to beam pipe center. 2 origin to beam bunch center llldildv xy origin corresponds to beam pipe center, 2 origin to beam bunch ccnte (quantity) am a (D'S) The average values of x and y with this definition yield the x and y position of the center of the beam with respect to the beam pipe and (z) = 0. The first integral in (D-3) is j I ij(x',y',z')dx'dy'dz' = q, where q is the total charge in the pulse. This is by definition of the beam bunch distribution function. The other integrals in (D-3) are BPM averages defined by (D-5) and multiplied by q. That is 183 l 4sino: , A = 47:2 {20: + a QBm cos9 + qBPM s1n9) 23i a 2 + 2 0‘ [q(BPM _ BPM )c0529 + 2qBPM sin29] 4 ' 3 + 3 81:3 a [q(BPM — 3BPM )COS39 + q(3 BPM — BPM)Sin 39] +091 The primes have been dropped for convenience. Typically, the x and y center positions of the beam, given by (x)BPM and 9m are denoted by x and y, respectively. Therefore, this becomes 4 . A = %{2a + L?E(2cos9 + Vsin9) 2 srr122a [((x2 >9m — (y2 >9m )c0529 + 2 BPM sin 29] a 4 ' 3 - + 3 81:3 o: [((x3 >9m - 39m)°°S3e + (3(x2y)BPM — BPM)s1n 39] +o(;1—,-)}. (D-6) The term (x2)BPM — 9m in (D-6) is given special treatment. Let us look at the integral of x2 over the beam bunch density distribution. M44344) WWW LHXZPJXJ, z)dxdydz = Lulfi — 2x2 + 2x2 + 22 — x2)pL(x,y,z)dxdydz = [flux—XV +2xx—x2]pL(x,y,z)dxdydz "Q—Q—Q r‘,-*1 184 = q[<(x — 302 >am + x2 ]. Because of the definitions of the ensemble and BPM averages given in (D-4) and (D-S), subtracting the term 2 from x inside the angle brackets changes the BPM average to an ensemble average. That is 92>...aka-92>...921992922). Similarly q(y2 lam = q[<(y - imam + Y2] = q((y2)+ Y2 ) Therefore, Appendix E Appendix E FIRST ORDER CALCULATION OF THE TRAJECTORY OF AN ELECTRON DUE TO IDEAL FAST DEFLECTOR FIELDS E.1 Introduction A fast deflector is a cylindrical cavity operating in a TMno mode. In this mode the dominant field is a time varying dipole field transverse to the z direction. This is shown to be true in the first part of this appendix. In the second part the trajectory of a relativistic electron through this dipole field is calculated to first order. E.2 Electric and magnetic fields of fast deflector The fast deflector is a cylindrical cavity that Operates in a TM“0 mode. A schematic is shown in Figure E-l. The ideal electric and magnetic fields are E, = EOJ,(k,,r)cos9cos(mt+¢), (E-l) a2 . . Br = a) 2217c,- E0J1(k“r) sm9 s1n((ot + (b) (E-2) and B, = (o x—ac—,E,J;(knr)cos9sin(wt + 4)). (13-3) All other field components are zero. The constant kH is defined as 185 538 .880:ch “mam mo oumaosom ”Tm 2:me 186 187 x a where xll , equal to 3.8317, is the first zero of the first Bessel fimction and a is the radius of the cavity. The angular frequency, (9, is given by a) = 27:f where the frequency, f, is 1300 MHz for our cavity. The relationship between the angular frequency and the geometrical properties of the cavity is a) = knc. Therefore, the cavity radius is a-Efi-flfi-OMm - a) —27:f-' ' The length of the cavity, L, is independent of frequency and on SPA measures 14.48 cm. The maximum amplitude of the electric field, E0, is 24MV/m, from measurement. The kinetic energy of the electrons as they enter the cavity will be approximately 8 