Efficient techniques for modeling and mitigation of soft errors in nanometer-scale static CMOS logic circuits

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Krishnamohan, Srivathsan

Date Published: 2005

Subjects: Metal oxide semiconductors, Complementary
Transients (Electricity)

Program of Study: Electrical and Computer Engineering

Degree Level: Doctoral

Language: English

Pages: xii, 125 pages

Permalink: https://doi.org/doi:10.25335/tmqs-yn60

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