133 252 AN ‘M'ERFERENCE METHOD OF MEASURWG LONG DISTANCES THESIS FOR THE DEGREE OF M. 8. Stuart Hay Chamberlain 1930 . '(K‘Wt' ~ I z I I II 3 II I .I MICHIGAN STATE UNIVERSITY LIBRARIES I III III III IIIIIIIIII 1293 01701 4808 II. I l'" 1r- . \"ufi . a ' ' o _ LIBRARY . ‘ . Michigan State , .‘ . University . . . x ‘nt 1 'r:1 1‘ -I:'.!"::";!""v. _7 .‘4:‘ _« fl-Q‘ ‘ ¢.zy,:+s:.‘-E-:x-,;~ .1 PLACE IN RETURN BOX to remove this checkout from your record. TO AVOID FINES return on or before date due. MAY BE RECALLED with earlier due date if requested. DATE DUE DATE DUE DATE DUE we campus-p.14 AN INTERFERENCE‘METHOD OF MEASURING LONG DISTANCES Thesis for Degree of M.S. Stuart Hay Chamberlain 1936: M 5‘, I desire to express my appreciation to my teacher, Dr. C. W. Chamberlain, who suggested the solution of the problem of employing waves of light for measuring long distances, gave invaluable aid during the progress of the research, and provided most of the instrumental equipment required. I wish to thank Professor 0. W. Chapman, who made possible the undertaking of this problem, for his unfailing kindness, encouragement, and assistance. I also wish to thank Professor W. E. Laycock for his valuable assistance in the preparation of photographs. 94630. The purpose of this thesis is to outline the present status of the art of measuring distance and the limitations of the instruments and methods employed. These limitations, determined by the physical prOperties of the materials from which the standards of length are constructed and the finite length of the waves of light employed in all Optical instruments, cannot be overcome by the methods now employed. Advance can be made along the lines described for the first time in this thesis. The finite length of the light wave, a handicap in all instruments employing lenses, is turned to practical account by making it the unit of measurement; thus securing an ideal standard of length, possessing none of the limitations of present standards. The thesis describes an original type of instrument, capable of measuring distances, small and great, with an accuracy and convenience of Operation hitherto unattained. Contents Present Methods of Measuring Distance and their Limitations Chaining Page 1. Traversing Page 2. Minor and Grand Triangulation Page 3. The Telesc0pe as a Distance Measurer Tacheometer Page 4. Subtense Theodolite Page 5. Cleps Page 5. Omnimeter Page 6. Range Finding Telemeter Page 6. Mekometer Page 7. Range Finder Page 7. Light Waves as Standards of Length Page 8. Conditions Necessary for Production of Interference of Light Page 9. Methods of Producing Interference Page 9. Interference of the First Class Page 10. Interference of the Second Class Page 12. Interference of the Third Class Page 13. No Solution Possible with Any Known Type of Interference. A New Type of Interference: Fourth Class The Diffractometer Page 16. A New Type of Interference: Fifth Class The Recording Interferometer Page 18. Contents - concluded Calibration of the Recording Interferometer Measurement of Distance by Means of Light Waves Advantages to be Gained. Difficulties to be Surmounted. Statement of the Problem Problem Solved by a Combination of Fizeau and Recording Interference Fringes Description of Instruments Method of Making Measurements Adjustment of Interference System Setting on a Distant Mirror Calibration of the Instrument Measuring a Long Distance Data Conclusion Bibliography. 19. 25. 30. 30. 32. 37. 40. 41. 42. 44. 46. PLATE I : PLATE II : Plate III : PLATE IV : PLATE V : PLATE VI : PLATE VII 3 PLATE VIII : PLATE IX : TABLE I TABLE II TABLE III Illustrations Michelson's Measurement of the Meter Wave Length Comparator at National Physical Laboratory The Diffractometer The Recording Interferometer Photograph of Recording Fringes Interference Method of Measuring Distance Along a Beam of Light Transmitting Apparatus: lst Arrangement Receiving Apparatus: lst Arrangement Final Transmitting and Receiving Apparatus Tables Facing Facing Facing Facing Facing Facing Facing Facing Facing page page page page Page Page 8. 16. 18. 32. 35. 35. 36. 38. 44. 44. Present Methods Of Measuring Distance and their Limitations Chaining In making linear measurements with great accuracy rods of glass or metalhave been employed; their lengths being known at a given temperature and corrections applied for variations from the standard temperature. Occasionally compensated rods made of two metals have been used. The most approved method (sepecially in the United States) makes use of steel tapes, which are much more convenient to use than rods. Tapes have been constructed Of invar steel, with a temperature coefficient Of eXpansion one tenth that Of steel or even zero, but such alloys have a critical point at a temperature near that of the Operating temperature and undergo a molecular rearrangement which causes undue growth Of the metal with age. This fact, in addition to temperature hysterisis, which makes the temperature coefficient depend Upon the previous history Of the tape, i.e., whether the temperature is