MeV. The aperture of the cavity, the opening that the beam travels through, is one inch in diameter, or 1.27 cm in radius. E.3 Transformation of fields to Cartesian coordinates The magnetic field vector is given by 1‘3 = 133+ B99+Bzi = 13,? + 13,9 where B2 = 0. The relationships between the cylindrical coordinate unit vectors and the Cartesian unit vectors are 188 f: 710089 + ysin9 and 9 = —xsin9 + ycos9. Therefore, B = B,(xcos9 + ysin9)+ Be(— xsin9 + ycos9) = 52(BIr cos9 — B6 sin9) + 9(13, sin9 + B6 c059). This gives Bx = B, cos9 — B9 sin9 (E4) and By = B, sin9 + B9 cos9. (E-S) Substituting (E-2) and (E-3) into (E-4) gives 2 13K = [to —5a-—2-J,(knr)E0 sin9cos9 - a) ——a-7J;(k”r)Eo sin9cos9]sin((ot + (b) xnrc xnc 80) = WED sin29[x—:;J,(k”r)— J{(k”r)]sin(rot + (1)). A property of Bessel functions is xJ{(x) = J,(x) — xJ2(x) [33]. Therefore, 11(X) X J;(x)= —-Jz(x). Remembering that 189 xnr knr knr - 12(knr) Therefore 13, = £7J2(knr)Eo sin29sin(mt+¢). (E-6) 11 Substituting (E-2) and (E-3) into (E-S) gives 2 B, = [9;2a—m7EoJi(knr)sin2 9 +9 x11. E.J:(k..r)cosz ejsintnt + 9) ma Eo[;3—J,(knr)sin2 9 + J{(k”r)cos2 9] sin((ot + 11>). 2 xllc 111. Using J{(k”r) = ;a—rJ,(kllr)—J2(knr) ll gives By = xi; Eo[fI-;J,(knr)sin2 9 +;:—IJ,(knr)cosz 9 -J,(k,,r)cos2 9) sin(o)t + ¢) 13y = $Eo(fi;ll(knr)—J,(k,lr)cosz 9] sin((ot + 4)). (E-7) The Bessel functions J , (knr) and J 2(knr) can be written as infinite series. The first 190 terms of these series are a: 2 and l 2 §(k”r) 7 respectively. The value of kll is x11 -1 kll = —— = 0.2737 cm . a The electrons are limited to the region defined by the aperture through which they enter the cavity. If these two functions are plotted versus radius as in Figure E-2, it is apparent that the first term is a very good approximation of the full Bessel fimction in each case when the maximum value of the radius is limited to the value of the aperture radius, 1.27 cm. Therefore, (E-l), (E-6) and (E-7) become k E, E Eo-—2]-'-xcos(mt+¢) , (E-8) an) 1 . COX . Bx 5 :1? E0 Zkflxy srn(cot + o) = 4an ony srn(0)t + 4)) (E-9) and B = —‘°a—E (1— ixzj sin(mt + M (13-10) V _ 2xnc2 0 4a2 ' The y magnetic field, given in (E-lO), has a small quadratic term. However, as can be seen in Figure E-3, this results in, perhaps, a three percent variation in field strength along 191 0150‘” 0.040" 0.020 " P 4P qt- '11- y. ~41- b 1.. 0.(X)0 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 Radius (cm) a) 0.8 0.9 1.0 l . 1 1.2 0.019 0.014 1 0.012 1 0.010 7 0.(X)8 ‘ Function Values 0.“)6 i- 0W4 '1‘ 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 Radius (cm) b) 0.8 0.9 1.0 1.1 1.2 1: Figure E-2: a) J,(k“r) (blue) and 421: (red) versus radius. b) J 2(knr) (blue) and 1 -8-(l:nr)2 (red) versus radius. 192 1.000 , 0.995 ._ 0.990 ._ 0.935 -. 0.930 4. 0.975 , 0.970 4 ~ Function Value 0.965 -» 0.960 .. 0.955 T 0.950 : : : 1e : : : : : : t t 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 x (cm) 2 _ ll 2 4a2 Figure E3: 1 vs. x (cm). 