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Material Type: Theses
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Degree Level: Doctoral
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Subject: Integrated circuits--Reliability
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Subject: Integrated circuits--Very large scale integration
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Subject: Metal oxide semiconductors, Complementary
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Collection
Electronic Theses & Dissertations
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Language
English
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Copyright Status
In Copyright
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Subject
Integrated circuits--Very large scale integration
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Semiconductors
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Stress tests of analog CMOS ICs for gate-oxide reliability enhancement
Khalil, Mohammad Athar
Text (2001)
Part of
Electronic Theses & Dissertations
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