Interferometer measurements of thin films

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Kuether, Frederick William

Date Published: 1946

Subjects: Thin films--Measurement

Program of Study: Physics

Degree Level: Masters

Language: English

Pages: 29 leaves

Permalink: https://doi.org/doi:10.25335/mnf0-9f32