193 the x axis. Therefore, this term will also be dropped, leaving B ~—2a—E ' ,zzxnc, osrn(0)t+¢). (13-11) E.4 Demonstration of dominant field Of the three field components present inside the fast deflector cavity, it is the y magnetic field given in (E-l 1) that has the dominant effect. This can be seen if we first calculate the magnitude of the ratio of the x magnetic field to the y magnetic field. Using (E-9) and (E-l 1) this is (0X11 B, < gacz onmaxymx _ xflrjm _ (3.8317)’(1.27cm)2 _ 0 03 lByl- C03 E _ 2a2 _ 4(14.Ocm)2 _ ° ° 2xnc2 0 Therefore, the x magnetic field magnitude will be, at most, three percent of the y magnetic field. Therefore, the x magnetic field can be ignored. To demonstrate that the electric field can also be ignored, an estimate of an electron’s energy change as it passes through the cavity is necessary. Since the fast deflector cavity is not intended to give, or take, energy from the electrons, it is expected that this change will be slight. The equation of motion for the longitudinal direction is d , _ __ 5(sz)-qEz — eEz Since the electron are already highly relativistic, the longitudinal velocity will not change substantially. Therefore, 194 d'z -—=0 dt leaving and substituting (E-8) for E2 gives dy _eE ok,___,_x dt — 200m ——cos(0ot+¢). To estimate the energy change, the time dependence of x will be assumed to be constant. This makes integrating this equation trivial: eEoknx sin(0)t + ‘1’) 213cm 0) AYE- Gigi: Yout —Yin in tin The time that an electron exits the cavity, tom, is equal to the time that it enters the cavity, tin, plus the time it takes for it to traverse the fast deflector. Therefore 1,, at, +£ _ BC and A ~_eEok11X . [I +_L_)+ _ . ( t + ) (E12) y: 20cm00 srnro in [30 ¢ srn00in :1) . - For a given electric field amplitude, it is easy to find the maximum energy change from (E-12). Figure E—4 shows the maximum relative change in gamma versus x for an 8 MeV electron when E0 is set to its maximum value of 24 MV/m. The largest relative energy 195 1.000 « 0.995 ~ 0.990 . » 0.985 «» 0.980 - 0.975 « » 0.970 -~ 0.965 . » l 0 - Fractional Energy Change 0.960 < - 0.955 ~ » 0.950 ‘. : 4 .T 0.0 0.1 0.2 0.3 0.4 0.5 0.6 x (cm) A Figure E-4: 77- vs. x (cm) for an 8 MeV electron. 0.7 0.8 0.9 1.0 a". ' 196 change is about four percent near the edge of the aperture. Since the energy change will generally be much smaller than this, the electric field can also be neglected. E.5 Solution to the first. order equations of motion If only the y magnetic field in (E-l 1) is kept, we are left with a simple equation of motion: ! . '.....- l- q (1 .~. a—t-(me) = —q'sz = esz. ' Substituting (El 1) into this equation and setting ymii = $5213;on sin(o)t + ¢). (E-13) To solve (E-13), we will first change to more useful coordinates. First, a‘aa'za‘ma- Therefore 2 dzx ma , ym(Bc) y = eBCmEO sm((ot + 4)) , or e cm H = E ' t . x Bymc 2x110, 0 sm((n + ¢) The value of t is given by 197 t _ a _ [30 , where z is the electron’s longitudinal location and Be its longitudinal velocity. It will be defined that 2 equal to zero is the entrance to the fast deflector cavity. Therefore e ma (oz " :: E o —+ . E-14 x Bymc 2xnc2 0 sm[ BC (1)) ( ) It is easy to integrate (E-l4). Doing this yields 6 3 (DZ X'(Z) = _‘Y_1;-2-:CZ— E0 005(13:+ 4)] + C1, (E-IS) where cl is a constant. Integrating again gives x(z) = _i a Be, 032 mmEogsm —+¢ +ClZ+C2, (E-16) [3c where c2 is also a constant. The position and divergence of the electron at the fast deflector cavity entrance are