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Material Type: Theses
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Program of Study: Electrical and Computer Engineering
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Subject: Semiconductors
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Electronic Theses & Dissertations
3
Language
English
3
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In Copyright
3
Subject
Electronics--Materials
1
Integrated circuits--Reliability
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Integrated circuits--Very large scale integration
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Metal oxide semiconductors, Complementary
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Temperature measurements
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Thermoelectricity
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Low energy hardware for sensor signal calibration and compensation
Balasundaram, Prasanna
Text (2004)
Part of
Electronic Theses & Dissertations
Stress tests of analog CMOS ICs for gate-oxide reliability enhancement
Khalil, Mohammad Athar
Text (2001)
Part of
Electronic Theses & Dissertations
Advancing thermoelectric research with new measurement systems and thermoelectric modeling for AC electrical measurements
Downey, Adam Darwin
Text (2006)
Part of
Electronic Theses & Dissertations
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