An investigation of hot electron induced degradation for silicon bipolar transistors

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Huang, Chi-Jung

Date: 1992

Subjects: Bipolar transistors
Silicon

Program of Study: Electrical Engineering

Degree Level: Doctoral

Language: English

Pages: viii, 166 pages

Permalink: https://doi.org/doi:10.25335/0185-q210