defined as xi 2 x(0) and x; 5 x'(0) . Substituting these values into (E-15) and (E-16) and solving for the constants c1 and c2 results in a el = x.' +-— x c2 EO cos¢ (E-17) and 198 —sin¢. (5'13) E.6 Electron position and divergence at exit of fast deflector cavity In practice, we are not concerned very much with the trajectory of the electrons through the fast deflector. It is the final trajectory, at the cavity exit, that is more important. Also, since the electrons will always be part of a beam bunch, the notation used to this point needs to be modified slightly. At the exit to the fast deflector cavity, 2 is equal to L, the cavity length. Using (E-l 5) and (E-16), the position and divergence of the electron at the cavity exit are given by e a Bc _ 03L XL = X(L) = ——'YI;2X”CZ E0 ES"{E;+¢) +CIL+C2 (E-19) and x' - x'(L) - -—-e——a—-E c049£+¢j + c (E-ZO) L ym anc2 0 [3c " The phase angle, ‘1’: can be rewritten as = in) + M + 4).. The angle (ho + A4) is defined as the phase of the beam bunch center with respect to the cavity fields. The angle A4) is included for calibration purposes. Its magnitude is defined to be much less than one. The angle 4), is defined as the phase of a particular electron in the bunch with respect to (to + Ad). As mentioned in Chapter 1, the beam bunches on SPA are 6 mm F WHM in length or less. This is a time duration of 20 ps. At the frequency 1300 MHz, then, the magnitude 199 of (b, will be [4),] _<_ (10 ps)(21tf) = 0.082 . Therefore, <<1 IA¢+¢. and one can make the following approximations: and wL (0L COS(E+¢O +A¢ +¢zj = COS(E+¢O) 005(A¢+¢z) _S'm(CE—:’+¢0) sin(A¢+¢z), =cos(9£+¢ )[l—(A¢+¢ )2]—sin(gli+¢ )[(A¢+¢ )‘(M’Hl’ )3] _ BC 0 2 BC 0 z z cos(c;—:+¢O +134; 4.4),) z cos(%+¢0) —(A¢+¢,)sm(%+¢,], (5-21) , mL . (0L smlgwo + 13¢ W.) = smlgwo) COSW’ +¢zl +cos(m—L-+¢ )sin(A¢+¢ ) BC ° ‘ ’ sin(%cli+¢o + Ad) +45) 5 sin((;—:'+¢O) +(A¢ +¢z)cos(%:;+ (be) , (E-22) cos¢ = cos(d>o + M) + (bl) = coscb0 cos(A¢ + 92)‘ sim1>0 sin(A¢ + (1),), cos¢ s 005% — (mp + ¢z)sin¢0 (13-23) 200 sin¢ = sin(0 +(A¢+¢z)cos¢0. (E-24) Substituting (E-Zl), (E-22), (E-23) and (E-24) into (E-17), (E-18), (E-19) and (E-20) yields . L L x, = _%fiao%[sm[%;+¢ol +(A¢+¢.)cos(-“§;+¢ol] l .40..-.wmwl fifi‘aofiglsiwo+ol , e a BC . (0L . (0L xL = Xi + LXi +RmEo ;{Sm¢o +Ecos¢o “Sln(—B;+¢o) + (A4) + ¢Z)[cos¢o —:—:sin¢o - COS[% + 90):” , and e a (0L xi, = X: +;m—2x”c2 Eo{cos¢o “003(B_c+¢o] +(A¢ +¢z)[8in((g_:+¢°l — studio}. Appendix F Appendix F COVARIANCE MATRIX AND THE STANDARD ERROR IN THE CALCULATION OF THE EMITTANCE F.1 Introduction As demonstrated in Chapter 2, the rms beam parameters, (x2), , (xx') , , -2 (F-n and 8y J2 . (F-2) In this appendix, expressions for the standard errors for the rms beam parameters and the x and y rms emittances are derived. The standard errors in rrns beam parameters are determined from the well known covariance matrix[34]. The expressions for the standard errors for the x and y rrns emittances were first demonstrated by Miller et al.[12]. 