Electronic speckle pattern interferometry, electronic shearography, and their applications

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Chen, Xiaolu (Optical engineer)

Date Published: 1995

Subjects: Holographic interferometry
Interferometry
Speckle metrology

Program of Study: Materials Science and Mechanics

Degree Level: Doctoral

Language: English

Pages: xiii, 225 pages

Permalink: https://doi.org/doi:10.25335/tatg-4830

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