Stress tests of analog CMOS ICs for gate-oxide reliability enhancement

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Khalil, Mohammad Athar

Date Published: 2001

Subjects: Integrated circuits--Reliability
Integrated circuits--Very large scale integration
Metal oxide semiconductors, Complementary
Semiconductors

Program of Study: Electrical and Computer Engineering

Degree Level: Doctoral

Language: English

Pages: xii, 137 pages

Permalink: https://doi.org/doi:10.25335/2afb-zb23

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