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Local structure and dynamics of III-V semiconductor alloys by high resolution x-ray pair distribution function analysis
Jeong, Il-Kyoung
Text (2001)
Part of
Electronic Theses & Dissertations
On thermal transport and its relationship with bond-stiffness in materials for thermoelectric applications
Calderon Cueva, Mario R.
Text (2022)
Part of
Electronic Theses & Dissertations
Local structure of GexSe₁x glasses around the rigidity percolation threshold using atomic pair distribution function and x-ray absorption fine structure techniques
Shatnawi, Moneeb Taiseer
Text (2007)
Part of
Electronic Theses & Dissertations
Stress tests of analog CMOS ICs for gate-oxide reliability enhancement
Khalil, Mohammad Athar
Text (2001)
Part of
Electronic Theses & Dissertations
Switching properties of electrothermal devices
Nagchoudguri, Dipankar, 1944-
Text (1973)
Part of
Electronic Theses & Dissertations
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