rising or falling, limits the use Of invar steel. ‘ An accurate measurement Of a "base line' necessitates the sUpporting of the tape 60 to 100 meters long on stakes 10 to 20 meters apart. The measurements should be made at night, so as to be subject to the smallest possible range of temperature. The services of 12 men are required to make a measurement. An Observer at each end Of the tape, 2 -1- thermometer Observers, 3 stretchers, l recorder, and five men to carry lamps and bring forward the tape after each length is measured. As there is a tendency for the temperature of the tape to lag behind that of the air, the base line is measured first with a rising and then with a falling thermometer. This procedure is repeated several times in Opposite directions, and a mean taken. If the ground is not level the measured length must be corrected and reduced to the true horizontal length. The measurement Of distance by means of a tape is a laborious and expensive Operation. A base line thus Obtained is fixed and is of use for the solution of but one problem. Traversing In surveying by traversing, the position of a point is determined by one linear and one angular measurement, requiring the use Of tape and theodolite. The accuracy of the latter instrument depends upon the accuracy Of division of the circle and the resolving power of the telescOpe, which in turn depends on the diameter Of the Objective lens. The limitations therefore of a theodolite, small enough to be portable, are serious and these combined with the difficulties and eXpense of chaining, already described, make an improved method of measuring long distances most desirable. 8 Minor and Grand Triamulation In triangulation but one lineal measurement, that Of the base line, is required. From such a base line the relative distances Of numerous points and their coordinates are calculated. When a survey Of a great country is made, the position of a number of points at distances from 20 to 100 miles from each other. In such Grand Triangulation the most powerful instruments are employed, the work is executed with the highest degree Of accuracy possible, and the curvature of the earth is taken into account. Upon the completion of the grand triangulation the tOpOgraphy of the country is determined by breaking up the great triangles into a number of smaller triangles, having an average side Of one mile or less. Less powerfil instruments are employed and the curvature of the earth is neglected. The great cost Of measuring the single base line in the grand triangulation prevents the accurate measurement of any other line in either grand or minor triangulation, although such measurements would greatly increase the accuracy of the final result. Engineering science awaits the develOpment Of an instrument and method which will make possible the use of a.portable ‘base line , the length of which has been determined with great accuracy. The TelescOpe as a Distance Measurer A telescOpe fitted with a special diaphragm, may be used for measuring distances with the aid of a graduated staff. A Tacheometer is essentially a transit theodolite, the diaphragm Of which is furnished with two or four stadia webs, wires, lines, or points. The Object Of Tacheometry is to enable horizontal and vertical distances to be computed. from readings upon a stadia rod, thus rendering chaining Operations unnecessary. Let D = distance from axis Of instrument to the stadia rod. S = intercept on stadia rod. f e.principal focal length of Object glass. L a distance apart of the stadia webs. d 2 distance of Object glass from axis Of instrument. Then f D =SO_+ f +d o L The ordinary theodolite tacheometer is limited to distances not exceeding 400 feet and in the hands of a skilled Observer can determine such distances with an accuracy of one part in two thousand; approximately the accuracy Of good chaining. The Subtense Theodolite The principle of this instrument is the same as that Of the tacheometer described above, except that for each reading the cross-hairs are adjusted by means of finely divided micrometer screws to intercept some constant distance S on the stadia rod. The same formula L holds, but 8 has a constant value, usually 10 feet, while L or .5 is variable. The Subtense Theodolite is capable of measuring limited distances with an accuracy slightly greater than that Obtained by a tacheometer. For distances between 800 and 1000 feet, however, the accuracy is about 1 part in 650. The accuracy Of chaining over the same distance is approximately 1 part in 1440. The Cleps The glgpg was invented by Professor Porro, Of Milan. It differs considerably from the tacheometer. The latter has its horizontal and vertical circles uncovered, while the Cleps encloses them in a cubical box. In the tacheometer the telescOpe and the angles are read by verniers; in the Cleps the telescOpe is eccentric and angles are read by micrometer wires applied to micrOsOOpes. The instrument was used on the Mont Genie Tunnel Survey and is capable Of an -5- accuracy Of 1 part in 8000. It is extremely delicate and its