Effect of coarsened microstructure on electromigration behavior of eutectic Pb-Sn solder joints
- In Collections
-
Electronic Theses & Dissertations
- Copyright Status
- In Copyright
- Material Type
-
Theses
- Authors
-
Lee, Yi-Chih
- Date Published
-
2010
- Program of Study
-
Materials Science and Engineering
- Degree Level
-
Masters
- Language
-
English
- Pages
- ix, 96 pages
- ISBN
-
9781124653686
1124653686
- Permalink
- https://doi.org/doi:10.25335/tss1-fn71