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Committee Member: Levchenko, Alex
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Electronic Theses & Dissertations
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Theses
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English
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Diffraction
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Electron microscopes
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Femtosecond lasers
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Picosecond pulses
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Scanning tunneling microscopy
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Superconductivity
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Technological innovations--Mathematical models
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Topological defects (Physics)
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Ultrafast science : a multiscale modeling approach to femtosecond electron diffraction and its applications
Portman, Jenni Minttu Eleonora
Text (2014)
Part of
Electronic Theses & Dissertations
Measuring proximity induced effects in topological insulators using scanning probe microscopy techniques
Dayton, Ian Matthew
Text (2016)
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Electronic Theses & Dissertations
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