accuracy of adjustment cannot be tested. The Omnimeter The Omnimeter consists Of an ordinary theodolite but with the graduated vertical scale replaced by a horizontal scale read by a powerful microsc0pe mounted vertically at right angles to the telescOpe. The latter is focused first on one end of the distant stadia rod, then on the other. Let x = distance from omnimeter to stadia rod. S a length Of stadia rod. h a distance from axis Of telescOpe to horizontal scale. In and r: = readings on horizontal scale. Then h s 2 Int 1‘! «Iv The instrument is somewhat more refined than the subtense theodolite, but does not greatly exceed it in accuracy. Range Finding The Telemeter The telemeter is a small and convenient instrument, less than five inches long, Operating on the principle of the sextant. The Observer determines the angle subtended by the distant Object at Opposite ends of a base line which he “steps Off". The scale is marked to read direct in feet. The accuracy is small, about 1 part in 100. -6- The Mekometer The Mekometer consists of two instruments, similar tO the telemeter, connected by a silk covered hemp cord about 150 feet long. It is very portable, rapid in use, reads direct in feet, and has an accuracy for small distances Of about 1 part in 1000. The Range Finder As this instrument is its own base line and is about one meter long, it is somewhat awkward to use and transport. The distant Object is viewed simultaneously from both ends by means Of totally reflecting prisms. The varying angle subtended by Objects at varying distances is compensated by moving in the line Of sight of one of the two paths a prism Of small angle. The movement Of the prism is calibrated to read direct in feet. The accuracy Of the instrument for distances up to 3000 feet is approximately 1 part in 250. For distances up to 6000 feet the accuracy is only 1 part in 125. Michelson's Measurement of the Meter PLATE I Wave length Comparator at National Physical Laboratory PLATE II Light Waves as Standards Of Length Prof. A. A. Michelson of Case School of Applied Science and Prof. W. A. Morley Of Western Reserve University first prOposed the use Of a wave Of light as a standard Of length. In 1892 - 3 the former, working at the Bureau International des Poids et Mesures, Sevres, determined the value Of the meter in terms Of the wave length of certain lines in the cadnium spectrum, thus affording the first satisfactory approach to a natural standard Of length. He found 1,553,163.5 red wave lengths in the meter. In 1906 MM. Benoit, Fabry, and Perot, employing a more refined method reported 1,553,164.13 red wave lengths in the meter. By international agreement the length Of the red cadnium wave has been made the ultimate standard Of length. Plate I illustrates the apparatus employed by Prof. Michelson. While the wave Of light meets all requirements for an ideal standard Of length, it will be noted that the apparatus, well suited to the laboratory, would be useless in the field or workshOp. Plate II illustrates the wave length comparator designed by Professor Tutton and used at the National iPhysical Laboratory Of England. It is admirably adapted .for comparing standards in terms of light waves, but is Inassive and limited to a single use. The length of a visible light wave is not much greater ‘than the smallest object which can be Observed in the best -8-- compound miccrosCOpe. The limit of visibility of the theoretically perfect microsc0pe is one half a wave Of light. TO render light waves serviceable for purposes of measurement they must be made to interfere, i.e., the light intensity must be crowded out Of a portion of the field of view, otherwise uniformly illuminated, and crowded into other portions. In such a case the field, when illuminated with monochromatic light, is crossed by alternate light and dark bands. A movement Of the bands in the field over a distance corresponding to the width Of one band is produced by a change in the Optical path of one of the two interfering beams an amount equal to the length of a wave of light. Conditions Necessary for the Production of Interference of Light 1. Light must be taken from a single source. 2. The light must be divided into two equal parts. 3. The two beams must be reunited at a small angle. Methods Of Producing Interference Interference methods and interference apparatus are always concerned with two wave fronts which are parallel or nearly parallel and which are located one behind the other a distance varying from zero tO a few centimeters. These two wave fronts are equivalent to light reflected from the front and back surfaces of an air wedge of corresponding thickness and angle. This will be referred to as the 'air -9- plate”. The character of the interference fringes obtainable from such an air plate depends upon the method Of illumination and the method of Observation. For convenience Of discussion they will be divided into five classes. A Class I. If the air plate is illuminated by a broad source of monochromatic light and enters the eye, placed at a convenient