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Program of Study: Electrical and Computer Engineering
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Subject: Integrated circuits--Very large scale integration
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Electronic Theses & Dissertations
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Integrated circuits--Reliability
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Metal oxide semiconductors, Complementary
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Semiconductors
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Stress tests of analog CMOS ICs for gate-oxide reliability enhancement
Khalil, Mohammad Athar
Text (2001)
Part of
Electronic Theses & Dissertations
A placement methodology for low power VLSI circuits
Jiménez-Cedeño, Manuel A.
Text (1999)
Part of
Electronic Theses & Dissertations
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