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Aluminum oxide
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Diamond thin films--Testing
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Fourier transform spectroscopy
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Silicon--Testing
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Thermal stresses
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Adherence of diamond thin films on silicon wafers and FTIR spectroscopy of damaged ceramic materials
Gamlen, Carol Ann
Text (1990)
Part of
Electronic Theses & Dissertations
The characterization of thermal fatigue effects by the observation of growth of indentation cracks in unreinforced polycrystalline Al₂O₃
Kim, Won-Sik
Text (1995)
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Electronic Theses & Dissertations
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