distance, the rays which reach the eye from different points of the air plate are reflected from the surfaces Of the latter at varying angles. The path difference between the rays reflected from the two surfaces at any point - 2 n t cos r, where r is the angle Of incidence on the bag; surface of the air plate, n the index Of refraction, and t the thickness of the plate. The fringes will be the loci“ Of points for which 2 n t cos r is constant. They indicate variations of n, t, and r, jointly or separately.. When the air plate is extremely thin, and t is very small, the difference Of phase due to the variation of r at different points of this air “film“ may be negligible, sO that if the Optical thickness n t is uniform the fringes will be very broad and the air film will appear uniformly dark or bright all over, as the air film is made to increase or decrease in thickness. If either n or t vary, fringes will appear which are the loci of equal Optical thickness. -10- When the thickness Of the air plate is appreciable the change Of phase due to the varying angle of incidence becomes effective and for all air plates except very thin films the fringes are loci Of points from which the light reaching the eye meets the plate at equal angles of incidence. With an air plate Of uniform thickness the fringes are circles concentric with the normal from the eye to the air plate and are in focus at infinity. If the air plate or film is wedge shaped the fringes are arcs Of circles whose centers are displaced from the normal. If the surfaces Of the air film are not regular, or if the air is not homogenous, causing local variations Of n t, the circular fringes will be locally distorted at these points. Such irregularities are most noticeable near the center of the system where the fringes are broadest. With any but the thinnest air films the fringes are closely packed as the angle of incidence increases and are visible only in neighborhood of normal incidence. It is important to note that fringes Of Class I are formed when light corresponding to each point in the fringe system reaches the eye from separate points (or very small regions) of the film, and is reflected from the film at varying angles. Except for extremely thin films, the fringes are mainly loci Of equal incidence angles, and are very slightly affected in shape and position by variations in film thickness. -11- Class II. Instead Of viewing the fringe system at infinity with the naked eye, one may use a telescOpe Of large aperture focused for infinity, so that for all points of the field of view light from the whole surface or the air film is received by the telescope. The fringes are now purely loci of equal illumination and are not affected in shape or position by variations in the Optical thickness of the film. When the telescOpe is directed normally to the film circular fringes concentric with the axis are seen in the focal plane of the eyepiece. Since at any point in this plane, light from the whole Of the film is focused, the phase at any such point depends on the mgag film thickness and the angle of incidence Of the ray. Any variations in film thickness contribute their effect equally to all points in the fringe system, which therefore indicates the inclination of the rays only, and tells us nothing about the flatness, homOgeneity, or parallelism of the air film. If, however n t varies much, the distinctness of the fringes will be impaired; for we can regard the resultant illumination at the focal plane Of the telescOpe as due to the superposition of a number of exactly similar- fringe systems, Of which some differ in phase from others. This results in diminishing the contrast between the bright and dark parts of the field. It is important to note that fringes of Class II are - 13- formed when light corresponding to each point of the fringe system comes from the whole Of the film (or from some part Of it), but meets it at varying angles of incidence. The fringes are bands of equal illumination. If sharp and distinct we infer that the film is Of fairly uniform Optical thickness over the region utilized; but no information of _the character or position of any variations which may actually be present can be gained. Class III. If the source is a point located at infinity, such as'a small illuminated pinhole at the principal focus Of a collimating lens, all rays strike the air film at the same angle of incidence. There are no variations in phase from one part of the film to another except such as may be due to variations of n t. TO Observe a fringe system Of Class III it is necessary to employ a telescOpe with the eyepiece removed. The Object glass collects the parallel rays after they leave the air film and produce an image Of the source in the focal plans. If the eye is placed at this image, the whole surface Of the air film is seen illuminated and traversed by fringes which are true contours Of the Optical thickness n t. It is important to note that fringes of Class III are not located at a definite distance from the eye, like those of Classes I and II. They