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Electronic Theses & Dissertations
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Theses
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English
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Algorithms
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Analog-to-digital converters
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Application-specific integrated circuits--Design and construction
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Integrated circuits
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Integrated circuits--Reliability
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Integrated circuits--Testing
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Metal oxide semiconductors, Complementary
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Parallel processing (Electronic computers)
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Semiconductors
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Signal processing--Digital techniques
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Stress tests of analog CMOS ICs for gate-oxide reliability enhancement
Khalil, Mohammad Athar
Text (2001)
Part of
Electronic Theses & Dissertations
Design and test of current-mode signal processing circuits
Krishnan, Shoba
Text (1993)
Part of
Electronic Theses & Dissertations
Testability design of the DKS chip
Singh, Tej Pal
Text (1988)
Part of
Electronic Theses & Dissertations
Performance tradeoffs in the hierarchical design of regular VLSI structures
Leung, Yu-Ying Jackson
Text (1986)
Part of
Electronic Theses & Dissertations
On partitioning of algorithms for parallel execution on VLSI circuit architectures
Driscoll, Michael A.
Text (1988)
Part of
Electronic Theses & Dissertations
A placement methodology for low power VLSI circuits
Jiménez-Cedeño, Manuel A.
Text (1999)
Part of
Electronic Theses & Dissertations
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