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Integrated circuits--Reliability
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Low voltage integrated circuits
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Stress tests of analog CMOS ICs for gate-oxide reliability enhancement
Khalil, Mohammad Athar
Text (2001)
Part of
Electronic Theses & Dissertations
High performance CMOS switched-current circuits for low-voltage signal processing applications
Huang, Renyuan
Text (1998)
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Electronic Theses & Dissertations
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