Modeling and control of atomic force microscope for imaging using high order harmonic modes

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Nyenke, Chinwe Pamela

Date Published: 2007

Subjects: Atomic force microscopy

Program of Study: Electrical and Computer Engineering

Degree Level: Masters

Language: English

Pages: vii, 105 pages

Permalink: https://doi.org/doi:10.25335/dj2s-7z92

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