are visible at ggl distances, and appear to coincide with any surface on which the eye is focused. If the film is thick the fringes will be most -13... distinct at normal incidence. A theoretical point source is not available. To secure secure brightness the hole must have an appreciable area, and its image in the focal plane of the telescOpe lens may be considered a small portion of the Class II fringe system produced by a broad source. If this portion is in the center, where the phase varies slowly with the angle Of incidence, there will be no phase difference between the light from one part Of the pinhole and another; but if it is at an outer part of the system where the Class II fringes are closely packed, the small cone Of rays which reach the eye from any point of the air film comprises an appreciable range Of phase retardation, and the contour fringes are rendered indistinct. The interferometers designed by Young, Fizeau, Rayleigh, Michelson, Barus, and Tutton, all employ interference fringes of the three classes described above, which are generally known as Fizeau fringes. In 1910 Dr. C. W. Chamberlain designed the Compound Interferometer with which he accurately measured magnitudes 200 times beyond the limit of the compound microsOOpe. The fringes employed are compound Fizeau fringes. A thorough study Of all known types of interference led to the conclusion that none were capable Of solving the problem of measuring a distance along a beam of light. The Director Of the United States Coast and Geodetic Survey, as late as 1920, seemed to have reached the conclusion -14- that no such solution was possible and sought to improve the method Of Grand Trianulation by measuring longer base lines over rough terrain and undertook, at great eXpense, the measurement of a base line from a point on Mt. Wilson to Mt. San Antonio peak as a distance over which Prof. Michelson should make an accurate determination of the velocity of light, “realizing that it might lead to the determination of distance in terms of the velocity of - light and thus might furnish a means of measuring base lines in mountainous regions or on archipelagoes". As the velocity Of light isI86,420 miles per second the above suggestion would involve the accurate measurement of exceedingly small intervals Of time, and does not seem to Offer much.promise, but indicates the pressing need for better methods of measuring large distances. _15- The Diffractometer PLATE III A New Type of Interference : Fourth Class The Diffractometer Any type of interferometer employing Fizeau fringes is most useful when illuminated with monochromatic light. Only five or six fringes can be Observed in white light, when the air film is wedge-shaped and the Optical paths are equal. In 1911 Dr. C. W. Chamberlain invented an instrument called the Diffractometer, which combines an interference with a diffracting or refracting system. Plate III is a line drawing illustrating the principle of the instrument. M and N are the rear and front faces Of the reflecting air film Of a Fizeau interference system, inclined at an angle t. The difference in Optical path is 10 waves of light, or 10L. Let M and N produced meet at P', at a distance B' from P, the foot of the perpendicular from the point of Observation to the mirror M. Place a grating at a distance A from N, and parallel to N, so that 10 grating spaces lie between the point where the ray from M meets the grating and where the ray from N meets it. To an Observer, looking through the grating at an angle t, the retardation Of 10L produced by the grating in the light from N brings the two beams into phase and interference in white light destroyed at P is restored at P'. As the difference in Optical path Of the two interfering beams is increased, the fringes may be restored at P' by increasing the distance A. The Diffractometer pgoduces white light 5 -lb" fringes at the intersection g: the surfaces M and N. Draw a line from the intersection Of the ray from M with the grating, making an angle with the grating equal to the diffracting angle 9. Then tan t tan 6 = -—7r— ° Neglecting quantities-of the third and higher orders tant .-. .9431013. Therefore d .A‘BI‘. As d and L are known, A can be found if B can be .943 . determined. This is accomplished by counting the fringes in monochromatic light as the intersection is moved back from P' to P, and measuring the width Of a fringe. The product of the fringe width by the number of fringes equals the distance B. The Diffractometer fringes are exceedingly useful in locating the white light fringes in the process of adjusting interferometers. As an instrument for measuring distance it will be noted that the angular width Of the fringes is small when the distance A is large, and large and expensive plates are required for the measurement Of great distances. The Diffractometer is not the best solution of the problem but is of great interest as the first successful attempt 32 -17- olt. ------ ....... ..... I [In INVENTOR. By (“fl/{mefld’m ATTORNEY. The Recording Interferometer PLATE IV am