201 202 F.2 Estimating measurement errors In this section, an estimate for the measurement errors in a linear set of equations is derived. It is assumed that these errors are normally distributed. Assume the general matrix equation, Ax = b , where A has m rows and n columns, i has dimension n and B has dimension m. The vector 5 is determined by measurement. Therefore, there will be some standard error, 0', associated with the individual entries of 5. Although it might be true that the value of this error is well known from the measurement process, it can also be estimated from the data. Assume that m > n and A is of rank n. To solve for 'x’ , first multiply both sides by the transpose of A , leaving TB. >u TX:— >1: AT; is a positive definite square matrix and can be inverted. Multiplying both sides of the equation by its inverse gives .4 The matrix AT; has a set of n eigenvectors v, defined by 1:: _. ATb. >1: 1;) and Al: F. ' 203 where A, is the corresponding eigenvalue. The set of v, ’s form an orthonormal basis in the space spanned by it. Therefore, one can write x and the vector ATE as linear combinations of the eigenvectors: n i = Z civ, (F-3) i=1 where the constants, ci , are defined by the dot product ‘ i-vi, Ci and where Dotting '9, into both sides, v, (2mm) = cjkj = Vi (Edith) = dj, i=1 i=1 substituting in the expression for d j and solving for c j gives J Using (F -3) gives 204 v. . (F-4) .l .. (3TB) - v, H 7L]- The vector 5 can be rewritten as B = 50 + 5,. The vector 50 is the ideal value of [3. The vector 6,, contains the errors associated with 5. Substituting this into (F -4) gives n 3TB ‘ l.‘ a TB -‘. n K" -‘. i=x0+éx=z[ (28") vjvj=Z—( 1°) v’v,+Z———( 2’) ’vj. i=1 1' i=1 j i=1 j So, the ideal value of x is II 1:15 -‘. j-r( X0.) vjvj J X0: and its error is given by n =T‘ -" a, = 1:21ij . (F-S) J Because a, is unknown, 'e‘ll is also unknown. However, ‘e‘, can be estimated. To do this, start by recognizing that (ital-(git) = Sallie), = ViiT=vj = HIV. (Xvi).(.ivj) = it, NOW, we make the definition that there is a set of m orthonormal vectors, 2, , that span the space of 5. The first 11 of these vectors are defined by 205 gi E lAv:| = J7: . (F-6) 6.. = Zatz. (F-7) where 'é,= in. (F-8) i=1 7% ’ Bydefinition -T=T=‘ =_. _ _=_ viAAv. (ATgi)-v12g;r VlzTL, when is n and (Talia, =0 when i > 11. Substituting these results into (F -8) gives t=ziaf—,—v '1 =2f (M) j=l i-l jsl Each element of 6,, is the error in the measurement of the corresponding element of 5. Assume that these errors are normal and, on average, equal. Then the magnitude of ZCNS the vector 'éb is |'é,|=,/é,-'é, st 2 =05 where o is the average measurement error. Using (F -9) one gets =lzagl [Easy-l iaj Em i=| Therefore, on average, 2 2 — ‘ ‘ ~ 2 aj =(eb -g,) :0. The vector 5 can also be expanded as a sum of g, ’s. b: i“ gi)gi =1 ZG'EE = filo-50 +éb)'§a]§t , i=1 I=l 2(5.gi)g =Z[(b +6, )g,]gi+ 210% +éb).gi]§i. i=l i=1 i-n+ Because 50 is perpendicular to g, when i > m, 2;.(5 °§i)§i = 20; ii); + iéltéb 'gi)§i a or b- (52.)E= 266.. 202: is al i-n+l Taking the square of both sides and using (F-IO) yields [B-i(fi-g,)§,]z = m, -g,)2 Etna—w. i=1 i=n+l (F-lO) 207 Therefore 62; 1 [B—Z(B-g.)g,]2. (F-lO) m—n i=1 By the definition in (F-6), (5 ' gi)gi = [iTvi Kim)- Since 31%, is a constant, (B - g); = (3v,)iTv, = A9,??? = 3(v, -v,)i, -. —. (Bale. -- Ai- Putting this into (F -10) yields 2 1 m-n III 0' [B— ‘]2 (F-ll) F.3 Covariance matrix In this section the Covariance matrix is defined and its relationship with the estimated errors in the components of i is established To begin, define the matrix 208 i E : = -| (ATA) . The n eigenvectors of the matrix ATA can be written as (V0 Viz \ (XX") <6: 3 . (F-16) (w’) < yr2>) MI W N K From the elements of i , the x and y rms emittances are calculated according to (F-l) and 210 (F -2). In this section the errors in the emittances are estimated. To begin, from (F -1), the x emittance squared is 82 = (x2>— (xx’)2 = x1x3 -— x; where x1, x2 and x3 are the first three elements of the vector i given in (F-l6). Recall that we can write i = i0 + "éll , then 2 2 3x = (x0: + ex] Xxos + 6x3)“ (x02 + 6x2) - Multiplying this out, 8i = me03 _ X32 + XOlex3 + xoaexi + exlex3 - 2x026x2 _ 6:2 - (F’17) The first two terms in give the actual, or ideal, emittance 8:0 = x017%3 " X32- The remaining terms give the error in the emittance estimate. To find a value for the emittance error, first make the substitutions x0l —> xl , x02 —> x2 and x03 —> x3. Since x01, x02 and x03 are unknown, they are replaced with x1 , x2 and x3 , the best estimate of their values. Then, from (F -17), the error in the emittance squared is ~ 2 errei = x1e“3 + x3e“ +ex|ex3 —2x2ex2 —ex2. 211 This can be divided into two terms: err82 -:- term1+ term2 , where _ 2 terrnl — exle,‘3 — ex2 and term2 = xlex3 + x3e“ -2x2ex2. From (F-9), {exl ex2 . 6 a v 1". = _Z i i . j l A) le6) Substituting this into (F -l 9) and (F -20) gives ‘:“““l.-1J"‘ll§J-’-’l léi—fil and For terrnl , we have tam-l.l—’fll27-l list—l (F-18) (F-19) (F-ZO) Since one can only estimate the magnitude of aJ. and ai using (F-10), terrnl cannot be reduced any further. However, its magnitude can be estimated by adding in quadrature. That is 6 6 termlzz 22 j=l i=1 0...“ a. 2 jX"(Vj1Vi3 _ ijViZ) :ylfa 4 6 G 2 22th (VJJsz3 -J.2v 1iv 3vj sz 2+vJ.2vJ22) i=1 j ' Ill 6 .31 J 6 2 6 6 ~ 2 vi! 2 V_i3)_ 2[ 2 V__jlvj2][ 2 Vi__2___Vi3] = 0' 0' 0' 0' [ g— :]( isl A’i j=l A" iszlfl A. 6 v2 _J_ 622%(0 22 _i_V2) i=1 j is] A'i The terms in parentheses can be identified as elements of the covariance matrix, (F-13). Therefore terrnl2 E CJJC33 —2CJ2C23 +C22C22 = CJJC33 +C§2 —2C12C23. (F-21) For term2 we have tenn2=x1[26:a’:-—i]+x3[za ’ —:—:l]— 2x2[:ajvj2:l J— ,. . J? a 6 J =Z—(x vJ.3 +x 3VJJ— —2x2vJ.2). J=l A'j 213 This can also be estimated by adding in quadrature: 2 ° 2 —-J —2 v (xlvj3 +x3vjl x2 jz) trm22_==. e X,- 6 a PI 0,2 2 2 2 2 2 2 (xlvj3 +2xlvj3x3vj, —4x,vj3x2vj2 +x3vjl —4x3vj,x2vj2 +4x2vj2) J III EM] >’ Ill 6 v? 6 v.v. 6 v. v. X26322?) +2x1x3[022_1 ’3] —4x1x2[622—: J3] i=1 1' j i=1 ,- i=1 6 v? 6 v. v. 6 v? + xiozzl—Jj -4x2x3[622-3;:f’3-] +4x§(GZZf-]. 1“ J H J J=1 J The summation terms can again be identified as elements of the covariance matrix, 63 , yielding term22 5 xfC33 + x§C11+4x§C22 +2xlx2C13 —4x,x2C23 —4x2x3C,2. (F-22) Since (F -21) and (F -22) are estimates of the magnitude of terml and term2, they cannot be substituting into (F -1 8) to get the error in the emittance squared. However, by again adding in quadrature, the magnitude of err£2 can be estimated: err:2 s terml2 + term22 5 xfC33 + ngH +4x§C22 +2xlx2CI3 —4x,x2C23 -4x2x3C12 + C11C33 + C22 - 2C12(323 Therefore, 2 _ 2 2 ex —x,x3—x2 j: errei , 214 a: = 2 