f light. \D I measure distance glen [a b I“ .I A New Type of Interference : Fifth Class The Recording Interferometer This instrument was develOped at Michigan State College by Dr. C. W. Chamberlain and represents a very great advanve in the science Of precision measurement. It ras described before the American Physical Society in February, 1950, and is at the writing of this thesis in the process of manufacture by the Bausch and Lomb Optical 00., Rochester, N. Y. Plate IV shows the arrangement of Optical parts. Light from a broad slit, illuminated by an incandescent filament, is collimated and divided into two parts which travel separate paths, one variable in length. The beams are reunited, with their wave fronts parallel, passed through a Wadsworth or constant deviation prism, and viewed through a telescOpe focused for infinity. With eyepiece removed circular Fizeau fringes are seen in monochromatic light, when the interfering paths are unequal. With the eyepiece in position, a new type Of interference system in white light is brought into view. The continuous spectrum is crossed by sharp dark bands whose positions in the spectrum correspond with the wave lengths for which the interference system is Opaque, or the path difference is an Odd number of half wave lengths. The number Of bands appearing in an octave is identical -18- with the path difference Of the interfering beams, measured in terms of the longest wave. Lines appearing in that portion of the spectrum between 5016 and 6676 A. U. of helium correspond to a linear movement of one ten-thousandth of a centimeter. In a similar manner, a range Of spectrum may be arranged such that a change Of one line in the range corresponds to a movement Of one twenty-thousandth of an inch, or any desired decimal part Of a centimeter or inch. Calibration of the Recording Interferometer The Recording Interferometer is calibrated to read exact decimal parts Of an inch or centimeter without the use Of standard gauges or other auxillary means, This feature makes the instrument reliable and convenient. The sensitiveness of the instrument is variable from one millionth to one thousandth Of an inch: a single instrument taking the place of an entire set of instruments of any design now used. The movement of the plunger, the anvil, or the interferometer head changes the relative lengths of the interfering paths of light. Let e = movement Of plunger. then Be a change of Optical path. If Be is an Odd number of half wave lengths 2s = L(N - g) the two beams will interfere destructively, and a black band ‘will appear in the continuous spectrum at the position of _19_ the wave length L. The Optical system is Opaque for this particular wave length, which does not enter the prism but is reflected back toward the source. There will be other wave lengths for which Be is exactly some Odd number of half wave lengths which will also be absent in the spectrum. Vertical dark bands will cross the spectrum wherever the wave length is such that 2e = L(N - 5), where N is any integer. If the wave lengths corresponding to any two of these bands are known, the wave lengths Of Q1; the rest Of them can be calculated as follows: Let L' and L" represent the two known wave lengths; L 'is the wave length to be calculated; also let n', n', and n be their corresponding integers in the above formula. Then 26 = L'(n' - i), or Ze/L' = n' - g (1) and 2s = L"(n" - g), or Be/L' hr - g . (2) Subtracting (2) from (1) 2e(l/L' - l/L') = n' - n'l . (3) Similarly we may derive an equation 2e(l/L - 1/L') = n - n" . (4) Dividing (4) by (3) 11L - I/L' _..n ‘3 ha l/LI - l/L" - nl — nu and simplifying l/LIn' - n~> - 1/Lw e .1 . I .A. I . . .~Ic e . .. I . . . . I y I . ‘ . e . 1 . II . I r !I II _ . . . . i. I. . O . O a .I . o I . . I I I I, I . I . '.,I II p I I I I. I I .Iuln I .r I I \ r. I. ’ u r I I I . I . III e ..I.’. - I. . . . .. .. v. 0 I l . I II I I I .~o al I I I I 1‘ l . . e I I I v . . .. - .. , . . . . . I. . I _ . e . . . I I I ..l \I. u . x I u I I I (I . . I . -. . . . A x . . . x I 4:. I . . . . . I . . I .v I .I e \I I Y.I II. v‘ I . I - . \I Q . . v . I I HI .I . I \ \ I .. o . . \ I . . .. I . . fi ‘ I Q - I r s | I ‘ I J . r. I . . . .. In) . . . . a I . - I . . q . I .I - e I A . II I I .I V... K. . . II a I a I p \ .v. I . I I I I. . I . I v . . C .I . . _ . . s . V . 4 1. r . e . .I r IT ‘1. I e \ . . \ l . . 1. .‘ a I I I I . I . > I . . .. I . . I . I 0 . , v v I P.. . I V . . I r I . - . . I p . . . '.I NI .. I 4 V V . . I _ . I .. u \ \ I p I - . . r . . .. . . .I . -. ~ . . I I r I “"3! I . . I I I . e I . . . \ I V I . . I I . o . I I I . ’ I . I. , . I I . . w . I-. . . . . . ., .. . , 0 . 1 . I I II . . In .-\ . .\ I In. . e L. I . . . I . . 0 II «I . I I I . - . . O I I II \ 'u l I c X. A . a . . . I I - I I I O c V'I's'm ‘ l E \ . ' i I" I‘ \ ' I' . . I . \ . I . C ‘ . — ' ’ ! Q . .. .u . . .. I1~.- . u .2. .H. 31...... - . _.- ._ :7 .. .7... Q......;..; .., . . 3:313 r HICHIGQN STQTE UNIV. LIBRRRIES IllIIIIIIIIIIUIIIIlllllltlllllll||||||||||I||I||||||ll|l||1|l| 31293017014808