i(2C33 +zcn +42C22 +2C13 l —4C23 —4C12 +C11C33 + ng _2C12C23 )3 The emittance is then 8x = J-(xx')ierrei , 811', 8x = \sz)-(xx')\/1:t (XZXX'ZSx-(xx’) ' When the emittance is significantly bigger than the error, |' err8i 8): = J-(xx'>lli 2(_(xx'))i, 2 ’2-xx’2i 1 x22 +x'22 3x=\/ < > 2JC33 < >Cu +42C22 +2C13 —4(xx')C23 _4C‘2 1 + C11C33 + C22 — 2C12(323 )5- Through a similar procedure, the y emittance can be found to be _ 2 ,2 _ , 2 + 1 2 2 + '2 2 44 e,_J -2J_,( c, c +42C« +2C46 -4C4s l +C,,C66 +C§, —2c,,c,,)5. REFERENCES ”'4 '. shiny-1 REFERENCES [1] R. Warren, “Star Wars and The FEL,” (private communication). [2] C. A. Brau, Free-Electron Lasers, (Academic Press, Sand Diego, CA, 1990). [3] J. M. J. Madey, “Stimulated Emission of Bremsstrahlung in a Periodic Magnetic Field,” .1. Appl. Phys. 42, 1906 (1971). [4] J. S. Fraser, R. L. Sheffield, E. R. Gray, P. M. Giles, R. W. Springer and V. A. Loebs, “Photocathodes in Accelerator Applications,” Proceedings of the 1987 Particle Accelerator Conference, IEEE catalog No. 87CH2387-9, 1705 (IEEE, New York, 1987) [5] J. S. Fraser and Richard L. Sheffield, “High-Brightness Injectors for RF-Driven Free- Electron Lasers,” IEEE J. Quantum Electron. 23, 1489 (1987). [6] M. Reiser, Theory and Design of Charged Particle Beams, (John Wiley & Sons, New York, NY, 1994). [7] P. J. Tallerico and Jean-Pierre Coulon, “Computer Simulation of the Lasertron With a Ring Model,” Proceedings of the 1987 Particle Accelerator Conference, IEEE catalog No. 87CH2387-9, 1806 (IEEE, New York, 1987). [8] B. E. Carlsten and S. J. Russell, “Subpicosecond compression of 0.1-1 nC electron bunches with a magnetic chicane at 8 MeV,” Phys. Rev. E 53, 2072 (1996). [9] B. E. Carlsten, J. C. Goldstein, P. G. O’Shea and E. J. Pitcher, “Measuring Emittance of Non-thermalizcd Electron Beams From Photoinj ectors,” Nucl. Instrum. Phys. Res. A 331, 791 (1993). [10] K. Kim, “RF and Space Charge Effects in Laser-driven RF Electron Guns, “ Nucl. Instrum. Phys. Res. A 275, 201 (1989). [11] R. T. Avery, A. Faltens and E. C. Hartwig, “Non-intercepting Monitor for Beam Current and Position,” IEEE Tans. Nucl. Sci. 18, 920 (1971). 215 216 [12] R. H. Miller, J. E. Clendenin, M. B. James, J. C. Sheppard, “Non-intercepting Emittance Monitor,” Proceedings of the 12”? International Conference on High Energy Accelerators, 602 (Fermilab, 1983). [13] B. E. Carlsten, S. J. Russell, J. M. Kinross-Wright, M. Weber, J. G. Plato, M. L. Milder, R. Cooper and R. Sturges, “Subpicosecond Compression Experiments at Los Alamos National Laboratory,” Proceedings of the Micro Bunches Workshop, AIP Conf. Proc. 367, 21 (AIP, Upton, NY, 1995). [14] W. D. Cornelius, S. Bender, K. Meir, L. E. Thode and J. M. Watson, “The Los Alamos High Brightness Accelerator FEL (HIBAF) Facility,” Nucl. Instum. Methods Phys. Res. A 296, 251 (1990). [15] B. E. Carlsten, “Calculation of the noninertial space-charge force and the coherent synchrotron radiation force for short electron bunches in circular motion using the retarded Green’s fimction technique,” Phys. Rev. E 54, 838 (1996). [16] J. D. Gilpatrick, J. F. Power, R. E. Meyer and C. R. Rose, “Design and Operation of Button-Probe, Beam-Position Measurements,” Proceedings of the 1993 Particle Accelerator Conference, IEEE catalog No. 93CH3279-7, 2334 (IEEE, New York, 1993). [17] J. D. Gilpatrick, H. Marquez, J. Power and V. Yuan, “Design and Operation of a Bunched-Beam, Phase-Spread Measurement”, Proceedings of the 1992 Linear Accelerator Conference, AECL catalog No. 10728, 359 (AECL Research, Chalk River, Ontario, Canada, 1992). [18] K. L. Brown and R. V. Servranckx, “First- and Second-Order Charged Particle Optics,” Presented at the 3"‘1 Summer School on High Energy Particle Accelerators July 6-16, (Brookhaven National Laboratory, Upton, NY, 1983). [19] S. J. Russell and B. E. Carlsten, “Measuring Emittance Using Beam Position Monitors,” Proceedings of the 1993 Particle Accelerator Conference, IEEE catalog No. 93CH3279-7, 2537 (IEEE, New York, 1993). [20] G. Strang, Linear Algebra and its Applications, Second Addition, (Academic Press, Orlando, FL, 1980). [21] L. M. Young, (private communication). [22] K. R. Crandall and D. P. Rusthoi, “Trace3-D Documentation,” Los Alamos National Laboratory report, LA-UR-90—4146 (1990). 217 [23] J. F. Power, J. D. Gilpatrick, F. Neri and R. B. Shurter, “Characterization of Beam Position Monitors in Two-Dimensions,” Proceedings of the 1992 Linear Accelerator Conference, AECL catalog No. 10728, 362 (AECL Research, Chalk River, Ontario, Canada, 1992). [24] R. E. Shafer, “Beam Position Monitoring,” Proceedings of the 1989 Accelerator Instrumentation Workshop (Brookhaven National Laboratory), AIP Conference Proceedings 212, (AIP, Upton, NY, 1989). [25] J. D. Gilpatrick, J. Power, F. D. Wells and R. B. Shurter, “Microstrip Probe Electronics,” Los Alamos National Laboratory document, LA-CP-89-488 (1989). [26] J. D. Gilpatrick and F. D. Wells, “Double Balanced Mixer Operation used as Phase and Synchronous Detector as Applied to Beam Position and Intensity Measurements,” Los Alamos National Laboratory document, LA-UR-93-l622 (1992). [27] J. D. Gilpatrick, “Microstrip Measurement Algorithms,” Los Alamos National Laboratory document, LA-UR-93-1639 (1992). [28] P. R. Cameron, M. C. Grau, M. Morvillo, T. J. Shea and R. E. Sikora, “RHIC Beam Position Monitor Characterization,” Proceedings of the 1995 Particle Accelerator Conference and International Conference on High-Energy Accelerators, IEEE catalog No. 95CH35843, 2458 (IEEE, New York, 1996). [29] J. A. Cadzow, Discrete-Time Systems, (Prentice-Hall, Inc., Englewood Cliffs, NJ, 1973) [30] D. W. Feldman, S. C. Bender, B. E. Carlsten, J. Early, R. B. Feldman, W. J. D. Johnson, A. H. Lumpkin, P. G. O’Shea, W. E. Stein, R. L. Sheffield and L. M. Young, “Experimental Results from the Los Alamos FEL Photoinjector,” IEEE J. Quantum Electron. 27, 2636 (1991). [31] W. R. Smythe, Static and Dynamic Electricity, (McGraw-Hill Book Company, Inc., New York, NY, 1939). [32] J. D. Jackson, Classical Electroaynamics, 2nd Edition, (John Wiley & Sons, Inc., New York, NY, 1975). [3 3] W. H. Beyer, Editor, CRC Standard Mathematical Tables and Formulae, 29’h Edition, (CRC Press, Inc., Boca Raton, FL, 1991). [34] W. H. Press, S. A. Teukolsky, W. T. Vettering and B. P. Flannery, Numerical Recipes in FORTRAN, The Art of Scientific Computing, Second Edition, (Cambridge University Press, New York, NY, 1992). "‘11111111111in